JPS5782754A - Inspection device for printed wiring substrate - Google Patents
Inspection device for printed wiring substrateInfo
- Publication number
- JPS5782754A JPS5782754A JP14768381A JP14768381A JPS5782754A JP S5782754 A JPS5782754 A JP S5782754A JP 14768381 A JP14768381 A JP 14768381A JP 14768381 A JP14768381 A JP 14768381A JP S5782754 A JPS5782754 A JP S5782754A
- Authority
- JP
- Japan
- Prior art keywords
- pattern
- mask plate
- substrate
- printed wiring
- open
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/956—Inspecting patterns on the surface of objects
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
PURPOSE:To find an abnormal pattern rapidly with high precision, by floating the open and short circuit part of the circuit pattern part of a printed writing substrate by using a mask plate. CONSTITUTION:A pattern part 1 drawn on a printed wiring substrate with etching resist ink is exposed out, and the other part is covered with a mask plate. This mask plate is provided with mark parts 6 and 7 for location alignment. Then, this mark plate is superposed on the substrate and then adjusted so that inspection mark parts 6 and 7 provided on the substrate are coincident with the mark parts 8 and 9. At this time, if there is an open part A in the pattern part, the open part A is seen floating. Further, when the mask plate is provided covering the pattern part while exposing the other part, the short circuit part of the pattern part is seen floating. Thus, the abnormality of the pattern is found rapidly with high precision.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14768381A JPS5782754A (en) | 1981-09-17 | 1981-09-17 | Inspection device for printed wiring substrate |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14768381A JPS5782754A (en) | 1981-09-17 | 1981-09-17 | Inspection device for printed wiring substrate |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5782754A true JPS5782754A (en) | 1982-05-24 |
Family
ID=15435916
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP14768381A Pending JPS5782754A (en) | 1981-09-17 | 1981-09-17 | Inspection device for printed wiring substrate |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5782754A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5010064A (en) * | 1987-06-17 | 1991-04-23 | Edmond Pharma S.R.L. | Inclusion complexes of dipyridamole with cyclodextrins |
-
1981
- 1981-09-17 JP JP14768381A patent/JPS5782754A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5010064A (en) * | 1987-06-17 | 1991-04-23 | Edmond Pharma S.R.L. | Inclusion complexes of dipyridamole with cyclodextrins |
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