JPS5755307B2 - - Google Patents

Info

Publication number
JPS5755307B2
JPS5755307B2 JP52058232A JP5823277A JPS5755307B2 JP S5755307 B2 JPS5755307 B2 JP S5755307B2 JP 52058232 A JP52058232 A JP 52058232A JP 5823277 A JP5823277 A JP 5823277A JP S5755307 B2 JPS5755307 B2 JP S5755307B2
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP52058232A
Other languages
Japanese (ja)
Other versions
JPS52143780A (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS52143780A publication Critical patent/JPS52143780A/ja
Publication of JPS5755307B2 publication Critical patent/JPS5755307B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/26Bombardment with radiation
    • H01L21/263Bombardment with radiation with high-energy radiation
    • H01L21/265Bombardment with radiation with high-energy radiation producing ion implantation
    • H01L21/26506Bombardment with radiation with high-energy radiation producing ion implantation in group IV semiconductors
    • H01L21/26513Bombardment with radiation with high-energy radiation producing ion implantation in group IV semiconductors of electrically active species
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/71Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/74Making of localized buried regions, e.g. buried collector layers, internal connections substrate contacts
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/71Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/768Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
    • H01L21/76898Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics formed through a semiconductor substrate
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/34Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
    • H01L23/36Selection of materials, or shaping, to facilitate cooling or heating, e.g. heatsinks
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/86Types of semiconductor device ; Multistep manufacturing processes therefor controllable only by variation of the electric current supplied, or only the electric potential applied, to one or more of the electrodes carrying the current to be rectified, amplified, oscillated or switched
    • H01L29/861Diodes
    • H01L29/864Transit-time diodes, e.g. IMPATT, TRAPATT diodes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/0002Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/1015Shape
    • H01L2924/10155Shape being other than a cuboid
    • H01L2924/10158Shape being other than a cuboid at the passive surface
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/30Technical effects
    • H01L2924/301Electrical effects
    • H01L2924/3011Impedance

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Computer Hardware Design (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Materials Engineering (AREA)
  • Chemical & Material Sciences (AREA)
  • Toxicology (AREA)
  • Ceramic Engineering (AREA)
  • Element Separation (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Electrodes Of Semiconductors (AREA)
  • Bipolar Integrated Circuits (AREA)
JP5823277A 1976-05-21 1977-05-21 Method of producing planar to fabricate hf semiconductor element Granted JPS52143780A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/688,662 US4030943A (en) 1976-05-21 1976-05-21 Planar process for making high frequency ion implanted passivated semiconductor devices and microwave integrated circuits

Publications (2)

Publication Number Publication Date
JPS52143780A JPS52143780A (en) 1977-11-30
JPS5755307B2 true JPS5755307B2 (US07943777-20110517-C00090.png) 1982-11-24

Family

ID=24765273

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5823277A Granted JPS52143780A (en) 1976-05-21 1977-05-21 Method of producing planar to fabricate hf semiconductor element

Country Status (5)

Country Link
US (2) US4030943A (US07943777-20110517-C00090.png)
JP (1) JPS52143780A (US07943777-20110517-C00090.png)
DE (1) DE2721397C3 (US07943777-20110517-C00090.png)
FR (1) FR2352398A1 (US07943777-20110517-C00090.png)
GB (1) GB1532579A (US07943777-20110517-C00090.png)

