JPS58135402A - Ruggedness detector - Google Patents

Ruggedness detector

Info

Publication number
JPS58135402A
JPS58135402A JP1679782A JP1679782A JPS58135402A JP S58135402 A JPS58135402 A JP S58135402A JP 1679782 A JP1679782 A JP 1679782A JP 1679782 A JP1679782 A JP 1679782A JP S58135402 A JPS58135402 A JP S58135402A
Authority
JP
Japan
Prior art keywords
output
piezoelectric element
detected
contact
comparator
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1679782A
Other languages
Japanese (ja)
Inventor
Hideo Adachi
日出夫 安達
Tokio Kano
時男 嘉納
Masahiro Aoki
雅弘 青木
Haruhiko Takemura
竹村 治彦
Sachiko Tachikawa
立川 幸子
Satsuki Kanbara
神原 さつき
Michio Nawa
名和 道夫
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Olympus Corp
Original Assignee
Olympus Corp
Olympus Optical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Olympus Corp, Olympus Optical Co Ltd filed Critical Olympus Corp
Priority to JP1679782A priority Critical patent/JPS58135402A/en
Publication of JPS58135402A publication Critical patent/JPS58135402A/en
Pending legal-status Critical Current

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B07SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07CPOSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/34Sorting according to other particular properties

Landscapes

  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)

Abstract

PURPOSE:To realize an automatic and highly precise detection for ruggedness on the surface of an object to be detected and to attain a reduction of labor, by attaching a piezoelectric element to a flexible supporter which is attached with an inclination to a contact which contacts with the flat surface of the object to be detected. CONSTITUTION:When a rugged part 51 on the surface of an object 5 to be detected is set right under a contact 1, a supporter 2 attached to the contact 1 with a prescribed angle has a flexion and displacement. Then an electric signal is produced from a piezoelectric element 3, and the output voltage is applied to an output device 7 via a lead wire 6. This output is applied to a waveform display part 73 via an amplifier 71 and a band pass filter 72. Thus a waveform is displayed. At the same time, the output given from the filter 72 is compared with the set voltage through a comparator 74. When said output is higher than the set voltage, a signal of defective ruggedness is applied to an alarm device 75 and a relay circuit 76 to produce an alarm. At the same time, a motor 77 is driven to eliminate automatically a defective object 5. This can save the labor.

Description

【発明の詳細な説明】 この発明は被検出体の平面部の凹凸を検出する凹凸検出
装置に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an unevenness detection device for detecting unevenness on a flat surface of an object to be detected.

従来圧電バイモルフのようζζ高精度の平面度が要求さ
れるものの場合平面部の異常な凹凸を検’11するには
検査員による目視にたよる方法□が一般的であった。
Conventionally, in the case of products such as piezoelectric bimorphs that require high-precision flatness, the general method for detecting abnormal irregularities on the flat surface has been to rely on visual inspection by an inspector.

ところが、これでは検査員によって凹凸の検出にバラツ
キを生じてしまい精度の高い凹凸検出ができない欠点が
あり、またこのような作業には正確さが要求されるため
多くの人手と手間を要し経済的にも極めて不利な欠点が
あった。
However, this method has the drawback that unevenness detection varies depending on the inspector, making it impossible to detect unevenness with high accuracy.Also, since such work requires precision, it requires a lot of manpower and effort, making it economically It also had extremely disadvantageous disadvantages.

この発明は上記欠点を□除去するためなされたもので被
検出体平面部の凹凸検出を高精度に行ない得るとともに
自動化により省力化を図り得、経済的にも有利な凹凸検
出装置を提供することを目的とする。
This invention has been made to eliminate the above-mentioned drawbacks, and it is an object of the present invention to provide an economically advantageous unevenness detection device that can detect unevenness on a flat surface of a detected object with high precision, can save labor through automation, and is economically advantageous. With the goal.

以下、この発明の一実施例を図面に従い説明する。An embodiment of the present invention will be described below with reference to the drawings.

