JPS58136762U - Infrared radiation gas analyzer - Google Patents

Infrared radiation gas analyzer

Info

Publication number
JPS58136762U
JPS58136762U JP3370882U JP3370882U JPS58136762U JP S58136762 U JPS58136762 U JP S58136762U JP 3370882 U JP3370882 U JP 3370882U JP 3370882 U JP3370882 U JP 3370882U JP S58136762 U JPS58136762 U JP S58136762U
Authority
JP
Japan
Prior art keywords
infrared
temperature gas
infrared radiation
component
gas analyzer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP3370882U
Other languages
Japanese (ja)
Other versions
JPH0219719Y2 (en
Inventor
寛之 衣斐
宮武 公夫
Original Assignee
株式会社堀場製作所
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 株式会社堀場製作所 filed Critical 株式会社堀場製作所
Priority to JP3370882U priority Critical patent/JPS58136762U/en
Priority to DE19833307132 priority patent/DE3307132C2/en
Priority to GB8306205A priority patent/GB2116317B/en
Publication of JPS58136762U publication Critical patent/JPS58136762U/en
Application granted granted Critical
Publication of JPH0219719Y2 publication Critical patent/JPH0219719Y2/ja
Granted legal-status Critical Current

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  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of drawings]

図面は本考案の実施例を示し、第1図は赤外線輻射式ガ
ス分析計の構成図、第2図はCO2の輻射率と波数と分
王×セル長との関係を示すグラフ、第3図は別の実施例
を示す赤外線輻射式ガス分析計の構成図である。 A・・・高温ガスの光学的厚みを一定にする手段、1・
・・サンプルセル、4・・・ヒーター、7・・・赤外検
出器、8・・・光チヨツパ−、lla、llb・・・バ
ンドパスフィルター。
The drawings show an embodiment of the present invention; Fig. 1 is a configuration diagram of an infrared radiation gas analyzer; Fig. 2 is a graph showing the relationship between CO2 emissivity, wave number, and division king x cell length; Fig. 3; FIG. 2 is a configuration diagram of an infrared radiation gas analyzer showing another embodiment. A...Means for keeping the optical thickness of high-temperature gas constant, 1.
... Sample cell, 4... Heater, 7... Infrared detector, 8... Optical chopper, lla, llb... Band pass filter.

Claims (1)

【実用新案登録請求の範囲】 ■ 高温ガスの光学的厚みを一定にする手段と、高温ガ
ス中の測定対象成分から輻射される赤外線を検出する赤
外検出器と、これら両者間に配置した光チ旧ツバ−とを
備え、 測定対象成分による赤外線輻射量と高温ガスの温度とに
基づいて測定対象成分の濃度を測定するようにした赤外
線輻射式ガス分析計であって、測定対象成分の輻射波長
域内で、中心透過波長を互いに異にする複数枚のバンド
パスフィルターを設け、測定対象成分の濃度域に応じて
前記バンドパスフィルターを前記光路中に択一的に介装
すべく構成しであることを特徴とする赤外線輻射式ガス
分析計。 ■ 高温ガスの光学的厚みを一定にする手段が、セル長
が一定のサンプルセルとその周囲に設けたヒーターとに
よって構成されていることを特徴とする実用新案登録請
求の範囲第0項に記載の赤外線輻射式ガス分析計。 ■ 高温ガスの光学的厚みを一定にする手段が、高温ガ
ス流路の周壁に設けた赤外透過窓と、この赤外透過窓と
の間に高温ガスの分岐流路が形成されるように、前記高
温ガス流路の内部に、前記赤外透過窓と一定間隙を隔て
て対向配置した赤外線の透過しない材料よりなる仕切板
とによって構成されていることを特徴とする実用新案登
録請求の範囲第0項に記載の赤外線輻射式ガス分析計。
[Scope of claim for utility model registration] ■ A means for making the optical thickness of high-temperature gas constant, an infrared detector that detects infrared rays radiated from a component to be measured in the high-temperature gas, and a light disposed between the two. This infrared radiation gas analyzer is equipped with an old collar and measures the concentration of a component to be measured based on the amount of infrared radiation by the component to be measured and the temperature of high-temperature gas. A plurality of bandpass filters having different center transmission wavelengths within a wavelength range are provided, and the bandpass filters are selectively interposed in the optical path depending on the concentration range of the component to be measured. An infrared radiation gas analyzer characterized by: ■ Claim 0 of the utility model registration characterized in that the means for making the optical thickness of the high-temperature gas constant is constituted by a sample cell with a constant cell length and a heater provided around the sample cell. infrared radiation gas analyzer. ■ The means for keeping the optical thickness of high-temperature gas constant is such that a branch flow path for high-temperature gas is formed between an infrared-transmitting window provided on the peripheral wall of the high-temperature gas flow path and this infrared-transmitting window. , a partition plate made of a material that does not transmit infrared rays and disposed inside the high-temperature gas flow path and facing the infrared transmitting window with a certain gap therebetween. The infrared radiation gas analyzer according to item 0.
JP3370882U 1982-03-09 1982-03-09 Infrared radiation gas analyzer Granted JPS58136762U (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP3370882U JPS58136762U (en) 1982-03-09 1982-03-09 Infrared radiation gas analyzer
DE19833307132 DE3307132C2 (en) 1982-03-09 1983-03-01 Infrared gas analyzer for determining at least one component of a gas mixture
GB8306205A GB2116317B (en) 1982-03-09 1983-03-07 Infrared radiation gas analyzer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3370882U JPS58136762U (en) 1982-03-09 1982-03-09 Infrared radiation gas analyzer

Publications (2)

Publication Number Publication Date
JPS58136762U true JPS58136762U (en) 1983-09-14
JPH0219719Y2 JPH0219719Y2 (en) 1990-05-30

Family

ID=30045246

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3370882U Granted JPS58136762U (en) 1982-03-09 1982-03-09 Infrared radiation gas analyzer

Country Status (1)

Country Link
JP (1) JPS58136762U (en)

Also Published As

Publication number Publication date
JPH0219719Y2 (en) 1990-05-30

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