JPS58110053A - Semiconductor device and manufacture thereof - Google Patents

Semiconductor device and manufacture thereof

Info

Publication number
JPS58110053A
JPS58110053A JP56212261A JP21226181A JPS58110053A JP S58110053 A JPS58110053 A JP S58110053A JP 56212261 A JP56212261 A JP 56212261A JP 21226181 A JP21226181 A JP 21226181A JP S58110053 A JPS58110053 A JP S58110053A
Authority
JP
Japan
Prior art keywords
films
region
intersection
conductive
sio2
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP56212261A
Other languages
Japanese (ja)
Inventor
Nobuo Sasaki
伸夫 佐々木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP56212261A priority Critical patent/JPS58110053A/en
Publication of JPS58110053A publication Critical patent/JPS58110053A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/52Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
    • H01L23/535Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including internal interconnections, e.g. cross-under constructions
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/0002Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Abstract

PURPOSE:To obtain the cell element of simple structure suitable for formation of an ROM, etc., by a method wherein a second conductive region is stacked on a first conductive region interposing an insulating film having thin film parts between them, and mixtures with the second conductive regions are formed selectively at the thin film parts to attain conduction. CONSTITUTION:Belt-shaped n<+> type layers 3 of a plural number are formed on an Si substrate 2, and after a thick SiO2 film 4 is stacked and windows are opened selectively, the window parts are covered with thin SiO2 films 4' and evaporated with Al films 1, and patterning is performed in the belt type. A matrix formed with the thin SiO2 films 4' only at the points of intersection of the layers 3 an the films 1 is completed. When a metal mask is applied and the desired points of intersection are scanned at the speed of about 4 inch/sec by the Ar layer beam of then several watts, Al at the irradiated points of intersection only is molten to be mixed with the SiO2 layers, and the films 1 and the n<+> type layers 3 attain conduction. The surface is covered with PSG5 finally to protect. According to the construction thereof, formation in a program can be attained simply, and this method is extremely effective.

Description

【発明の詳細な説明】 (1)@明の技術分野 本兄明は半4陣装置と七の製龜方法にか一、シ、特に容
易にオン、オフ状態に選択できる新規な構造の半導体装
置とその製造方法に関する。
DETAILED DESCRIPTION OF THE INVENTION (1) @Ming's technical field My main focus is on semi-four-circle devices and seven-head manufacturing methods, especially on semiconductors with a novel structure that can be easily switched on and off. Regarding the device and its manufacturing method.

(2)技術の背景 半導体メモリは急速に普及し、電子1゛算111.m卓
などあらゆる電子機器に用いられてbるが、こOような
半導体メモリの1ビツト七〜は複数又は単数の半導体素
子から構成dれており、機能の島逮化、小型化、低コス
ト化のためには、一層の高密度・高集積度が期待される
状況にある。
(2) Background of technology Semiconductor memories are rapidly becoming popular, with electronic 1. It is used in all kinds of electronic devices such as desks, but each bit of such semiconductor memory is made up of multiple or single semiconductor elements, which leads to the integration of functions, miniaturization, and low cost. In order to achieve this goal, even higher densities and higher integration levels are expected.

(8)従来技術と問題点 半導体メモリのうち、ROM、(Rea、10nlyM
10n1y )は読み出し専用で、予めlll1!逍す
る際(これをマスクROMと呼ぶ)、又は使用時に(こ
れをプログラマブルROMと呼ぶ)、それぞれのビット
に“0”又は“1”の信号tea込み、その後は書き換
えが不可能なもので、かようなメモリの1ビツト七〃は
例えば1個のMO8dO8中ポリシリコン・ヒユーズか
らなり、文字パターンなどはメモリアレイとしてマトリ
ックス状に回路構成されることが多い。
(8) Prior art and problems Among semiconductor memories, ROM, (Rea, 10nlyM
10n1y) is read-only, and is set to lll1! in advance. A signal of "0" or "1" is applied to each bit when storing (this is called a mask ROM) or when using (this is called a programmable ROM), and after that it cannot be rewritten. One bit of such a memory consists of, for example, one MO8dO8 polysilicon fuse, and character patterns are often constructed in a matrix-like circuit as a memory array.