第1図において、1は接触子で、この接触子1にはal
l可能な棒状の支持体2を所定角R#だけ傾けて取付け
ている。この支持体2は側面の一部に直接支持体2の層
重変位量を電気信号に変換する圧電素子3を取付けてお
り、これら屈−可能な支持体2と圧電素子3により圧電
バイモルフ部を構成するようにしている。また、支持体
2は基部4に吹付けている。このような構成において上
記接触子lを被検出体5の平面部に接触させるようにし
Cいる。この場合被検出体5は図示矢印方向にI4始り
能にしている。
In Fig. 1, 1 is a contact, and this contact 1 has al.
The rod-shaped support body 2, which can be used as a lubricant, is attached at an angle of a predetermined angle R#. This support body 2 has a piezoelectric element 3 attached to a part of its side surface that directly converts the amount of layer displacement of the support body 2 into an electrical signal, and the piezoelectric bimorph part is formed by the bendable support body 2 and the piezoelectric element 3. I am trying to configure it. Further, the support 2 is sprayed onto the base 4. In such a configuration, the contact 1 is brought into contact with the flat surface of the object 5 to be detected. In this case, the object to be detected 5 is moved in the direction of the arrow shown in the figure starting from I4.

E配圧4バイモルフ部を構成する支持体2と圧111c
素子3にはリード線6を介して出力装置7を接続してい
る。この出力装置7は第2図に示すようにfンプ71.
バンドパスフィルタ72.波形表示部73.コンパレー
タ74.警報装置75.リレー回路76および不良品選
別機の駆動用モータ77を有している。
E Pressure distribution 4 Support body 2 and pressure 111c constituting the bimorph part
An output device 7 is connected to the element 3 via a lead wire 6. As shown in FIG. 2, this output device 7 includes an f pump 71.
Bandpass filter 72. Waveform display section 73. Comparator 74. Alarm device 75. It has a relay circuit 76 and a motor 77 for driving a defective product sorter.

次に、その作用を説明する。Next, its effect will be explained.

まず、接触子1を被検出体5の平面部に接触させ、この
状態で被検出体5を図示矢印方向に移動させる。
First, the contactor 1 is brought into contact with the flat surface of the object to be detected 5, and in this state, the object to be detected 5 is moved in the direction of the arrow shown in the figure.

このとき、被検出体5の平i[Allに凹凸部51が存
在し、この凹凸部51;6’l接触子1の真下にくると
、その凹凸の大きさに応じて接触子1が上下方向に変位
される。これにより間接触子l#ζ所定角度傾けて取付
けられている支持1体2が屑曲変位されるので、この支
持体2と圧電素子3にて構成される圧電バイモルフ部l
ζ屈曲が加えられ、その圧電効果によって電気信号が発
生しリード−6を介して出力電圧Eが取り出される。こ
の場合の出力電圧Eは被検出体5の移動速度V、凹凸部
51の大きさdおよび接触子1に対する支持体2の取付
は角度θなどによって決定される。まず、出力電圧Eと
移動速度Vの関係を支持体2の取付角変0が30°、4
50.60’の場合について調べたところ第3図Im)
 (b)(c)に示す結果が得られた。(かかる特性図
は支持体2と圧電素子3にて構成される圧電バイモルフ
部の共振周波数がl0KH,で、凹凸部51の大吉さd
が10011m@度の場合を示している。)しかして、
第3図から被検出体5の移動速度Vが1.0m/ se
c付近のとき最も大きな出力電圧Eが得られることが5
判明した。また、出力電圧Eと凹凸部51の大きさdの
関係は第4図に示すようになり上記圧電パイモリフ部の
共振点大に達するまでの所定[114こおいてリニアー
関係が得られることも判明した。
At this time, there is an uneven part 51 on the flat surface of the detected object 5, and when this uneven part 51;6'l comes directly under the contact 1, the contact 1 will move up and down depending on the size of the unevenness direction. As a result, the support 1 body 2, which is attached at an angle of a predetermined angle, is displaced, so that the piezoelectric bimorph part l constituted by this support body 2 and the piezoelectric element 3
ζ bending is applied, an electrical signal is generated by the piezoelectric effect, and an output voltage E is taken out through the lead 6. The output voltage E in this case is determined by the moving speed V of the detected object 5, the size d of the uneven portion 51, and the angle θ of the attachment of the support body 2 to the contactor 1. First, the relationship between the output voltage E and the moving speed V is determined when the mounting angle of the support 2 is 30° and 4
I investigated the case of 50.60' and found that Fig. 3 Im)
The results shown in (b) and (c) were obtained. (Such a characteristic diagram shows that the resonant frequency of the piezoelectric bimorph section composed of the support 2 and the piezoelectric element 3 is 10KH, and that the concavo-convex portion 51 has a large radius d.
The case where is 10011 m@degrees is shown. ) However,
From Fig. 3, the moving speed V of the detected object 5 is 1.0 m/se.
5. The highest output voltage E can be obtained when the voltage is around c.
found. Furthermore, it has been found that the relationship between the output voltage E and the size d of the uneven portion 51 is as shown in FIG. did.

