JPS5789156A - Pattern generation collating device - Google Patents

Pattern generation collating device

Info

Publication number
JPS5789156A
JPS5789156A JP55166092A JP16609280A JPS5789156A JP S5789156 A JPS5789156 A JP S5789156A JP 55166092 A JP55166092 A JP 55166092A JP 16609280 A JP16609280 A JP 16609280A JP S5789156 A JPS5789156 A JP S5789156A
Authority
JP
Japan
Prior art keywords
section
rapid
ram
cycle pattern
pattern
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP55166092A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6319899B2 (enExample
Inventor
Kaoru Mihashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP55166092A priority Critical patent/JPS5789156A/ja
Publication of JPS5789156A publication Critical patent/JPS5789156A/ja
Publication of JPS6319899B2 publication Critical patent/JPS6319899B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/263—Generation of test inputs, e.g. test vectors, patterns or sequences ; with adaptation of the tested hardware for testability with external testers

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
JP55166092A 1980-11-25 1980-11-25 Pattern generation collating device Granted JPS5789156A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55166092A JPS5789156A (en) 1980-11-25 1980-11-25 Pattern generation collating device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55166092A JPS5789156A (en) 1980-11-25 1980-11-25 Pattern generation collating device

Publications (2)

Publication Number Publication Date
JPS5789156A true JPS5789156A (en) 1982-06-03
JPS6319899B2 JPS6319899B2 (enExample) 1988-04-25

Family

ID=15824841

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55166092A Granted JPS5789156A (en) 1980-11-25 1980-11-25 Pattern generation collating device

Country Status (1)

Country Link
JP (1) JPS5789156A (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010060292A (ja) * 2008-09-01 2010-03-18 Fujitsu Microelectronics Ltd 半導体集積回路装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010060292A (ja) * 2008-09-01 2010-03-18 Fujitsu Microelectronics Ltd 半導体集積回路装置

Also Published As

Publication number Publication date
JPS6319899B2 (enExample) 1988-04-25

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