JPS5725720A - Glitch detecting circuit - Google Patents

Glitch detecting circuit

Info

Publication number
JPS5725720A
JPS5725720A JP8486081A JP8486081A JPS5725720A JP S5725720 A JPS5725720 A JP S5725720A JP 8486081 A JP8486081 A JP 8486081A JP 8486081 A JP8486081 A JP 8486081A JP S5725720 A JPS5725720 A JP S5725720A
Authority
JP
Japan
Prior art keywords
detecting circuit
glitch detecting
glitch
circuit
detecting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP8486081A
Other languages
English (en)
Other versions
JPH0129093B2 (ja
Inventor
Aran Teiraa Kiisu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tektronix Inc
Original Assignee
Tektronix Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tektronix Inc filed Critical Tektronix Inc
Publication of JPS5725720A publication Critical patent/JPS5725720A/ja
Publication of JPH0129093B2 publication Critical patent/JPH0129093B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K5/125—Discriminating pulses
    • H03K5/1252—Suppression or limitation of noise or interference
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3177—Testing of logic operation, e.g. by logic analysers
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/25—Testing of logic operation, e.g. by logic analysers

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Nonlinear Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Manipulation Of Pulses (AREA)
JP8486081A 1980-06-02 1981-06-02 Glitch detecting circuit Granted JPS5725720A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/155,363 US4353032A (en) 1980-06-02 1980-06-02 Glitch detector

Publications (2)

Publication Number Publication Date
JPS5725720A true JPS5725720A (en) 1982-02-10
JPH0129093B2 JPH0129093B2 (ja) 1989-06-07

Family

ID=22555146

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8486081A Granted JPS5725720A (en) 1980-06-02 1981-06-02 Glitch detecting circuit

Country Status (2)

Country Link
US (1) US4353032A (ja)
JP (1) JPS5725720A (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN117033110A (zh) * 2023-10-09 2023-11-10 深圳市纽创信安科技开发有限公司 时钟毛刺串生成方法、系统及设备

Families Citing this family (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58106464A (ja) * 1981-12-21 1983-06-24 Advantest Corp グリツチ検出測定器
JPS62151053A (ja) * 1985-12-25 1987-07-06 Iwatsu Electric Co Ltd ノイズ除去回路
US4750215A (en) * 1986-06-24 1988-06-07 Cincinnati Microwave, Inc. Police radar signal detection circuitry for a police radar warning receiver
US5006777A (en) * 1987-04-27 1991-04-09 Westinghouse Electric Corp. AC input system for computer-based control system
US4742248A (en) * 1987-06-25 1988-05-03 Detector Electronics Corporation Random signal isolation circuit
US4857760A (en) * 1988-02-10 1989-08-15 Tektronix, Inc. Bipolar glitch detector circuit
US5214784A (en) * 1988-11-28 1993-05-25 Tektronix, Inc. Sequence of events detector for serial digital data which selectively outputs match signal in the series which defines detected sequence
US5023892A (en) * 1990-04-06 1991-06-11 Printer Systems Corporation System for detecting and correcting signal distortion
JPH04280507A (ja) * 1991-03-08 1992-10-06 Fujitsu Ltd ディジタルノイズ消去方式
US5113098A (en) * 1991-03-29 1992-05-12 Advanced Micro Devices, Inc. Glitch remover circuit for transmission links
US5265038A (en) * 1991-04-03 1993-11-23 Zilog, Inc. Computer system peripheral connection pulse filtering technique and circuit
US5146111A (en) * 1991-04-10 1992-09-08 International Business Machines Corporation Glitch-proof powered-down on chip receiver with non-overlapping outputs
US5185537A (en) * 1992-01-30 1993-02-09 Digital Equipment Corporation Gate efficient digital glitch filter for multiple input applications
US5347540A (en) * 1992-07-08 1994-09-13 Tektronix, Inc. Dynamic storage allocation in a logic analyzer
US5386159A (en) * 1993-06-30 1995-01-31 Harris Corporation Glitch suppressor circuit and method
US5446650A (en) * 1993-10-12 1995-08-29 Tektronix, Inc. Logic signal extraction
US5526286A (en) * 1994-02-16 1996-06-11 Tektronix, Inc. Oversampled logic analyzer
IL121521A (en) 1997-08-11 2003-04-10 Nds Ltd Television signal glitch detector
US6055587A (en) * 1998-03-27 2000-04-25 Adaptec, Inc, Integrated circuit SCSI I/O cell having signal assertion edge triggered timed glitch filter that defines a strobe masking period to protect the contents of data latches
GB2362473B (en) * 2000-05-18 2002-08-21 3Com Corp On-chip detector of clock glitches
WO2003015276A2 (en) * 2001-08-10 2003-02-20 Shakti Systems, Inc. Logic state transition sensor circuit
US7680231B2 (en) * 2006-02-08 2010-03-16 Freescale Semiconductor, Inc. Adaptive variable length pulse synchronizer
DE102006036348A1 (de) * 2006-08-03 2008-02-07 Infineon Technologies Ag Schaltungsanordnung mit Filtern
CN102931944B (zh) * 2011-08-12 2016-09-07 飞思卡尔半导体公司 数字毛刺滤波器
IN2014CH00439A (ja) * 2014-01-30 2015-08-07 Mentor Graphics Corp
US10439639B2 (en) * 2016-12-28 2019-10-08 Intel Corporation Seemingly monolithic interface between separate integrated circuit die
CN109039307B (zh) * 2018-08-30 2022-07-05 华润微集成电路(无锡)有限公司 双沿防抖电路结构
EP3929601B1 (en) * 2020-04-01 2023-05-03 Shenzhen Goodix Technology Co., Ltd. Voltage attack detection circuit and chip
US11885832B2 (en) 2020-10-12 2024-01-30 Rohde & Schwarz Gmbh & Co. Kg Signal analyzer
CN113740345B (zh) * 2021-08-27 2024-03-22 电子科技大学(深圳)高等研究院 一种高速采样速率下的毛刺检测方法及系统

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4107651A (en) * 1976-11-08 1978-08-15 Hewlett-Packard Company Glitch detector

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3555434A (en) * 1968-06-03 1971-01-12 Atomic Energy Commission System for the suppression of transient noise pulses
US3727142A (en) * 1968-12-02 1973-04-10 Us Navy Pulse stream noise discriminator
US3821563A (en) * 1973-06-18 1974-06-28 Us Navy Asynchronous band pass pulse width filter
US3958133A (en) * 1975-03-03 1976-05-18 United Technologies Corporation Digital noise discriminator
US4070631A (en) * 1975-12-17 1978-01-24 Motorola Inc. Digital noise blanking circuit
US4105980A (en) * 1977-06-27 1978-08-08 International Business Machines Corporation Glitch filter circuit

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4107651A (en) * 1976-11-08 1978-08-15 Hewlett-Packard Company Glitch detector

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN117033110A (zh) * 2023-10-09 2023-11-10 深圳市纽创信安科技开发有限公司 时钟毛刺串生成方法、系统及设备

Also Published As

Publication number Publication date
JPH0129093B2 (ja) 1989-06-07
US4353032A (en) 1982-10-05

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