Families Citing this family (32)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4160992A (en) * 1977-09-14 1979-07-10 Raytheon Company Plural semiconductor devices mounted between plural heat sinks
GB2100925B (en) * 1981-06-25 1985-06-05 Standard Telephones Cables Ltd Fabricating integrated circuits
JPS58170044A (ja) * 1982-03-31 1983-10-06 Fujitsu Ltd 半導体素子
US4585299A (en) * 1983-07-19 1986-04-29 Fairchild Semiconductor Corporation Process for fabricating optical wave-guiding components and components made by the process
US4872039A (en) * 1986-04-25 1989-10-03 General Electric Company Buried lateral diode and method for making same
US4789642A (en) * 1987-03-26 1988-12-06 The United States Of America As Represented By The Secretary Of The Air Force Method for fabricating low loss crystalline silicon waveguides by dielectric implantation
US4787691A (en) * 1987-03-26 1988-11-29 The United States Of America As Represented By The Secretary Of The Air Force Electro-optical silicon devices
US4970578A (en) * 1987-05-01 1990-11-13 Raytheon Company Selective backside plating of GaAs monolithic microwave integrated circuits
US4800420A (en) * 1987-05-14 1989-01-24 Hughes Aircraft Company Two-terminal semiconductor diode arrangement
DE3718684A1 (de) * 1987-06-04 1988-12-22 Licentia Gmbh Halbleiterkoerper
US5449953A (en) * 1990-09-14 1995-09-12 Westinghouse Electric Corporation Monolithic microwave integrated circuit on high resistivity silicon
US5063177A (en) * 1990-10-04 1991-11-05 Comsat Method of packaging microwave semiconductor components and integrated circuits
DE4209983A1 (de) * 1992-03-27 1993-09-30 Daimler Benz Ag Verfahren zur Herstellung von in einem Gehäuse angeordneten Halbleiterbauelementen
US5652461A (en) * 1992-06-03 1997-07-29 Seiko Epson Corporation Semiconductor device with a convex heat sink
JPH07115175A (ja) * 1993-10-14 1995-05-02 Nec Corp 半導体装置
US5795495A (en) * 1994-04-25 1998-08-18 Micron Technology, Inc. Method of chemical mechanical polishing for dielectric layers
US5559359A (en) * 1994-07-29 1996-09-24 Reyes; Adolfo C. Microwave integrated circuit passive element structure and method for reducing signal propagation losses
DE4433330C2 (de) * 1994-09-19 1997-01-30 Fraunhofer Ges Forschung Verfahren zur Herstellung von Halbleiterstrukturen mit vorteilhaften Hochfrequenzeigenschaften sowie eine Halbleiterwaferstruktur
US6265771B1 (en) * 1999-01-27 2001-07-24 International Business Machines Corporation Dual chip with heat sink
US6791181B2 (en) * 2000-11-29 2004-09-14 Mitsubishi Chemical Corporation Semiconductor light emitting device
US6900501B2 (en) * 2001-11-02 2005-05-31 Cree Microwave, Inc. Silicon on insulator device with improved heat removal
JP2009246157A (ja) * 2008-03-31 2009-10-22 Toshiba Corp 高周波帯半導体装置
WO2010079474A1 (en) 2009-01-11 2010-07-15 Brightview Systems Ltd A system and method for thin film quality assurance
DE102010002204A1 (de) * 2010-02-22 2011-08-25 OSRAM Opto Semiconductors GmbH, 93055 Halbleiterdiode und Verfahren zum Herstellen einer Halbleiterdiode
US8816503B2 (en) 2011-08-29 2014-08-26 Infineon Technologies Austria Ag Semiconductor device with buried electrode
US9178261B2 (en) * 2012-07-11 2015-11-03 University Of South Florida Vertical microcoaxial interconnects
SG2013082102A (en) 2012-11-05 2014-06-27 Agency Science Tech & Res Method for forming an optical modulator
US9412879B2 (en) 2013-07-18 2016-08-09 Texas Instruments Incorporated Integration of the silicon IMPATT diode in an analog technology
US9659717B2 (en) 2014-02-18 2017-05-23 Analog Devices Global MEMS device with constant capacitance
US9748048B2 (en) 2014-04-25 2017-08-29 Analog Devices Global MEMS switch
US9583294B2 (en) 2014-04-25 2017-02-28 Analog Devices Global MEMS swtich with internal conductive path
EP3411894B1 (en) 2016-02-04 2023-06-14 Analog Devices International Unlimited Company Active opening mems switch device

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3383567A (en) * 1965-09-15 1968-05-14 Ion Physics Corp Solid state translating device comprising irradiation implanted conductivity ions
US3431150A (en) * 1966-10-07 1969-03-04 Us Air Force Process for implanting grids in semiconductor devices
US3558366A (en) * 1968-09-17 1971-01-26 Bell Telephone Labor Inc Metal shielding for ion implanted semiconductor device
FR2160759B1 (US07943777-20110517-C00090.png) * 1971-11-26 1974-05-31 Thomson Csf
US3743967A (en) * 1972-03-16 1973-07-03 Boeing Co Stabilized trapatt oscillator diode
JPS4924361A (US07943777-20110517-C00090.png) * 1972-06-27 1974-03-04
US3808058A (en) * 1972-08-17 1974-04-30 Bell Telephone Labor Inc Fabrication of mesa diode with channel guard
GB1447723A (en) * 1974-02-08 1976-08-25 Post Office Semiconductor devices
US3874918A (en) * 1974-02-19 1975-04-01 Trw Inc Structure and process for semiconductor device using batch processing
US3990099A (en) * 1974-12-05 1976-11-02 Rca Corporation Planar Trapatt diode

Also Published As

Publication number Publication date
FR2352398B1 (US07943777-20110517-C00090.png) 1984-06-22
JPS52143780A (en) 1977-11-30
GB1532579A (en) 1978-11-15
US4030943A (en) 1977-06-21
US4091408A (en) 1978-05-23
DE2721397A1 (de) 1977-11-24
DE2721397B2 (de) 1979-04-19
FR2352398A1 (fr) 1977-12-16
DE2721397C3 (de) 1980-01-03

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