JPS5764168A - Non-contact type electrometer - Google Patents

Non-contact type electrometer

Info

Publication number
JPS5764168A
JPS5764168A JP55138782A JP13878280A JPS5764168A JP S5764168 A JPS5764168 A JP S5764168A JP 55138782 A JP55138782 A JP 55138782A JP 13878280 A JP13878280 A JP 13878280A JP S5764168 A JPS5764168 A JP S5764168A
Authority
JP
Japan
Prior art keywords
potential
signal
signals
measured
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP55138782A
Other languages
Japanese (ja)
Inventor
Minoru Aoki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ricoh Co Ltd
Original Assignee
Ricoh Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ricoh Co Ltd filed Critical Ricoh Co Ltd
Priority to JP55138782A priority Critical patent/JPS5764168A/en
Publication of JPS5764168A publication Critical patent/JPS5764168A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R5/00Instruments for converting a single current or a single voltage into a mechanical displacement
    • G01R5/28Electrostatic instruments
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/16Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using capacitive devices
    • G01R15/165Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using capacitive devices measuring electrostatic potential, e.g. with electrostatic voltmeters or electrometers, when the design of the sensor is essential
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/24Arrangements for measuring quantities of charge

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Control Or Security For Electrophotography (AREA)

Abstract

PURPOSE:To correct the errors of the results of measurement automatically by displacing a reference potential surface or an object to be measured in a non-contact type electrometer to be incorporated into copying machines, etc., thereby bringing said surface and object to the position where the measurement of surface potential with a probe is possible. CONSTITUTION:The voltage signal V0 of a photoreceptor surface 3 as an object to be measured with a probe 5 and a conductor surface 4 as a reference potential (earth potential) surface are supplied to a sample holding circuit 12 or the same 13 via a switching circuit 11 which is switched by the switching signal S3 from a control part 15. More specifically, the signal V0 when the surface 3 is in a measurement position is sample held in the circuit 12 and the signal V0 when the surface 3 is in the measurement position in the circuit 13. In these circuits 12, 13, the peak values of the signals are sampled and held respectively by the sampling signals S4, S5 from the control part 15, and the synchronizing detection of the signals V0 is accomplished respectively, whereby synchronously detected voltage signals V1, V2 are respectively obtained. The potential difference between said signals V1, V2 is detected with a differential amplifier 14, and the measured signal V3 corresponding to the potential amplifier 14; and the measured signal V3 corresponding to the potential Vx to be measured is obtained.
JP55138782A 1980-10-06 1980-10-06 Non-contact type electrometer Pending JPS5764168A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55138782A JPS5764168A (en) 1980-10-06 1980-10-06 Non-contact type electrometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55138782A JPS5764168A (en) 1980-10-06 1980-10-06 Non-contact type electrometer

Publications (1)

Publication Number Publication Date
JPS5764168A true JPS5764168A (en) 1982-04-19

Family

ID=15230071

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55138782A Pending JPS5764168A (en) 1980-10-06 1980-10-06 Non-contact type electrometer

Country Status (1)

Country Link
JP (1) JPS5764168A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110554252A (en) * 2019-09-27 2019-12-10 萧县众科电磁检测有限公司 electrostatic tester

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52146629A (en) * 1976-05-31 1977-12-06 Canon Inc Formation of image
JPS55127574A (en) * 1979-03-26 1980-10-02 Fuji Xerox Co Ltd Drift compensating method of toner density detector in electrophotographic copier

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52146629A (en) * 1976-05-31 1977-12-06 Canon Inc Formation of image
JPS55127574A (en) * 1979-03-26 1980-10-02 Fuji Xerox Co Ltd Drift compensating method of toner density detector in electrophotographic copier

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110554252A (en) * 2019-09-27 2019-12-10 萧县众科电磁检测有限公司 electrostatic tester

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