JPS58105152A - Dust remover for original plate in lithographic printer - Google Patents

Dust remover for original plate in lithographic printer

Info

Publication number
JPS58105152A
JPS58105152A JP56204060A JP20406081A JPS58105152A JP S58105152 A JPS58105152 A JP S58105152A JP 56204060 A JP56204060 A JP 56204060A JP 20406081 A JP20406081 A JP 20406081A JP S58105152 A JPS58105152 A JP S58105152A
Authority
JP
Japan
Prior art keywords
dust
original plate
original
plates
suction port
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP56204060A
Other languages
Japanese (ja)
Inventor
Kazuo Sugie
杉江 一夫
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
TELMEC CO Ltd
Original Assignee
TELMEC CO Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by TELMEC CO Ltd filed Critical TELMEC CO Ltd
Priority to JP56204060A priority Critical patent/JPS58105152A/en
Publication of JPS58105152A publication Critical patent/JPS58105152A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F1/00Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
    • G03F1/68Preparation processes not covered by groups G03F1/20 - G03F1/50
    • G03F1/82Auxiliary processes, e.g. cleaning or inspecting
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/20Exposure; Apparatus therefor
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/708Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
    • G03F7/70858Environment aspects, e.g. pressure of beam-path gas, temperature
    • G03F7/70866Environment aspects, e.g. pressure of beam-path gas, temperature of mask or workpiece

Abstract

PURPOSE:To eliminate the defects of patterns, by providing mechanisms for inspecting original plates for presence or absence of dust and sizes thereof in places where the plates are printed and removing the dust present on the plates. CONSTITUTION:The bottom surface of an original plate 6 is swept over the entire surface thereof by moving mechanisms 28, 29 which move the locus of the light 2 from a laser device 1 mounted to a frame 5 in X-Y directions. The reflection that arises when the laser light shines on foreign matters and dust is detected with a photodetector 3, and the position thereof is stored. A vacuum suction port 7 is moved to said position and the foreign matters or dust are removed by vacuum. If dust sticks on the original plate by static electricity, a corona discharger 15 is used. More specifically, high voltage is applied to the destaticizing bar of the corona discharger and corona is discharged from the tip of the stylus to ionize the air around the stylus and to neutralize the electrostatic charge of dust 29 and the electrostatic charge of the original plate 6, whereby the dust 29 is easily removed.

Description

【発明の詳細な説明】 この発明は、写真原版上についた塵埃を検出し、又その
塵埃を取り除く装置に関するものである。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an apparatus for detecting dust on a photographic original plate and removing the dust.

腕在、工0−LSIと微細なパターンの需要が増大して
きている。このようなパターンをウェハー上へ焼付ける
場合、原版と異ったパターンが/リコンウエハー上に形
成される確率が高い。その原因としては原版に付着して
いる塵埃が主要な原因となっている。
Demand for 0-LSI and fine patterns is increasing. When such a pattern is printed onto a wafer, there is a high probability that a pattern different from the original will be formed on the silicon wafer. The main cause of this is dust adhering to the original plate.

従来、使用されてきた一括露光の場合には、塵埃の付着
した原版の一部分が不良品として焼料けられるが、焼料
はパターンの数倍及び10倍の原版を用いてレンズによ
ってウェハー上へ縮少投影する場合、個別に焼付けた部
分が全て不良となってしまう。
In the case of the conventional batch exposure, a part of the original plate with dust attached is printed as a defective product, but the printing material is printed onto the wafer using a lens using an original plate several times or 10 times larger than the pattern. In the case of reduced projection, all the individually printed parts will be defective.

このような状況を回避する為にも原版上の個々の塵埃を
見つけ、又、それを除去する方法が有効となってくる。
In order to avoid this situation, it is effective to find individual dust particles on the original plate and remove them.

又、現在市販されている装置の構成を考えると、原版を
検査する場所と実際に焼付けを行う場所が異っている為
、搬送の途中で検査した原版へ再び塵埃等が付着する可
能性がある。
Furthermore, considering the configuration of the devices currently on the market, the location where the original is inspected is different from the location where the actual printing is performed, so there is a possibility that dust, etc. may re-adhere to the original that has been inspected during transportation. be.

本発明は、実際に焼付ける場所で塵埃の有無及び大小の
検査を行い、塵埃が有った場合にはそれを取り除く機構
を提供することを目的としたものである。
An object of the present invention is to provide a mechanism for inspecting the presence and size of dust at the actual printing location and removing dust if found.

塵埃を取り除く方法としては、真壁を利用して単に原版
に付着している塵埃を除く方法と静電気にを よって原版についている塵埃なコロナ放電によって、電
気的に中性にして原版から取り除く方法を併用して行う
ことが出来る〇 以下、この発明の実施例を示す図面に関して述べる。
There are two ways to remove dust: one is to use a Makabe to simply remove the dust attached to the original, and the other is to use static electricity to make the original electrically neutral and remove it from the original using corona discharge. Hereinafter, drawings showing embodiments of the present invention will be described.

