JPS5762556A - Semiconductor device - Google Patents

Semiconductor device

Info

Publication number
JPS5762556A
JPS5762556A JP55137464A JP13746480A JPS5762556A JP S5762556 A JPS5762556 A JP S5762556A JP 55137464 A JP55137464 A JP 55137464A JP 13746480 A JP13746480 A JP 13746480A JP S5762556 A JPS5762556 A JP S5762556A
Authority
JP
Japan
Prior art keywords
wire
cell
aluminum
memory
wires
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP55137464A
Other languages
Japanese (ja)
Inventor
Osamu Kudo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP55137464A priority Critical patent/JPS5762556A/en
Publication of JPS5762556A publication Critical patent/JPS5762556A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10BELECTRONIC MEMORY DEVICES
    • H10B12/00Dynamic random access memory [DRAM] devices
    • H10B12/30DRAM devices comprising one-transistor - one-capacitor [1T-1C] memory cells

Landscapes

  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
  • Semiconductor Memories (AREA)

Abstract

PURPOSE:To enable the transfer of data at high speed by employing aluminum wires for wording wires and bit wires in a 1-transistor/cell type MOS memory, minimizing the wire resistance, and performing the high speed operation of the memory. CONSTITUTION:1-transistor/cell type dynamic MOS memory cell has the first polysilicon layer 204 becoming one electrode of a cell capacity and the second polysilicon layer 206 forming the transfer gate of the cell. The til wire is formed of the first aluminum wire 208, and the word wire is formed of the second aluminum wire 210. This memory has a transistor section, a capacity section in a silicon gate structure. The bit wire can reduced in the parasitic capacity for the aluminum wire, and the data transfer of the detector can be performed at the high speed in high integration with stable operation. The word wire can also minimize the delay in reading due to the aluminum wire.
JP55137464A 1980-10-01 1980-10-01 Semiconductor device Pending JPS5762556A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55137464A JPS5762556A (en) 1980-10-01 1980-10-01 Semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55137464A JPS5762556A (en) 1980-10-01 1980-10-01 Semiconductor device

Publications (1)

Publication Number Publication Date
JPS5762556A true JPS5762556A (en) 1982-04-15

Family

ID=15199210

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55137464A Pending JPS5762556A (en) 1980-10-01 1980-10-01 Semiconductor device

Country Status (1)

Country Link
JP (1) JPS5762556A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61114551A (en) * 1984-11-09 1986-06-02 Toshiba Corp Semiconductor integrated circuit device and pattern layout therefor
JPS62169471A (en) * 1986-01-22 1987-07-25 Hitachi Ltd Semiconductor integrated circuit device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61114551A (en) * 1984-11-09 1986-06-02 Toshiba Corp Semiconductor integrated circuit device and pattern layout therefor
JPS62169471A (en) * 1986-01-22 1987-07-25 Hitachi Ltd Semiconductor integrated circuit device

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