JPS58113840A - 露点検出装置 - Google Patents

露点検出装置

Info

Publication number
JPS58113840A
JPS58113840A JP21192481A JP21192481A JPS58113840A JP S58113840 A JPS58113840 A JP S58113840A JP 21192481 A JP21192481 A JP 21192481A JP 21192481 A JP21192481 A JP 21192481A JP S58113840 A JPS58113840 A JP S58113840A
Authority
JP
Japan
Prior art keywords
light
dew condensation
dew point
dew
point detection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP21192481A
Other languages
English (en)
Japanese (ja)
Other versions
JPS629854B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html
Inventor
Tetsuo Yamaguchi
哲郎 山口
Akio Furuichi
古市　昭夫
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
TOKYO HIKARI DENSHI KOGYO KK
RIKEN
Original Assignee
TOKYO HIKARI DENSHI KOGYO KK
RIKEN
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by TOKYO HIKARI DENSHI KOGYO KK, RIKEN filed Critical TOKYO HIKARI DENSHI KOGYO KK
Priority to JP21192481A priority Critical patent/JPS58113840A/ja
Publication of JPS58113840A publication Critical patent/JPS58113840A/ja
Publication of JPS629854B2 publication Critical patent/JPS629854B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00—Investigating or analyzing materials by the use of thermal means
    • G01N25/56—Investigating or analyzing materials by the use of thermal means by investigating moisture content
    • G01N25/66—Investigating or analyzing materials by the use of thermal means by investigating moisture content by investigating dew-point
    • G01N25/68—Investigating or analyzing materials by the use of thermal means by investigating moisture content by investigating dew-point by varying the temperature of a condensing surface

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP21192481A 1981-12-28 1981-12-28 露点検出装置 Granted JPS58113840A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP21192481A JPS58113840A (ja) 1981-12-28 1981-12-28 露点検出装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP21192481A JPS58113840A (ja) 1981-12-28 1981-12-28 露点検出装置

Publications (2)

Publication Number Publication Date
JPS58113840A true JPS58113840A (ja) 1983-07-06
JPS629854B2 JPS629854B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1987-03-03

Family

ID=16613918

Family Applications (1)

Application Number Title Priority Date Filing Date
JP21192481A Granted JPS58113840A (ja) 1981-12-28 1981-12-28 露点検出装置

Country Status (1)

Country Link
JP (1) JPS58113840A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02156574A (ja) * 1988-12-08 1990-06-15 Matsushita Electric Ind Co Ltd 結露検知素子
EP0780683A3 (en) * 1995-12-18 1997-07-02 Protimeter Plc Apparatus for dewpoint determination
JP2008144638A (ja) * 2006-12-08 2008-06-26 Across Corp ピストン
US7736051B2 (en) 2004-03-30 2010-06-15 Yamatake Corporation Thermoelectric device and mirror surface state detection device

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02156574A (ja) * 1988-12-08 1990-06-15 Matsushita Electric Ind Co Ltd 結露検知素子
EP0780683A3 (en) * 1995-12-18 1997-07-02 Protimeter Plc Apparatus for dewpoint determination
US7736051B2 (en) 2004-03-30 2010-06-15 Yamatake Corporation Thermoelectric device and mirror surface state detection device
JP2008144638A (ja) * 2006-12-08 2008-06-26 Across Corp ピストン

Also Published As

Publication number Publication date
JPS629854B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1987-03-03

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