JPS57207858A - Hot flaw detecting method of metallic material - Google Patents

Hot flaw detecting method of metallic material

Info

Publication number
JPS57207858A
JPS57207858A JP56092224A JP9222481A JPS57207858A JP S57207858 A JPS57207858 A JP S57207858A JP 56092224 A JP56092224 A JP 56092224A JP 9222481 A JP9222481 A JP 9222481A JP S57207858 A JPS57207858 A JP S57207858A
Authority
JP
Japan
Prior art keywords
signal
temperature
detecting
flaw
coil
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56092224A
Other languages
Japanese (ja)
Other versions
JPS6314907B2 (en
Inventor
Takao Sugimoto
Seiichi Watanabe
Yukiyoshi Kato
Hisanori Shiraishi
Toshiyuki Koike
Masaaki Nakajima
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Nippon Steel Corp
Original Assignee
Hitachi Ltd
Nippon Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd, Nippon Steel Corp filed Critical Hitachi Ltd
Priority to JP56092224A priority Critical patent/JPS57207858A/en
Publication of JPS57207858A publication Critical patent/JPS57207858A/en
Publication of JPS6314907B2 publication Critical patent/JPS6314907B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9046—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents by analysing electrical signals

Abstract

PURPOSE:To stably detect a flaw of a high temperature metallic material, by phase-detecting a flaw detecting signal with a detecting coil to a resistance portion and a reactance portion, and after that, executing each signal temperature compensation to said each signal by each temperature compensating signal. CONSTITUTION:The distribution of an eddy current generated on the surface layer part of a slab 100 by an AC magnetic field formed by an energizing coil 1 is detected by a detecting coil 2, the eddy current is varied by whether a flaw exists or not on the surface layer part, and an output signal SO of the coil is varied. A temperature detector 3 outputs a temperature detecting signal T corresponding to a temperature of the slab 100. The signal SO detected by the detecting coil 2 is resolved to a resistance portion RO and a reactance portion XO in phase- detecting circuits 41, 42. On the other hand, the temperature signal T is converted to a temperature compensating signal R2 against the resistance portion and a temperature compensating signal R2 against the reactance portion and a temperature compensating signal X2 against the reactance portion in function generators 51, 52. The signals R0, X0, and the signals R2, X2 are operated by adding circuits 61, 62, respectively, and a compensated signal, that is to say, a flaw detecting signal which has removed a portion influenced by a temperature is obtained, and this flaw detecting signal is sent to a succeeding signal processing part. By such a temperature compeansation, flaw detection of a high temperature metallic material is executed stably.
JP56092224A 1981-06-17 1981-06-17 Hot flaw detecting method of metallic material Granted JPS57207858A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56092224A JPS57207858A (en) 1981-06-17 1981-06-17 Hot flaw detecting method of metallic material

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56092224A JPS57207858A (en) 1981-06-17 1981-06-17 Hot flaw detecting method of metallic material

Publications (2)

Publication Number Publication Date
JPS57207858A true JPS57207858A (en) 1982-12-20
JPS6314907B2 JPS6314907B2 (en) 1988-04-02

Family

ID=14048463

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56092224A Granted JPS57207858A (en) 1981-06-17 1981-06-17 Hot flaw detecting method of metallic material

Country Status (1)

Country Link
JP (1) JPS57207858A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2004005912A3 (en) * 2002-07-02 2004-05-13 Rinas Geraetetechnik Gmbh Method for recognizing and locating material flaws with adjustment of measuring and exciter coils
JP2016075484A (en) * 2014-10-02 2016-05-12 アンリツインフィビス株式会社 Metal detector
JP2021043059A (en) * 2019-09-11 2021-03-18 株式会社テイエルブイ probe

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52104286A (en) * 1976-02-27 1977-09-01 Mitsubishi Heavy Ind Ltd Eddy current inspection method

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52104286A (en) * 1976-02-27 1977-09-01 Mitsubishi Heavy Ind Ltd Eddy current inspection method

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2004005912A3 (en) * 2002-07-02 2004-05-13 Rinas Geraetetechnik Gmbh Method for recognizing and locating material flaws with adjustment of measuring and exciter coils
JP2016075484A (en) * 2014-10-02 2016-05-12 アンリツインフィビス株式会社 Metal detector
JP2021043059A (en) * 2019-09-11 2021-03-18 株式会社テイエルブイ probe

Also Published As

Publication number Publication date
JPS6314907B2 (en) 1988-04-02

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