JPS57207873A - Testing device - Google Patents

Testing device

Info

Publication number
JPS57207873A
JPS57207873A JP9318981A JP9318981A JPS57207873A JP S57207873 A JPS57207873 A JP S57207873A JP 9318981 A JP9318981 A JP 9318981A JP 9318981 A JP9318981 A JP 9318981A JP S57207873 A JPS57207873 A JP S57207873A
Authority
JP
Japan
Prior art keywords
phase
counter
frequency
pulse
counting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9318981A
Other languages
Japanese (ja)
Inventor
Eisuke Ono
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP9318981A priority Critical patent/JPS57207873A/en
Publication of JPS57207873A publication Critical patent/JPS57207873A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836Fault-finding or characterising
    • G01R31/2839Fault-finding or characterising using signal generators, power supplies or circuit analysers
    • G01R31/2841Signal generators

Abstract

PURPOSE:To set a phase angle finely and with high accuracy, by constituting so that frequency and a phase difference of 2 signals can be digitally set, in a testing device for measuring an operation time characteristic of an electric apparatus. CONSTITUTION:An output signal of prescribed frequency f0 of a frequency setting part 1 is applied to a phase reference pulse generating part 3 and a reference frequency pulse generating part 4. A counter 6 starts to count by an output pulse f1 of the generating part 4, and when reaching a counting value n1, a zero detecting circuit 8 detects it, and applies an output signal to a phase control part 5. Therefore, the control part is initialized, and after that, counting of an output pulse f2 of the generating part 3, and when it reaches n2X(a phase set value of a phase setting part 2), a reset pulse being an output signal is send to a counter 7. As a result, the counter 7 is initialized, and counting is started by the output pulse f1 of the generating part 4. Therefore, this counter 7 executes counting, being behind the counter 6. Accordingly, when the most significant bits of the counters 6, 7 are fetched as signal outputs, an output having frequency f0 and a phase difference being equal to the phase set value of the phase setting part 2 is obtained.
JP9318981A 1981-06-17 1981-06-17 Testing device Pending JPS57207873A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9318981A JPS57207873A (en) 1981-06-17 1981-06-17 Testing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9318981A JPS57207873A (en) 1981-06-17 1981-06-17 Testing device

Publications (1)

Publication Number Publication Date
JPS57207873A true JPS57207873A (en) 1982-12-20

Family

ID=14075626

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9318981A Pending JPS57207873A (en) 1981-06-17 1981-06-17 Testing device

Country Status (1)

Country Link
JP (1) JPS57207873A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59166876A (en) * 1983-03-14 1984-09-20 Toshiba Corp Testing device
DE10035967A1 (en) * 2000-07-24 2001-11-08 Siemens Ag Method and device for determining phase difference between output signals from an opto-mechanical transmitting device sets counter devices going through trigger events from first and second signals

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59166876A (en) * 1983-03-14 1984-09-20 Toshiba Corp Testing device
DE10035967A1 (en) * 2000-07-24 2001-11-08 Siemens Ag Method and device for determining phase difference between output signals from an opto-mechanical transmitting device sets counter devices going through trigger events from first and second signals

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