しかして、このようにして得られた出力電圧Eはリード
線6を介して出力装置17に与えられる。
The output voltage E thus obtained is applied to the output device 17 via the lead wire 6.

すると、まずアンプ714ζて増巾されバンドパスフィ
ルタ72を介して高周波ノイズや電源ノイズを除去され
たのち波形表示1s73に与えられ波形表示される。ま
たバンドパスフィルタ72からの出力ハコンハレータ7
4に与えられ、ここで予め設定された設電電圧と比曽さ
れる。この場合設定電圧として許容される凹凸に対応す
る電圧値を設定しておけばバンドパスフィルタ72から
の出力が設定電圧より大きいとコンパレータ74より不
実凹凸の旨の出力が発生され、警報装置75に与えられ
、同普報装置75にて、不実な凹凸があることが報知さ
れる。またコンパレータ74の出力はリレー回路76#
cも与えられ、同すレー同゛略76を介してモータ77
がJ[動される。これ−こより不良品選別機が駆動され
異常凹凸部5!を有する被検出体5は強制的に除去され
る。
Then, first, the signal is amplified by the amplifier 714ζ, high frequency noise and power supply noise are removed via the band pass filter 72, and then applied to the waveform display 1s73 to be displayed as a waveform. In addition, the output from the bandpass filter 72 is output from the conhalator 7.
4, and is compared with a preset power supply voltage here. In this case, if a voltage value corresponding to the allowable unevenness is set as the set voltage, if the output from the band-pass filter 72 is larger than the set voltage, the comparator 74 will generate an output indicating untrue unevenness, and the alarm device 75 will The notification device 75 notifies the user that there are false irregularities. Also, the output of the comparator 74 is the relay circuit 76#
c is also provided, and is connected to the motor 77 via the same relay 76.
is J[moved. From this, the defective product sorting machine is driven and the abnormal uneven part 5! The object to be detected 5 having the following characteristics is forcibly removed.

したがって、このような構成によれば被検出体平面部の
凹凸に応じた出力が得られ、この出力により正確に凹凸
を検出することができるので、従来の検査員の目視化た
よっていたものに比べ検出結果にバラツキのない高精度
の検出が期待できる。
Therefore, with this configuration, an output corresponding to the unevenness of the flat surface of the object to be detected can be obtained, and this output can accurately detect the unevenness, so that it is possible to detect the unevenness more accurately than the conventional visual inspection by inspectors. In comparison, highly accurate detection with no variation in detection results can be expected.

また、このような凹凸検出は自動的に行なうことができ
るので省力化をも図ることができ経済的にも極めて有利
である。
Moreover, since such unevenness detection can be performed automatically, it is possible to save labor and is extremely advantageous economically.

なお、この発明は上記夷論例にのみ限彎されず要旨を変
更しない範囲で極室変形して実線できる。
It should be noted that the present invention is not limited to the above-mentioned theoretical example, but can be modified to a solid line without changing the gist.