したがって、比較的簡単な構造ではめるが、高速動作や
低コストのためには、更に単純化され、1%T?B度化
されることが、主1しいことは言うまでもない。
Therefore, it has a relatively simple structure, but for high-speed operation and low cost, it is further simplified to 1%T? It goes without saying that being ranked as a B is the most important thing.

(4)  発明の目的 本発明はこのようなROM、iるいはその池の回路をl
111或するだめの、最も単純な構造をもったセル素子
とその製造方法を提案するものでおる。
(4) Purpose of the Invention The present invention provides a method for implementing such a ROM or its circuit.
111, we propose a cell element with the simplest structure and its manufacturing method.

(5)@明の構成 本発明の特徴は1glの4電領域とに膜厚が薄い領域を
1個あるいはfJi数個有する絶縁膜を介して第2の4
電領域か設けられ、該膜厚が薄い領域において、該絶縁
膜と該第2の導電領域との混合物を介して姻択的に該第
1の4’を領域と第2の導電領域とが電気的に接続され
る半導体装置とその製造方法であり、以下実施例により
詳細に説明する。
(5) @ Akira's structure The feature of the present invention is that the second four-electrode region of 1gl is connected to the second four-electrode region through an insulating film having one thin film region or several fJi regions.
A conductive region is provided, and in the thin film thickness region, the first conductive region and the second conductive region are selectively connected to each other through a mixture of the insulating film and the second conductive region. The present invention relates to an electrically connected semiconductor device and a method for manufacturing the same, and will be described in detail below using Examples.

(6)発明の実施例 第1図はROMメモリアレイのマトリックス図を例示し
たもので、メモリセルは座標位置(Xi)。
(6) Embodiment of the Invention FIG. 1 illustrates a matrix diagram of a ROM memory array, in which the memory cells are located at coordinate positions (Xi).

(Yl)、・・・・・・・・・・・・(X4L (Y4
)まで16個が配列されているとする。各ビットの座標
位置は、第2図に示すような断面構造に形成されて寂り
、X方向にはAl膜1が配線され、Y方向には81基板
2面に導電層8が形成され、その両者の間に介在す、&
 810.膜4はA11lllと導*maとの交点4′
の各座標位置で薄く形成されて、膜厚は400人程度で
ある。この交点4′以外ではSi、02Fs4の膜厚は
6000人と厚く、又Al膜は膜厚8000人、導電層
は膜厚8009°人程度で、最上面は味護膜として燐け
い酸ガラス(PSG )膜5が被覆されている。
(Yl), ・・・・・・・・・・・・(X4L (Y4
) are arranged. The coordinate position of each bit is formed in a cross-sectional structure as shown in FIG. intervening between the two, &
810. Membrane 4 is located at the intersection 4' of A11lll and conductor *ma.
It is formed thinly at each coordinate position, and the film thickness is about 400 people. Other than this intersection 4', the film thickness of Si and 02Fs4 is 6000 mm thick, the Al film is 8000 mm thick, the conductive layer is about 8009 mm thick, and the top surface is made of phosphosilicate glass as a protective layer. PSG) membrane 5 is coated.

