JPS5776833A - Heat resistant metal depositing method and product thereof - Google Patents
Heat resistant metal depositing method and product thereofInfo
- Publication number
- JPS5776833A JPS5776833A JP13391281A JP13391281A JPS5776833A JP S5776833 A JPS5776833 A JP S5776833A JP 13391281 A JP13391281 A JP 13391281A JP 13391281 A JP13391281 A JP 13391281A JP S5776833 A JPS5776833 A JP S5776833A
- Authority
- JP
- Japan
- Prior art keywords
- product
- heat resistant
- resistant metal
- depositing method
- metal depositing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000000151 deposition Methods 0.000 title 1
- 239000002184 metal Substances 0.000 title 1
- 238000000034 method Methods 0.000 title 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/06—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of metallic material
- C23C16/08—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of metallic material from metal halides
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/04—Coating on selected surface areas, e.g. using masks
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
- H01L21/283—Deposition of conductive or insulating materials for electrodes conducting electric current
- H01L21/285—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation
- H01L21/28506—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers
- H01L21/28512—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers on semiconductor bodies comprising elements of Group IV of the Periodic Table
- H01L21/28556—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers on semiconductor bodies comprising elements of Group IV of the Periodic Table by chemical means, e.g. CVD, LPCVD, PECVD, laser CVD
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
- H01L21/76838—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the conductors
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Physics & Mathematics (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Materials Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Electrodes Of Semiconductors (AREA)
- Chemical Vapour Deposition (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US18397480A | 1980-09-04 | 1980-09-04 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5776833A true JPS5776833A (en) | 1982-05-14 |
Family
ID=22675091
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP13391281A Pending JPS5776833A (en) | 1980-09-04 | 1981-08-25 | Heat resistant metal depositing method and product thereof |
Country Status (3)
Country | Link |
---|---|
JP (1) | JPS5776833A (ja) |
DE (1) | DE3134702C2 (ja) |
NL (1) | NL189819C (ja) |
Cited By (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59217327A (ja) * | 1983-05-26 | 1984-12-07 | Toshiba Corp | 半導体装置の製造方法 |
JPS6050920A (ja) * | 1983-08-30 | 1985-03-22 | Toshiba Corp | 半導体装置の製造方法 |
JPS6091631A (ja) * | 1983-10-25 | 1985-05-23 | Toshiba Corp | 半導体装置の製造方法 |
JPS6143481A (ja) * | 1984-08-08 | 1986-03-03 | Oki Electric Ind Co Ltd | シヨツトキゲ−ト電界効果トランジスタの製造方法 |
US4582563A (en) * | 1983-11-28 | 1986-04-15 | Kabushiki Kaisha Toshiba | Process for forming multi-layer interconnections |
JPS61139026A (ja) * | 1984-12-11 | 1986-06-26 | Fujitsu Ltd | 半導体装置の製造方法 |
US4616401A (en) * | 1984-06-19 | 1986-10-14 | Kabushiki Kaisha Toshiba | Method of fabricating an insulated gate type field-effect transistor |
US4670967A (en) * | 1983-12-27 | 1987-06-09 | Kabushiki Kaisha Toshiba | Forming multilayer interconnections for a semiconductor device by vapor phase growth process |
JPS6311669A (ja) * | 1986-06-30 | 1988-01-19 | Ulvac Corp | Cvd法 |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6042823A (ja) * | 1983-08-19 | 1985-03-07 | Toshiba Corp | 薄膜形成方法 |
US4552783A (en) * | 1984-11-05 | 1985-11-12 | General Electric Company | Enhancing the selectivity of tungsten deposition on conductor and semiconductor surfaces |
JP2592844B2 (ja) * | 1987-07-10 | 1997-03-19 | 株式会社東芝 | 高融点金属膜の形成方法 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS53114350A (en) * | 1977-03-16 | 1978-10-05 | Toshiba Corp | Semiconductor and its manufacture |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3697342A (en) * | 1970-12-16 | 1972-10-10 | Ibm | Method of selective chemical vapor deposition |
DE2718518C3 (de) * | 1977-04-26 | 1984-04-19 | Siemens Ag, 1000 Berlin Und 8000 Muenchen | Verfahren zum Abscheiden einer Schicht auf der Innenseite von Hohlräumen eines Werkstückes |
-
1981
- 1981-08-25 JP JP13391281A patent/JPS5776833A/ja active Pending
- 1981-09-02 DE DE19813134702 patent/DE3134702C2/de not_active Expired
- 1981-09-03 NL NL8104092A patent/NL189819C/xx not_active IP Right Cessation
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS53114350A (en) * | 1977-03-16 | 1978-10-05 | Toshiba Corp | Semiconductor and its manufacture |
Cited By (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59217327A (ja) * | 1983-05-26 | 1984-12-07 | Toshiba Corp | 半導体装置の製造方法 |
JPS6050920A (ja) * | 1983-08-30 | 1985-03-22 | Toshiba Corp | 半導体装置の製造方法 |
US4597167A (en) * | 1983-08-30 | 1986-07-01 | Kabushiki Kaisha Toshiba | Method of forming a metal film on a selectively diffused layer |
JPS6091631A (ja) * | 1983-10-25 | 1985-05-23 | Toshiba Corp | 半導体装置の製造方法 |
JPH0580815B2 (ja) * | 1983-10-25 | 1993-11-10 | Tokyo Shibaura Electric Co | |
US4582563A (en) * | 1983-11-28 | 1986-04-15 | Kabushiki Kaisha Toshiba | Process for forming multi-layer interconnections |
US4670967A (en) * | 1983-12-27 | 1987-06-09 | Kabushiki Kaisha Toshiba | Forming multilayer interconnections for a semiconductor device by vapor phase growth process |
US4616401A (en) * | 1984-06-19 | 1986-10-14 | Kabushiki Kaisha Toshiba | Method of fabricating an insulated gate type field-effect transistor |
JPS6143481A (ja) * | 1984-08-08 | 1986-03-03 | Oki Electric Ind Co Ltd | シヨツトキゲ−ト電界効果トランジスタの製造方法 |
JPS61139026A (ja) * | 1984-12-11 | 1986-06-26 | Fujitsu Ltd | 半導体装置の製造方法 |
JPS6311669A (ja) * | 1986-06-30 | 1988-01-19 | Ulvac Corp | Cvd法 |
Also Published As
Publication number | Publication date |
---|---|
DE3134702C2 (de) | 1983-12-22 |
DE3134702A1 (de) | 1982-03-25 |
NL189819C (nl) | 1993-08-02 |
NL8104092A (nl) | 1982-04-01 |
NL189819B (nl) | 1993-03-01 |
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