JPS5796281A - Smear testing device - Google Patents
Smear testing deviceInfo
- Publication number
- JPS5796281A JPS5796281A JP17299180A JP17299180A JPS5796281A JP S5796281 A JPS5796281 A JP S5796281A JP 17299180 A JP17299180 A JP 17299180A JP 17299180 A JP17299180 A JP 17299180A JP S5796281 A JPS5796281 A JP S5796281A
- Authority
- JP
- Japan
- Prior art keywords
- specimen
- measurement
- radioactive waste
- waste vessel
- measurement specimen
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T7/00—Details of radiation-measuring instruments
- G01T7/02—Collecting means for receiving or storing samples to be investigated and possibly directly transporting the samples to the measuring arrangement; particularly for investigating radioactive fluids
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Measurement Of Radiation (AREA)
Abstract
PURPOSE:To make it possible to measure radioactive rays automatically by pressing a measurement specimen to a radioactive waste vessel and carrying the specimen to the detection section. after cutting it. CONSTITUTION:A cylinder unit 15 behind a pressing mechanism 7 is operated to press a measurement specimen 6 on to a radioactive waste vessel. The measurement specimen 6 in this state carries out sampling of the surface of the radioactive waste vessel by contacting the polluted surface of the radioactive waste vessel. After the measurement is finished, the measurement specimen 6 is fed out by pinch rollers, and the specimen 6 that contains the position to be measured is cut off by a cutter 13 and it is carried away to a radioactivity measurement device on a belt conveyor 16.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17299180A JPS5796281A (en) | 1980-12-08 | 1980-12-08 | Smear testing device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17299180A JPS5796281A (en) | 1980-12-08 | 1980-12-08 | Smear testing device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5796281A true JPS5796281A (en) | 1982-06-15 |
Family
ID=15952146
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP17299180A Pending JPS5796281A (en) | 1980-12-08 | 1980-12-08 | Smear testing device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5796281A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5927485U (en) * | 1982-08-13 | 1984-02-20 | 大阪機工株式会社 | Drum drive device in remote smear equipment |
JP2008020400A (en) * | 2006-07-14 | 2008-01-31 | Toshiba Corp | Surface contamination inspection apparatus |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5595884A (en) * | 1979-01-16 | 1980-07-21 | Daifuku Co Ltd | Smear test device |
-
1980
- 1980-12-08 JP JP17299180A patent/JPS5796281A/en active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5595884A (en) * | 1979-01-16 | 1980-07-21 | Daifuku Co Ltd | Smear test device |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5927485U (en) * | 1982-08-13 | 1984-02-20 | 大阪機工株式会社 | Drum drive device in remote smear equipment |
JP2008020400A (en) * | 2006-07-14 | 2008-01-31 | Toshiba Corp | Surface contamination inspection apparatus |
JP4679456B2 (en) * | 2006-07-14 | 2011-04-27 | 株式会社東芝 | Surface contamination inspection device |
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