このような構造は、そのま\ではAl膜lと導電層8と
の交点の座標位置はすべて絶縁されており、数Vないし
数10vの電圧を印加しても導通はない。しかし所望の
座標位置を1面から例えばレーザ光のようなエネルギー
線で照射すると、その照射位置はAIが溶けて5i02
 yli4を混会し、導電層と電気的に接続して、Ae
膜lと4wL1114 Bの間が導通状類となる。かよ
うにして、多数のA4$1と導電層8との交点の所望座
標位置をオン(4dji)とし、レーザ光で照射しない
座標位置をオフ(未導通)の1−とするとROMが作成
される。
In such a structure, as it is, the coordinate positions of the intersections of the Al film 1 and the conductive layer 8 are all insulated, and there is no conduction even if a voltage of several volts to several tens of volts is applied. However, if the desired coordinate position is irradiated from one side with an energy beam such as a laser beam, the irradiated position will melt and become 5i02
yli4 is mixed and electrically connected to the conductive layer to form Ae
A conductive state exists between the membrane 1 and 4wL1114B. In this way, a ROM is created by setting the desired coordinate position of the intersection of a large number of A4$1 and the conductive layer 8 to ON (4dji), and setting the coordinate position not irradiated with laser light to OFF (non-conducting) 1-. Ru.

このようなROMの製造方法は、公知の半導体装置の製
法を用いて容易に形成することができる。
Such a ROM can be easily manufactured using a known semiconductor device manufacturing method.

第2図において、81基板2面に例えばng不純物層を
多数帯状に形成して、導tm8とし、次いで高温酸化処
理して厚い5i−02膜4を形成する。
In FIG. 2, a large number of NG impurity layers, for example, are formed in strips on the 2 surface of the 81 substrate to form a conductive tm8, and then a thick 5i-02 film 4 is formed by high temperature oxidation treatment.

次に導tma土の5102膜4の所望点をフォトプロセ
スにより窓アけし、再度高温酸化処理してその位置に4
00Aの薄い5i02[4部分を形成し、その上面にA
11Ii!lを蒸7f法で被着する・次にAg膜lをパ
ターンニングして上記導電層8に直角に交叉するAl膜
1(1)帯状パターンを形成し、導電jmBとAl膜1
との交叉位置のみ、薄いSin、膜4′が形成された7
トリツクスぞ°作成する。そして、その上面にPSG膜
5を被覆する。
Next, a desired point on the 5102 film 4 of conductive TMA soil is opened using a photo process, and high-temperature oxidation treatment is performed again to form a window at that position.
Form a thin 5i02[4 part of 00A, and add A on the top surface.
11Ii! 1 is deposited by vaporization 7f method.Next, the Ag film 1 is patterned to form a strip pattern of the Al film 1 (1) that intersects the conductive layer 8 at right angles, and conductive jmB and Al film 1 are formed.
A thin Sin film 4' was formed only at the intersection with 7.
Create Tricks. Then, a PSG film 5 is coated on the upper surface.

次にオンにするため照射するエネルギー線は、例えばア
ルゴンレーザのビーム光を用いて、電力lO敵ワットを
@時に加える。その場きROMパターンのオンとする座
標位置のみ露出させた金属マスクを表面に被覆しレーザ
ビーム光を4インチ/抄の速さでスキャンニングすると
形成が容易である。
Next, the energy beam to be irradiated to turn on is, for example, an argon laser beam, and a power of 10 watts is added to the beam. Formation is easy if the surface is covered with a metal mask that exposes only the coordinate position where the ROM pattern is to be turned on, and the laser beam is scanned at a speed of 4 inches/sheet.

このようにすれば、従来のマスクROMのように製造工
程中でマスク・パターンを変換して形成する方式を採る
必要はなく、蕾き込み操作も容易で。
In this way, unlike conventional mask ROMs, there is no need to convert and form mask patterns during the manufacturing process, and the programming operation is easy.

使用者側でも簡単にプログラム化することができる。It can also be easily programmed by the user.

従来のポリシリコン・ヒユーズよりなるプログラム化A
/ROMの場合には、ポリシリコンよりなるヒユーズが
平面的に配置されているのに対し、本構造は縦型の構造
なので、より果槓度が高い。
Programming A consisting of conventional polysilicon fuses
In the case of /ROM, fuses made of polysilicon are arranged in a planar manner, whereas this structure has a vertical structure, so it is more flexible.

