JPS5744122B2 - - Google Patents

Info

Publication number
JPS5744122B2
JPS5744122B2 JP767124A JP712476A JPS5744122B2 JP S5744122 B2 JPS5744122 B2 JP S5744122B2 JP 767124 A JP767124 A JP 767124A JP 712476 A JP712476 A JP 712476A JP S5744122 B2 JPS5744122 B2 JP S5744122B2
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP767124A
Other languages
Japanese (ja)
Other versions
JPS5290960A (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP712476A priority Critical patent/JPS5290960A/ja
Publication of JPS5290960A publication Critical patent/JPS5290960A/ja
Publication of JPS5744122B2 publication Critical patent/JPS5744122B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Indication And Recording Devices For Special Purposes And Tariff Metering Devices (AREA)
  • Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
JP712476A 1976-01-27 1976-01-27 Method of calibrating measuring instrument Granted JPS5290960A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP712476A JPS5290960A (en) 1976-01-27 1976-01-27 Method of calibrating measuring instrument

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP712476A JPS5290960A (en) 1976-01-27 1976-01-27 Method of calibrating measuring instrument

Publications (2)

Publication Number Publication Date
JPS5290960A JPS5290960A (en) 1977-07-30
JPS5744122B2 true JPS5744122B2 (el) 1982-09-20

Family

ID=11657315

Family Applications (1)

Application Number Title Priority Date Filing Date
JP712476A Granted JPS5290960A (en) 1976-01-27 1976-01-27 Method of calibrating measuring instrument

Country Status (1)

Country Link
JP (1) JPS5290960A (el)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1993003328A1 (en) * 1991-08-05 1993-02-18 Daikin Industries, Ltd. Method and apparatus for analyzing physical quantities, and apparatus for removing line spectrum noise
JP2014025772A (ja) * 2012-07-26 2014-02-06 Hioki Ee Corp 物理量測定装置および物理量測定方法

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS564017A (en) * 1979-06-25 1981-01-16 Ee & D:Kk Digital type precise weight measuring device using load cell
JPS58115319A (ja) * 1981-12-28 1983-07-09 Sumitomo Heavy Ind Ltd 測定装置の補正方法
JPS6047920A (ja) * 1983-08-26 1985-03-15 Shimadzu Corp 材料試験機の計測装置
JPS60113117A (ja) * 1983-11-24 1985-06-19 Yamato Scale Co Ltd 計重器
JPS60257314A (ja) * 1984-06-04 1985-12-19 Kyowa Dengiyou:Kk 非直線性補正装置
JPS61138133A (ja) * 1984-12-11 1986-06-25 Tokyo Electric Co Ltd ロ−ドセルユニツト
JPH01272920A (ja) * 1988-04-26 1989-10-31 Chino Corp 計器の目盛校正方法
JP5361137B2 (ja) * 2007-02-28 2013-12-04 株式会社日立ハイテクノロジーズ 荷電粒子ビーム測長装置
JP2010249691A (ja) * 2009-04-16 2010-11-04 Nittetsu Elex Co Ltd 校正曲線の作成方法

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1993003328A1 (en) * 1991-08-05 1993-02-18 Daikin Industries, Ltd. Method and apparatus for analyzing physical quantities, and apparatus for removing line spectrum noise
JP2014025772A (ja) * 2012-07-26 2014-02-06 Hioki Ee Corp 物理量測定装置および物理量測定方法

Also Published As

Publication number Publication date
JPS5290960A (en) 1977-07-30

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