例えば上述の実施例では支持体2番こ1枚の圧電素子3
を取付けた場合を述べたが、第5図に示すように複数枚
(図示例では2枚)の圧電素子31.32を貼合せたも
のを用いてもよい。仁うすれば凹凸部に対し大きな出力
を得られる。また、第6図に示ぐように屈曲可能な支持
体2の全開にわたって圧電素子3を取付は圧電バイモル
フを構成するようにしてもよい。こうすれば圧電バイモ
ルフとしての寸法を大きくできるので検出感度を向とさ
せることができる。なお第6図では接触子1としてくさ
び状の接触子を用いている。更に、上述では支持体2を
基部4に取付ける構造としているが。
For example, in the above embodiment, the piezoelectric element 3 on the second support
Although the case has been described in which a plurality of piezoelectric elements 31 and 32 are attached, as shown in FIG. 5, a plurality of (two in the illustrated example) piezoelectric elements 31 and 32 may be bonded together. If it is thickened, a large output can be obtained for uneven parts. Further, as shown in FIG. 6, the piezoelectric element 3 may be attached over the entire length of the bendable support 2 to form a piezoelectric bimorph. In this way, the dimensions of the piezoelectric bimorph can be increased, and detection sensitivity can be improved. In FIG. 6, a wedge-shaped contact is used as the contact 1. Furthermore, in the above description, the structure is such that the support body 2 is attached to the base 4.

こ、れらは一体構造としてもよい。更にまた。上述Cは
被検出体5を移動するようにしたが、接触子3111を
移−してもよい。要は凹凸部を検出すべく相対的移動が
得られればよい。
These may be of integral construction. Yet again. Although the detection object 5 is moved in C above, the contact 3111 may also be moved. In short, it is sufficient if relative movement can be obtained to detect the uneven portion.

以上述べたよう−ここの発明によれば被検出体の平[1
$の凹凸検出を高槽度に行ない得るとともにかかる検出
の自動化により省力化を閤り4.経済凶暴こも有利な凹
凸検出装置を提供できる。
As stated above, according to the present invention, the flat surface of the object to be detected [1]
4. It is possible to detect irregularities of $ with high accuracy and to save labor by automating such detection. It is possible to provide an economically advantageous unevenness detection device.

【図面の簡単な説明】[Brief explanation of drawings]

第1図はこの発明の一実施例を示す概略的構成図、第2
図は同実施例に用いられる出力装置のブロック図、第3
固自よびs4図は同実施例を説明するための特性図、第
5図はこの発明の他実線例を示す概略的構成図、第6図
はこの発明の異なる他実施例を示す概略的構成図である
。 l・・・接触子     2・・・支持体3・・・圧電
素子    4・・・基部5・・・被検出体   51
・・・凹凸部6・・・リード線    7・・・出力装
置71・・・アンプ    72・・・バンドパスフィ
ルタ73・・・波形表示部  74・・・コンパレータ
75・・・蕾報装置   76・・・リレー回路77・
・・駆動用モータ 第1図 11!2図 WI31!l 第1頁の続き 0発 明 者 立川卓子 東京都渋谷区幡ケ谷2丁目43番 2号才リンパス光学工業株式会 社内 0発 明 者 神原さつき 東京都渋谷区幡ケ谷2丁目43番 2号才リンパス光学工業株式会 社内 0発 明 者 名和道夫 東京都渋谷区幡ケ谷2丁目43番 2号才リンパス光学工業株式会 社内
FIG. 1 is a schematic configuration diagram showing one embodiment of the present invention, and FIG.
The figure is a block diagram of the output device used in the same embodiment.
FIG. 5 is a schematic configuration diagram showing another solid line example of this invention, and FIG. 6 is a schematic configuration diagram showing another different embodiment of this invention. It is a diagram. l...Contactor 2...Support 3...Piezoelectric element 4...Base 5...Detected object 51
... Uneven part 6 ... Lead wire 7 ... Output device 71 ... Amplifier 72 ... Bandpass filter 73 ... Waveform display section 74 ... Comparator 75 ... Notification device 76.・Relay circuit 77・
...Drive motor Figure 1 11! Figure 2 WI31! lContinued from page 10 Inventor Takuko Tachikawa 2-43-2 Hatagaya, Shibuya-ku, Tokyo Lymphus Optical Co., Ltd. 0 Inventor Satsuki Kanbara 2-43-2 Hatagaya, Shibuya-ku, Tokyo Lymphus Optical Inventor Michio Nawa 2-43-2 Hatagaya, Shibuya-ku, Tokyo Inside Rinpus Optical Industry Co., Ltd.