ま要録護膜としてのPSGで2おわれている場合に、ポ
リシリコン・ヒユーズの場合は、破片が飛び散り信頼度
との問題がある。
However, in the case of a polysilicon fuse when it is covered with PSG as a recording protection film, there is a problem with reliability due to fragments flying off.

その池の実施例としては、本発明の栴造即ち第2図に示
す導を層8上に薄い5i02 fi4 、  A4?暎
り、PSG8116からなる表面層を積層した#4造を
、集積回路その池の回路内に設け、逆ヒユーズとして使
用することもできる。ヒユーズは、導通状態を切断する
ものであるが逆ヒユーズは不導通状轢を接続するもので
ある。例えば、第8図に図示している大#址メモリでは
、不良メモリセルを含むヒツトラインL1を切断して、
余分のビットラインLA(!−−換する処理が行われて
いるが、その場合にビットラインLAに本蚕明にか−る
回路構造81に設けておき、ビーム光を照射して導通さ
せると簡単に接続される。尚、不良ビット七μを含むビ
ットラインLLを切断する処置は従来と同じく、多結晶
シリコンからなるヒユーズ2部分を切断する。
As an example of the pond, a thin 5i02 fi4, A4? Alternatively, a #4 structure with a surface layer of PSG8116 laminated thereon can be provided within the circuit of the integrated circuit and used as a reverse fuse. A fuse is used to break a conductive state, whereas a reverse fuse is used to connect a non-conductive state. For example, in the large memory shown in FIG. 8, the hit line L1 containing the defective memory cell is cut,
Processing is being done to replace the extra bit line LA (!--, but in that case, if the bit line LA is provided with the circuit structure 81 according to Akira Honshi and a beam of light is irradiated to make it conductive, The bit line LL including the defective bit 7μ is cut by cutting the fuse 2 portion made of polycrystalline silicon, as in the conventional case.

又、論理回路を構成する集積回路(工C’)IICおい
ても、ゲートアレイ、プログラマブルロジックアレイな
どの1回路ユニットにそれぞれ本発明にか−る回路構造
を設けておき、選択的にビーム光を照射して、所望の回
路構成に接続することができる・したがって、完成式れ
たICで書き込み処理すればよいから、納期が短幅され
、又使用者側でもビーム照射して、所望の回路に構成す
ることが可能となる。
Furthermore, in an integrated circuit (C') IIC that constitutes a logic circuit, a circuit structure according to the present invention is provided in each circuit unit such as a gate array or a programmable logic array, and the beam light is selectively applied. It is possible to irradiate the beam and connect it to the desired circuit configuration. Therefore, since it is only necessary to perform the writing process on the completed IC, the delivery time is shortened, and the user can also irradiate the beam and connect it to the desired circuit configuration. It becomes possible to configure

このよつに+発明は多くの鐘用回路があるが、エネルギ
ー線はレーザビームのみならず、電子ビームなど池のビ
ーム光で照射してもかまわないし。
There are many bell circuits in this + invention, but the energy beam can be irradiated not only with a laser beam but also with a beam of light such as an electron beam.

又上面の9[[[はビームを透過する透明な絶縁暎であ
れば、pso褒以外の埃でもよい。又、博いSing 
1%の膜厚は数10人から1000人位までの範囲であ
ると、ビーム照射エネルギーを増減して導通状順とする
ことができる。
Also, as long as the upper surface 9 [[[ is a transparent insulating material that allows the beam to pass through, it may be any dust other than PSO material. Also, Hiroi Sing
If the film thickness of 1% is in the range of several tens to 1,000 layers, the beam irradiation energy can be increased or decreased to achieve a conductive state.