第1図は、本発明に係る塵埃除去装置を併設した10対
1の縮少露光装置の断面を示しである。装置の構成とし
ては、6で示すガラス製の原版を8で示す照明系を使用
して照らし、その像を9で示すレンズ群を通し、13で
示すステージ上にある10で示すシリコンウエノ1−へ
原版の像を10分の1に縮少して転写する機構を有する
FIG. 1 shows a cross section of a 10:1 reduction exposure apparatus equipped with a dust removal apparatus according to the present invention. The configuration of the apparatus is as follows: A glass original plate shown at 6 is illuminated using an illumination system shown at 8, and its image is passed through a group of lenses shown at 9, and a silicon wafer plate shown at 10 is placed on a stage shown at 13. It has a mechanism that reduces the image of the original plate to one-tenth and transfers it.

原版上のパターンは6で示すガラスの下面になるように
取り付けられている為、第2図に示すように、この下面
に14で示されるような塵埃等が付着した場合、これが
ウェハー上に像として結像されてしまう。又、これが欠
陥となり工’c−r#xを作る上で不良の原因となる。
The pattern on the original plate is attached so that it is on the bottom surface of the glass shown at 6, so if dust, etc., as shown at 14, adheres to this bottom surface as shown in Figure 2, this will cause the image to appear on the wafer. It is imaged as Moreover, this becomes a defect and causes a failure when manufacturing the machine 'c-r#x.

第1図中の1は、レーザー装置で5で示すフレームに取
り付けられている。
1 in FIG. 1 is a laser device attached to a frame indicated by 5.

5で示すフレームは基板11上に設けられだX −Y方
向へ可動する28.29で示された移動機構によって2
で示す光の軌跡を、6で示す原版下面を全面に渡って掃
引することを可能にしている。
A frame indicated by 5 is provided on the substrate 11 and is moved in the X-Y direction by a moving mechanism indicated by 28 and 29.
It is possible to sweep the trajectory of light shown by 6 over the entire lower surface of the original plate shown by 6.

又、前記のような原版6上のレーザー光の掃引は次のよ
うにしても良い。
Further, the above-mentioned sweeping of the laser beam on the original plate 6 may be performed as follows.

X−Yの移動機構を使わす5で示すフレームを固定し4
で示す反射鏡を利用して、2で示される光の軌跡を原版
6の全面に掃引するように反射鏡4を回転させる方法も
有効でるる。
Fix the frame shown in 5 using the X-Y movement mechanism 4
It is also effective to rotate the reflecting mirror 4 so as to sweep the trajectory of light shown by 2 over the entire surface of the original 6 using the reflecting mirror shown in FIG.

このようにして、原版6の下面を掃引するレーザー光が
異物、塵埃等に当たると乱反射の現象が原版上で起る。
In this way, when the laser beam sweeping the lower surface of the original 6 hits foreign matter, dust, etc., a phenomenon of diffuse reflection occurs on the original.

この反射を6で示す光検出器で検知を行うと同時に塵埃
を検出した原版上の位置を記憶させておく。
This reflection is detected by a photodetector 6, and at the same time, the position on the original where the dust was detected is memorized.

次に7で示す真空吸引口を原版上の塵埃を検出した位置
へ移動させ真空によってこれを除去する。
Next, the vacuum suction port 7 is moved to the position where dust on the original is detected, and the dust is removed by vacuum.

吸入ロアの取り付1〆ている26で示される基台は第3
図に示す機構によってX−Y方向へ自由に掃引し、原版
上の塵埃を真空で除去する。
Installation of the suction lower 1. The base indicated by 26 is the third
It is freely swept in the X-Y direction by the mechanism shown in the figure, and dust on the original is removed by vacuum.

駆動方式として18で示すモーターを駆動させ、22で
示す減速機を介して、26で示すネジ軸を回転させると
17で示す両ガイドに沿って、19で示す基台がX方向
へ動いて行く。
As a drive method, when the motor shown at 18 is driven and the screw shaft shown at 26 is rotated via the reducer shown at 22, the base shown at 19 moves in the X direction along both guides shown at 17. .

次に、20で示すモーターを駆動させ、21で示す減速
機を介して24で示すネジ軸を回転させると、25で示
すガイドに沿って7で示す真空吸入口を有する26で示
される基台がY軸方向へ動いて行く。
Next, when the motor shown at 20 is driven and the screw shaft shown at 24 is rotated through the reducer shown at 21, the base shown at 26 having a vacuum suction port shown at 7 is moved along the guide shown at 25. moves in the Y-axis direction.

この2軸の動きを介して原版全面に対し掃引し、吸入口
を使用して塵埃を取り除く。
Through the movement of these two axes, the entire surface of the original is swept, and dust is removed using the suction port.

第4図は、6で示す原版が帯電した場合、原版に29で
示されるような正又は負に帯電した塵埃が付着する。
In FIG. 4, when the original plate shown at 6 is charged, positively or negatively charged dust as shown at 29 is attached to the original plate.

