JPS5813440Y2 - ロジツク信号用プロ−ブ - Google Patents

ロジツク信号用プロ−ブ

Info

Publication number
JPS5813440Y2
JPS5813440Y2 JP1976137118U JP13711876U JPS5813440Y2 JP S5813440 Y2 JPS5813440 Y2 JP S5813440Y2 JP 1976137118 U JP1976137118 U JP 1976137118U JP 13711876 U JP13711876 U JP 13711876U JP S5813440 Y2 JPS5813440 Y2 JP S5813440Y2
Authority
JP
Japan
Prior art keywords
signal
grounding
lead wire
probe
impedance
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1976137118U
Other languages
English (en)
Japanese (ja)
Other versions
JPS5354045U (cg-RX-API-DMAC7.html
Inventor
清水一成
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Iwatsu Electric Co Ltd
Original Assignee
Iwatsu Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Iwatsu Electric Co Ltd filed Critical Iwatsu Electric Co Ltd
Priority to JP1976137118U priority Critical patent/JPS5813440Y2/ja
Publication of JPS5354045U publication Critical patent/JPS5354045U/ja
Application granted granted Critical
Publication of JPS5813440Y2 publication Critical patent/JPS5813440Y2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Arrangements For Transmission Of Measured Signals (AREA)
  • Measuring Leads Or Probes (AREA)
  • Measurement Of Current Or Voltage (AREA)
JP1976137118U 1976-10-12 1976-10-12 ロジツク信号用プロ−ブ Expired JPS5813440Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1976137118U JPS5813440Y2 (ja) 1976-10-12 1976-10-12 ロジツク信号用プロ−ブ

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1976137118U JPS5813440Y2 (ja) 1976-10-12 1976-10-12 ロジツク信号用プロ−ブ

Publications (2)

Publication Number Publication Date
JPS5354045U JPS5354045U (cg-RX-API-DMAC7.html) 1978-05-09
JPS5813440Y2 true JPS5813440Y2 (ja) 1983-03-15

Family

ID=28745968

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1976137118U Expired JPS5813440Y2 (ja) 1976-10-12 1976-10-12 ロジツク信号用プロ−ブ

Country Status (1)

Country Link
JP (1) JPS5813440Y2 (cg-RX-API-DMAC7.html)

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50143091A (cg-RX-API-DMAC7.html) * 1974-04-30 1975-11-18

Also Published As

Publication number Publication date
JPS5354045U (cg-RX-API-DMAC7.html) 1978-05-09

Similar Documents

Publication Publication Date Title
US6097755A (en) Time domain reflectometer having optimal interrogating pulses
JP3201980B2 (ja) パッチコードのためのテスト用計測器、測定方法、およびテスト方法
US20040193382A1 (en) Method and apparatus for calibrating a multiport test system for measurement of a DUT
US20030173978A1 (en) Method and apparatus for calibrating a multiport test system for measurement of a dut
US8339146B2 (en) Method for calibrating a transmission line pulse test system
DE102008009962A1 (de) Tastkopf mit hochgenauer Gleichspannungsmessung
US10732222B2 (en) Real-time oscilloscope with a built-in time domain reflectometry (TDR) and/or time-domain transmission (TDT) function
KR102090014B1 (ko) 주파수 영역에서의 교정을 이용한 시간 영역 측정 방법
CN112612656A (zh) 用于数字化核脉冲处理器的在线式调试系统
JP2005300546A (ja) ケーブル障害測定のロスおよび散乱歪補正方法
JPS5813440Y2 (ja) ロジツク信号用プロ−ブ
CN104777413B (zh) 去嵌入的测试结构及其测试方法和芯片
US9772391B2 (en) Method for probe equalization
CN205880028U (zh) 示波器探头及示波器
JPH06331657A (ja) プローブ
US7518385B2 (en) Probe using high pass ground signal path
EP3546975B1 (en) Test arrangement and test method for characterizing a differential probe
JP2532229B2 (ja) 伝送路パラメ−タ測定装置
DE102007026589A1 (de) Prüfgerät und Struktur der Prüfspitze desselben
CN221405763U (zh) 一种示波器探头
CN107561475A (zh) 高频电流传感器频带量化校验方法、系统以及装置
EP0937986A2 (en) Single cable, single point, stimulus and response probing system and method
US11693046B2 (en) Monitoring waveforms from waveform generator at device under test
KR102582403B1 (ko) 고주파 펄스 측정 시스템
JPS623906B2 (cg-RX-API-DMAC7.html)