JPS57201833A - Measuring method for f number of lens - Google Patents
Measuring method for f number of lensInfo
- Publication number
- JPS57201833A JPS57201833A JP1453982A JP1453982A JPS57201833A JP S57201833 A JPS57201833 A JP S57201833A JP 1453982 A JP1453982 A JP 1453982A JP 1453982 A JP1453982 A JP 1453982A JP S57201833 A JPS57201833 A JP S57201833A
- Authority
- JP
- Japan
- Prior art keywords
- lens
- level
- pupil
- equivalent diameters
- pinholes
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0228—Testing optical properties by measuring refractive power
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
Abstract
PURPOSE:To obtain an accurate pupil area independently of the variance of the light quantity level, by using light sources different in diameter and performing the measurement twice with different slice levels of a television signal to correct inclinations of luminance level curves mutually. CONSTITUTION:Pinholes P1 and P2 having radiuses r1 and r2 respectively are compatible with each other. The light from the pinhole placed in the focus position of a lens 1 to be measured projects the picture of a stop 2 of the lens 2 onto a screen 3. The projected pattern has the luminance level adjusted by an ND filter 4 and a transparent glass 6 and is projected onto the surface of a vidicon 9 by a taking lens 8. This projected pattern is swept by scanning lines to change the slice level for obtaining an electric signal. Pinholes are exchanged to obtain respective equivalent diameters of the pupil image for successive combinations of level change, and a true equivalent diameter of the pupil image is operated on a basis of the proportional relation between equivalent diameters of the pupil picture and obtained equivalent diameters, thus obtaining the F number of the lens.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1453982A JPS57201833A (en) | 1982-02-01 | 1982-02-01 | Measuring method for f number of lens |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1453982A JPS57201833A (en) | 1982-02-01 | 1982-02-01 | Measuring method for f number of lens |
Related Parent Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP3711074A Division JPS5733534B2 (en) | 1974-04-02 | 1974-04-02 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS57201833A true JPS57201833A (en) | 1982-12-10 |
JPS644137B2 JPS644137B2 (en) | 1989-01-24 |
Family
ID=11863951
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1453982A Granted JPS57201833A (en) | 1982-02-01 | 1982-02-01 | Measuring method for f number of lens |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57201833A (en) |
-
1982
- 1982-02-01 JP JP1453982A patent/JPS57201833A/en active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS644137B2 (en) | 1989-01-24 |
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