JPS5754872A - Evaluating method of quality of elastic surface wave element - Google Patents

Evaluating method of quality of elastic surface wave element

Info

Publication number
JPS5754872A
JPS5754872A JP12921980A JP12921980A JPS5754872A JP S5754872 A JPS5754872 A JP S5754872A JP 12921980 A JP12921980 A JP 12921980A JP 12921980 A JP12921980 A JP 12921980A JP S5754872 A JPS5754872 A JP S5754872A
Authority
JP
Japan
Prior art keywords
surface wave
elastic surface
wave element
electrostatic capacity
electrode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP12921980A
Other languages
Japanese (ja)
Inventor
Tomoyoshi Yatsuse
Shigeyuki Kita
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP12921980A priority Critical patent/JPS5754872A/en
Publication of JPS5754872A publication Critical patent/JPS5754872A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/22—Measuring piezoelectric properties

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

PURPOSE:To make it possible to easily evaluate the quality of elastic surface wave element in a short period of time, by measuring electrostatic capacity between an electrode and a stem of an elastic surface wave element and determining whether it is acceptable or not by magnitude of the value of the electrostatic capacity. CONSTITUTION:An input electrode 1 and an output electrode 2 of an elastic surface wave element are opposite to each other on the surface and formed into a comb-like shape, and a piesoelectric substrate 3 is attached onto a metallic stem 4 by an adhesive 5. Correlation-ship between the electrode-stem electrostatic capacity and the trap level is checked in advance specifically by grades of the elastic surface wave elements, and electrostatic capacities corresponding to prescribed trap levels are sought in advance. And, by measuring an electrostatic capacity between an electrode and a stem of a specimen elastic surface wave element, and also by comparing it with the electrostatic capacity of judgement cryteria, acceptability of the frequency characteristic based on a prescribed trap level is judged. It is possible, by doing so, to eliminate necessity of measurement of passing characteristic in frequency of checkpoint at many places and also to determine acceptability easily.
JP12921980A 1980-09-19 1980-09-19 Evaluating method of quality of elastic surface wave element Pending JPS5754872A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12921980A JPS5754872A (en) 1980-09-19 1980-09-19 Evaluating method of quality of elastic surface wave element

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12921980A JPS5754872A (en) 1980-09-19 1980-09-19 Evaluating method of quality of elastic surface wave element

Publications (1)

Publication Number Publication Date
JPS5754872A true JPS5754872A (en) 1982-04-01

Family

ID=15004079

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12921980A Pending JPS5754872A (en) 1980-09-19 1980-09-19 Evaluating method of quality of elastic surface wave element

Country Status (1)

Country Link
JP (1) JPS5754872A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62189683A (en) * 1986-02-14 1987-08-19 Yokogawa Hewlett Packard Ltd Disk driver
JPH02199635A (en) * 1989-01-27 1990-08-08 Hitachi Ltd Information recording disk and its manufacture and recording device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62189683A (en) * 1986-02-14 1987-08-19 Yokogawa Hewlett Packard Ltd Disk driver
JPH02199635A (en) * 1989-01-27 1990-08-08 Hitachi Ltd Information recording disk and its manufacture and recording device
US5548454A (en) * 1989-01-27 1996-08-20 Hitachi, Ltd. Information recording disk, its production method and recording apparatus

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