JPS5750255B2 - - Google Patents
Info
- Publication number
- JPS5750255B2 JPS5750255B2 JP51003735A JP373576A JPS5750255B2 JP S5750255 B2 JPS5750255 B2 JP S5750255B2 JP 51003735 A JP51003735 A JP 51003735A JP 373576 A JP373576 A JP 373576A JP S5750255 B2 JPS5750255 B2 JP S5750255B2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
- 
        - G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2805—Bare printed circuit boards
 
- 
        - G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
- G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
- G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
- G01N27/9006—Details, e.g. in the structure or functioning of sensors
 
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Life Sciences & Earth Sciences (AREA)
- Immunology (AREA)
- Health & Medical Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Electrochemistry (AREA)
- Pathology (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
- Measuring Leads Or Probes (AREA)
- Coils Or Transformers For Communication (AREA)
- Coils Of Transformers For General Uses (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title | 
|---|---|---|---|
| SU7502090705A SU563615A1 (ru) | 1975-01-15 | 1975-01-15 | Токовихревой преобразователь | 
Publications (2)
| Publication Number | Publication Date | 
|---|---|
| JPS5287662A JPS5287662A (en) | 1977-07-21 | 
| JPS5750255B2 true JPS5750255B2 (OSRAM) | 1982-10-26 | 
Family
ID=20605590
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date | 
|---|---|---|---|
| JP373576A Granted JPS5287662A (en) | 1975-01-15 | 1976-01-14 | Eddy current converter for testing conductive layer coated on hole portion of printed substrate nonndestructively | 
Country Status (3)
| Country | Link | 
|---|---|
| JP (1) | JPS5287662A (OSRAM) | 
| SE (1) | SE413944B (OSRAM) | 
| SU (1) | SU563615A1 (OSRAM) | 
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title | 
|---|---|---|---|---|
| JPS58183156U (ja) * | 1982-06-02 | 1983-12-06 | 日本発条株式会社 | 自動車用シ−トのア−ムレスト | 
| JPS6256451U (OSRAM) * | 1985-09-30 | 1987-04-08 | ||
| JPS6366956U (OSRAM) * | 1986-10-22 | 1988-05-06 | 
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title | 
|---|---|---|---|---|
| RU2216729C1 (ru) * | 2002-10-24 | 2003-11-20 | Федеральное государственное унитарное предприятие "Московское машиностроительное производственное предприятие "Салют" | Токовихревой преобразователь | 
| CN115943304A (zh) * | 2021-06-10 | 2023-04-07 | 东芝三菱电机产业系统株式会社 | 涡电流检查方法 | 
- 
        1975
        - 1975-01-15 SU SU7502090705A patent/SU563615A1/ru active
 
- 
        1976
        - 1976-01-14 SE SE7600325A patent/SE413944B/xx not_active IP Right Cessation
- 1976-01-14 JP JP373576A patent/JPS5287662A/ja active Granted
 
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title | 
|---|---|---|---|---|
| JPS58183156U (ja) * | 1982-06-02 | 1983-12-06 | 日本発条株式会社 | 自動車用シ−トのア−ムレスト | 
| JPS6256451U (OSRAM) * | 1985-09-30 | 1987-04-08 | ||
| JPS6366956U (OSRAM) * | 1986-10-22 | 1988-05-06 | 
Also Published As
| Publication number | Publication date | 
|---|---|
| SE413944B (sv) | 1980-06-30 | 
| JPS5287662A (en) | 1977-07-21 | 
| SU563615A1 (ru) | 1977-06-30 | 
| SE7600325L (sv) | 1976-07-16 | 
Similar Documents
Legal Events
| Date | Code | Title | Description | 
|---|---|---|---|
| TRDD | Decision of grant or rejection written | ||
| LAPS | Cancellation because of no payment of annual fees |