Claims (1)

【特許請求の範囲】 られ上記屈曲変位t+こ応じた電気出力を発生する圧4
素子と、この圧電素子の電気出力が与えられる出力装置
とを具備したことを特徴とする凹凸検出装置。 +21  h記圧電素子は支持体の一部に取付けられた
ことを特徴とする特許請求の範囲IEI項記載の凹凸検
出装置。 +33  ):記圧電素子は支持体全面にわたって取付
け−られたこと暫1%微とする特許請求の範囲第1項記
載の凹凸検出装置。 (4)E記出力装置は電気出力の波形を表示する波形表
示部、上記電気出力と予め設定された設定値との比較出
力を発生するコンパレータ、このコンパレータの出力に
より警報を発生する醤報装看および上記コンパレータの
出力により異常凹凸部を有する被検出体を除去する装置
の駆動部を有することを特徴とする特許請求の範囲第1
頂乃至第3項のいrれか′#cffi載の□凹凸検出装
置。
[Claims] A pressure 4 that generates an electrical output corresponding to the bending displacement t+
What is claimed is: 1. An unevenness detection device comprising: a piezoelectric element; and an output device to which an electrical output of the piezoelectric element is applied. +21 The unevenness detection device according to claim IEI, wherein the piezoelectric element is attached to a part of the support. +33): The unevenness detecting device according to claim 1, wherein the piezoelectric element is attached over the entire surface of the support with a difference of about 1%. (4) The output device described in E includes a waveform display unit that displays the waveform of the electrical output, a comparator that generates a comparison output between the electrical output and a preset setting value, and an alarm device that generates an alarm based on the output of this comparator. Claim 1, further comprising a drive unit for a device that removes an object to be detected having an abnormally uneven portion based on the output of the comparator.
□Irregularity detection device mounted on any one of the top to the third term'#cffi.
JP1679782A 1982-02-04 1982-02-04 Ruggedness detector Pending JPS58135402A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1679782A JPS58135402A (en) 1982-02-04 1982-02-04 Ruggedness detector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1679782A JPS58135402A (en) 1982-02-04 1982-02-04 Ruggedness detector

Publications (1)

Publication Number Publication Date
JPS58135402A true JPS58135402A (en) 1983-08-12

Family

ID=11926143

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1679782A Pending JPS58135402A (en) 1982-02-04 1982-02-04 Ruggedness detector

Country Status (1)

Country Link
JP (1) JPS58135402A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1989007748A1 (en) * 1988-02-20 1989-08-24 Bando Chemical Industries, Ltd. Apparatus for inspecting ridge of elastic body
US5488857A (en) * 1991-11-22 1996-02-06 Hitachi Electronic Engineering Co., Ltd. Protrusion sensor for sensing protrusion on a disc
JP2002340518A (en) * 2001-05-18 2002-11-27 Canon Inc Apparatus for identifying surface property and heating apparatus and imaging apparatus using the same
EP1265114A2 (en) * 2001-06-04 2002-12-11 Ricoh Company, Ltd. Fixing device, web differential gear and image formation apparatus
JP2009025029A (en) * 2007-07-17 2009-02-05 Canon Inc Surface property discrimination device, sheet material discrimination device, and image forming device
ITUA20164608A1 (en) * 2016-06-23 2017-12-23 Marposs Spa ELECTRONIC COMPARATOR FOR MEASURING LINEAR DIMENSIONS

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1989007748A1 (en) * 1988-02-20 1989-08-24 Bando Chemical Industries, Ltd. Apparatus for inspecting ridge of elastic body
US5488857A (en) * 1991-11-22 1996-02-06 Hitachi Electronic Engineering Co., Ltd. Protrusion sensor for sensing protrusion on a disc
JP2002340518A (en) * 2001-05-18 2002-11-27 Canon Inc Apparatus for identifying surface property and heating apparatus and imaging apparatus using the same
EP1265114A2 (en) * 2001-06-04 2002-12-11 Ricoh Company, Ltd. Fixing device, web differential gear and image formation apparatus
JP2009025029A (en) * 2007-07-17 2009-02-05 Canon Inc Surface property discrimination device, sheet material discrimination device, and image forming device
ITUA20164608A1 (en) * 2016-06-23 2017-12-23 Marposs Spa ELECTRONIC COMPARATOR FOR MEASURING LINEAR DIMENSIONS

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