JPS5733350A - Method and apparatus for electromagnetic flaw inspection - Google Patents

Method and apparatus for electromagnetic flaw inspection

Info

Publication number
JPS5733350A
JPS5733350A JP10845680A JP10845680A JPS5733350A JP S5733350 A JPS5733350 A JP S5733350A JP 10845680 A JP10845680 A JP 10845680A JP 10845680 A JP10845680 A JP 10845680A JP S5733350 A JPS5733350 A JP S5733350A
Authority
JP
Japan
Prior art keywords
inspected
core
face
coil
defect
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10845680A
Other languages
Japanese (ja)
Inventor
Shuji Naito
Hideomi Oki
Hiroshi Miyazaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Nippon Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Steel Corp filed Critical Nippon Steel Corp
Priority to JP10845680A priority Critical patent/JPS5733350A/en
Publication of JPS5733350A publication Critical patent/JPS5733350A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9046—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents by analysing electrical signals

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)

Abstract

PURPOSE:To stably inspect the defect of surface and outer layer of strong magnetic material with a low electric power consumption, by facing a coil provided on an alternating current electromagnet in a prescribed shape with the material to be inspected each other. CONSTITUTION:A core 4 of flaw inspection apparatus arranged the core 4 wound coils 5-7 which is crossed at right angles each other between electrodes of an alternating current electromagnet A, is faced to the surface of the material to be inspected each other. Then, the material 3 is saturated with magnetism by turning a low frequency current on the electromagnet A and this saturated period is detected from the level of low frequency voltage induced on the coil 5 which is perpendicular to the face of the material to be inspected and is wound round to the vertical direction of the core 4. Also, an eddy current is generated on the face of the material to be inspected by turning a high frequency current on a high frequency exciting coil 6 wound on the core 4 in parallel to the face of the material to be inspected and variation of magnetic field parallel to the face of the material to be inspected is detected by a defect detecting coil 7 among the variations of magnetic field by the defect. Moreover, detected signal during the saturated period of magnetism is extracted by a logic 13 of the detected signal.
JP10845680A 1980-08-07 1980-08-07 Method and apparatus for electromagnetic flaw inspection Pending JPS5733350A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10845680A JPS5733350A (en) 1980-08-07 1980-08-07 Method and apparatus for electromagnetic flaw inspection

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10845680A JPS5733350A (en) 1980-08-07 1980-08-07 Method and apparatus for electromagnetic flaw inspection

Publications (1)

Publication Number Publication Date
JPS5733350A true JPS5733350A (en) 1982-02-23

Family

ID=14485225

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10845680A Pending JPS5733350A (en) 1980-08-07 1980-08-07 Method and apparatus for electromagnetic flaw inspection

Country Status (1)

Country Link
JP (1) JPS5733350A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60235052A (en) * 1984-05-07 1985-11-21 Sumitomo Metal Ind Ltd Follow-up guide mechanism of eddy current flaw detection apparatus
WO2002016184A1 (en) * 2000-08-25 2002-02-28 Em-Tech Llc Detection of anomalies on railroad tracks

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60235052A (en) * 1984-05-07 1985-11-21 Sumitomo Metal Ind Ltd Follow-up guide mechanism of eddy current flaw detection apparatus
WO2002016184A1 (en) * 2000-08-25 2002-02-28 Em-Tech Llc Detection of anomalies on railroad tracks

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