JPS5737848A - Heating apparatus for wafer - Google Patents
Heating apparatus for waferInfo
- Publication number
- JPS5737848A JPS5737848A JP11371580A JP11371580A JPS5737848A JP S5737848 A JPS5737848 A JP S5737848A JP 11371580 A JP11371580 A JP 11371580A JP 11371580 A JP11371580 A JP 11371580A JP S5737848 A JPS5737848 A JP S5737848A
- Authority
- JP
- Japan
- Prior art keywords
- wafer
- heat
- section
- hps
- heat radiation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67098—Apparatus for thermal treatment
- H01L21/67109—Apparatus for thermal treatment mainly by convection
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67098—Apparatus for thermal treatment
- H01L21/67103—Apparatus for thermal treatment mainly by conduction
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/68—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Die Bonding (AREA)
Abstract
PURPOSE:To heat the wafer with radiant heat, and to improve the uniformity and reproducibility of a temperature by mounting a heat radiation section, heat radiation efficiency thereof is increased, onto a heat generating section through a heat-transfer section and supporting the wafer while forming a clearance between the wafer and the surface of the heat radiation section by a spacer. CONSTITUTION:The heat-transfer section HT is shaped on the heat generating section HS into which heater blocks HB are buried, and the wafer mounting section HP, which is coated with carbon, etc. and the heat radiation of the surface section HPS thereof is improved, is formed on the heat-transfer section HT. The cylindrical spacers S consisting of a material having low thermal conductivity such as a nichrome wire are fitted onto the HPS in order to form the clearance between the wafer and the HPS, and arranged so as to support the wafer W by several minute contact areas. Accordingly, the wafer can be heated without extremely damaging thermal efficiency, and the generation of the unevenness of the temperature due to the deformation and repeated use of the wafer can be prevented.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11371580A JPS5737848A (en) | 1980-08-19 | 1980-08-19 | Heating apparatus for wafer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11371580A JPS5737848A (en) | 1980-08-19 | 1980-08-19 | Heating apparatus for wafer |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5737848A true JPS5737848A (en) | 1982-03-02 |
Family
ID=14619307
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP11371580A Pending JPS5737848A (en) | 1980-08-19 | 1980-08-19 | Heating apparatus for wafer |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5737848A (en) |
Cited By (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6044018U (en) * | 1983-09-05 | 1985-03-28 | オリンパス光学工業株式会社 | Fixed structure of the stage of an inverted microscope |
JPS61165719A (en) * | 1985-12-26 | 1986-07-26 | Olympus Optical Co Ltd | Inverted microscope |
JPS61165720A (en) * | 1985-12-26 | 1986-07-26 | Olympus Optical Co Ltd | Inverted microscope |
JPS62201932U (en) * | 1986-06-14 | 1987-12-23 | ||
JPS6379636U (en) * | 1986-11-13 | 1988-05-26 | ||
US4919614A (en) * | 1987-05-30 | 1990-04-24 | Dainippon Screen Mfg. Co., Ltd. | Apparatus for heat treatment of a substrate |
JPH0436231U (en) * | 1990-07-20 | 1992-03-26 | ||
US5241157A (en) * | 1990-04-27 | 1993-08-31 | Georg Fischer Ag | Arrangement for butt-welding plastic material components |
JPH0677239U (en) * | 1994-05-10 | 1994-10-28 | 大日本スクリーン製造株式会社 | Substrate heat treatment equipment |
US6771416B2 (en) | 2000-09-20 | 2004-08-03 | Olympus Optical Co., Ltd. | Inverted microscope |
US6813071B2 (en) | 2001-03-23 | 2004-11-02 | Olympus Optical Co., Ltd. | Inverted microscope |
DE10209844B4 (en) * | 2001-03-09 | 2010-04-08 | Olympus Corporation | Inverse microscope system |
-
1980
- 1980-08-19 JP JP11371580A patent/JPS5737848A/en active Pending
Cited By (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0355934Y2 (en) * | 1983-09-05 | 1991-12-13 | ||
JPS6044018U (en) * | 1983-09-05 | 1985-03-28 | オリンパス光学工業株式会社 | Fixed structure of the stage of an inverted microscope |
JPS61165719A (en) * | 1985-12-26 | 1986-07-26 | Olympus Optical Co Ltd | Inverted microscope |
JPS61165720A (en) * | 1985-12-26 | 1986-07-26 | Olympus Optical Co Ltd | Inverted microscope |
JPH055330B2 (en) * | 1985-12-26 | 1993-01-22 | Olympus Optical Co | |
JPS62201932U (en) * | 1986-06-14 | 1987-12-23 | ||
JPH0521875Y2 (en) * | 1986-06-14 | 1993-06-04 | ||
JPS6379636U (en) * | 1986-11-13 | 1988-05-26 | ||
US4919614A (en) * | 1987-05-30 | 1990-04-24 | Dainippon Screen Mfg. Co., Ltd. | Apparatus for heat treatment of a substrate |
US5241157A (en) * | 1990-04-27 | 1993-08-31 | Georg Fischer Ag | Arrangement for butt-welding plastic material components |
JPH0436231U (en) * | 1990-07-20 | 1992-03-26 | ||
JPH0677239U (en) * | 1994-05-10 | 1994-10-28 | 大日本スクリーン製造株式会社 | Substrate heat treatment equipment |
US6771416B2 (en) | 2000-09-20 | 2004-08-03 | Olympus Optical Co., Ltd. | Inverted microscope |
DE10209844B4 (en) * | 2001-03-09 | 2010-04-08 | Olympus Corporation | Inverse microscope system |
US6813071B2 (en) | 2001-03-23 | 2004-11-02 | Olympus Optical Co., Ltd. | Inverted microscope |
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