(7)発明の効果 以上の説明から判るように、本発明は最も単純化された
回路構造素子とその製造方法で、メモリの高密度化を初
めとしてその池の論理回路に組み込むと、プログラムの
書き込みが容易となるなど、極めて効果の顕著なもので
ある。
(7) Effects of the Invention As can be seen from the above explanation, the present invention is the simplest circuit structure element and its manufacturing method. It is extremely effective in that it makes writing easier.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明を適用するROMメモリアレイ図、第2
図は本発明にか!る断面#4構造、第8図は池の応用例
図を示し、図中、lはAj膜、2はS1基板、8は導電
層、4は51021fi、5vまPSGII%Sは逆ヒ
ユーズを示している。 7ドcxdlj’K        第  1第一 第3閏 Lmnnθn 〜、LA
Figure 1 is a ROM memory array diagram to which the present invention is applied;
Is the diagram related to the invention? Cross section #4 structure, Figure 8 shows an example of the pond application. ing. 7do cxdlj'K 1st 1st 3rd leap Lmnnθn ~, LA

Claims (1)

【特許請求の範囲】[Claims] (1)  第1 (D411を領域上に膜厚が薄い領域
を1個あるいは複数個有する細緻at−介して第2のみ
電領域が設けられ、該膜厚が薄い領域において、該絶縁
膜と該第2の41jtvR域との混合物を介して選択的
に該第1の4電領域と第2の導電領域とが電気的に接続
されてなることを特徴とする半導体装置。 (4第lの導電領域上に膜厚が薄い領域を1個わるいは
慣数個有する絶縁1111を介して第2の導et@植を
形成した後、該膜厚が薄い領域にエネルギー線t−遺沢
的に照射して該第1の導電領域と第2の都電w4域とを
一気的に接続することを特徴とする半導体装置の製造方
法。
(1) A second conductive region is provided through a thin at-layer having one or more thin film regions on the first (D411) region, and in the thin film region, the insulating film and the A semiconductor device characterized in that the first four-conducting region and the second conductive region are electrically connected selectively through a mixture with a second 41jtvR region. After forming a second conductive et@ implant through an insulator 1111 having at least one thin film region or an integer number of thin film regions on the region, the thin film region is irradiated with an energy beam t. A method for manufacturing a semiconductor device, characterized in that the first conductive region and the second metropolitan area W4 are connected at once.
JP56212261A 1981-12-24 1981-12-24 Semiconductor device and manufacture thereof Pending JPS58110053A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56212261A JPS58110053A (en) 1981-12-24 1981-12-24 Semiconductor device and manufacture thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56212261A JPS58110053A (en) 1981-12-24 1981-12-24 Semiconductor device and manufacture thereof

Publications (1)

Publication Number Publication Date
JPS58110053A true JPS58110053A (en) 1983-06-30

Family

ID=16619643

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56212261A Pending JPS58110053A (en) 1981-12-24 1981-12-24 Semiconductor device and manufacture thereof

Country Status (1)

Country Link
JP (1) JPS58110053A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012049521A (en) * 2010-08-04 2012-03-08 Micron Technology Inc Forming resistive random access memories together with fuse arrays

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5797644A (en) * 1980-12-09 1982-06-17 Ricoh Co Ltd Wiring connection method of semiconductor device
JPS57202776A (en) * 1981-06-08 1982-12-11 Toshiba Corp Semiconductor device

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5797644A (en) * 1980-12-09 1982-06-17 Ricoh Co Ltd Wiring connection method of semiconductor device
JPS57202776A (en) * 1981-06-08 1982-12-11 Toshiba Corp Semiconductor device

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012049521A (en) * 2010-08-04 2012-03-08 Micron Technology Inc Forming resistive random access memories together with fuse arrays
US8569734B2 (en) 2010-08-04 2013-10-29 Micron Technology, Inc. Forming resistive random access memories together with fuse arrays
US9136471B2 (en) 2010-08-04 2015-09-15 Micron Technology, Inc. Forming resistive random access memories together with fuse arrays
US9356237B2 (en) 2010-08-04 2016-05-31 Micron Technology, Inc. Forming resistive random access memories together with fuse arrays
US9735354B2 (en) 2010-08-04 2017-08-15 Micron Technology, Inc. Forming resistive random access memories together with fuse arrays

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