静電気による塵埃を除去する為に、15で示すコロナ放
電装置を用いる。
A corona discharge device shown at 15 is used to remove dust caused by static electricity.

本装置は各種の帯電電荷を除去する為に使用する(5) もので、尖鋭な放電針を有する。This device is used to remove various types of electrical charges (5) It has a sharp discharge needle.

15で示される除電棒に高電圧を印加させ、針先端より
コロナ放電を行なわせ、針周辺の空気をイオン化し、1
6で示されるような正と負のイオンを作ることにより、
6で示す原版の帯電の電荷と29で示される塵埃の帯電
の電荷を無接触で中和して塵埃の除去を容易にさせる。
A high voltage is applied to the static eliminating rod indicated by 15 to cause corona discharge to occur from the tip of the needle, ionizing the air around the needle, and
By creating positive and negative ions as shown in 6,
The electric charge of the original plate shown by 6 and the electric charge of dust shown by 29 are neutralized without contact to facilitate the removal of dust.

以上、本発明に係る塵埃除去装置の一実施例について説
明したが、本発明の主旨を変えることなく他にも種々の
実施例を考案することが出来る。
Although one embodiment of the dust removal device according to the present invention has been described above, various other embodiments can be devised without changing the gist of the present invention.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は、本発明に係る塵埃除去装置を取り付けたフォ
トリソグラフィー装置の断面を示す図、第2図は、原版
上の塵埃の除去方法の概念を示す図、第3図は、塵埃除
去用の真空ノズル機構を本体上部より見た図、第4図は
、原版へ静電気によって引きつけられた塵埃を除去する
方法を示した図である。 特許出願人 株式会社チルメック (6) 第2図 第3匡 M 4 図
FIG. 1 is a diagram showing a cross section of a photolithography apparatus equipped with a dust removal device according to the present invention, FIG. 2 is a diagram showing the concept of a method for removing dust on an original, and FIG. FIG. 4 is a view of the vacuum nozzle mechanism seen from the top of the main body, and is a diagram showing a method for removing dust attracted to the original plate by static electricity. Patent applicant Chilmek Co., Ltd. (6) Fig. 2 Fig. 3 M4 Fig.

Claims (1)

【特許請求の範囲】 1、焼付は装置の原版に付着している塵埃の近くに移動
可能な真空吸引口、前記真空吸引口f:x及びY方向に
移動するだめの駆動装置、塵埃が除去されたことを確認
するだめの塵埃検査装置を有するフォトリングラフイー
焼付は装置。 2、特許請求の範囲1に示す装置に於いて真空吸引口に
代って空気吹き付は口を装着したもの。 3、特許請求の範囲1又は2に示す装置に於いて、塵埃
の離脱を容易にする目的を持ったコロナ放電装置を装着
したもの。
[Claims] 1. A vacuum suction port that can be moved near the dust attached to the original plate of the printing device, a drive device for moving the vacuum suction port f in the x and Y directions, and the dust is removed. The photolithographic printing equipment has a dust inspection device to confirm that it has been used. 2. The device according to claim 1 is equipped with an air blowing port instead of the vacuum suction port. 3. The device according to claim 1 or 2, which is equipped with a corona discharge device for the purpose of facilitating removal of dust.
JP56204060A 1981-12-17 1981-12-17 Dust remover for original plate in lithographic printer Pending JPS58105152A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56204060A JPS58105152A (en) 1981-12-17 1981-12-17 Dust remover for original plate in lithographic printer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56204060A JPS58105152A (en) 1981-12-17 1981-12-17 Dust remover for original plate in lithographic printer

Publications (1)

Publication Number Publication Date
JPS58105152A true JPS58105152A (en) 1983-06-22

Family

ID=16484082

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56204060A Pending JPS58105152A (en) 1981-12-17 1981-12-17 Dust remover for original plate in lithographic printer

Country Status (1)

Country Link
JP (1) JPS58105152A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0671278A2 (en) * 1994-03-11 1995-09-13 Eastman Kodak Company Improved vacuum collection system for dye-ablation printing process

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5355983A (en) * 1976-10-31 1978-05-20 Konishiroku Photo Ind Co Ltd Automatic micro defect detector
JPS5692541A (en) * 1979-12-27 1981-07-27 Fujitsu Ltd Photomask printing device
JPS56126926A (en) * 1980-03-12 1981-10-05 Nec Corp Projection type both surface exposure machine

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5355983A (en) * 1976-10-31 1978-05-20 Konishiroku Photo Ind Co Ltd Automatic micro defect detector
JPS5692541A (en) * 1979-12-27 1981-07-27 Fujitsu Ltd Photomask printing device
JPS56126926A (en) * 1980-03-12 1981-10-05 Nec Corp Projection type both surface exposure machine

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0671278A2 (en) * 1994-03-11 1995-09-13 Eastman Kodak Company Improved vacuum collection system for dye-ablation printing process
EP0671278A3 (en) * 1994-03-11 1998-01-07 Eastman Kodak Company Improved vacuum collection system for dye-ablation printing process

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