JPS5768047A - Probe card - Google Patents
Probe cardInfo
- Publication number
- JPS5768047A JPS5768047A JP55144908A JP14490880A JPS5768047A JP S5768047 A JPS5768047 A JP S5768047A JP 55144908 A JP55144908 A JP 55144908A JP 14490880 A JP14490880 A JP 14490880A JP S5768047 A JPS5768047 A JP S5768047A
- Authority
- JP
- Japan
- Prior art keywords
- time
- measuring
- emitting device
- light emitting
- probe card
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP55144908A JPS5768047A (en) | 1980-10-16 | 1980-10-16 | Probe card |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP55144908A JPS5768047A (en) | 1980-10-16 | 1980-10-16 | Probe card |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5768047A true JPS5768047A (en) | 1982-04-26 |
| JPS6117142B2 JPS6117142B2 (enrdf_load_stackoverflow) | 1986-05-06 |
Family
ID=15373077
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP55144908A Granted JPS5768047A (en) | 1980-10-16 | 1980-10-16 | Probe card |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5768047A (enrdf_load_stackoverflow) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008066690A (ja) * | 2006-08-11 | 2008-03-21 | Seiko Instruments Inc | 面光源付プローブカード |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63196435U (enrdf_load_stackoverflow) * | 1987-06-04 | 1988-12-16 |
-
1980
- 1980-10-16 JP JP55144908A patent/JPS5768047A/ja active Granted
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008066690A (ja) * | 2006-08-11 | 2008-03-21 | Seiko Instruments Inc | 面光源付プローブカード |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6117142B2 (enrdf_load_stackoverflow) | 1986-05-06 |
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