JPS57190276A - Circuit testing system - Google Patents

Circuit testing system

Info

Publication number
JPS57190276A
JPS57190276A JP56074964A JP7496481A JPS57190276A JP S57190276 A JPS57190276 A JP S57190276A JP 56074964 A JP56074964 A JP 56074964A JP 7496481 A JP7496481 A JP 7496481A JP S57190276 A JPS57190276 A JP S57190276A
Authority
JP
Japan
Prior art keywords
power source
voltage
source line
malfunctioning
controlling
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56074964A
Other languages
Japanese (ja)
Other versions
JPH0210390B2 (en
Inventor
Takayoshi Ishii
Ryoichi Kurihara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP56074964A priority Critical patent/JPS57190276A/en
Publication of JPS57190276A publication Critical patent/JPS57190276A/en
Publication of JPH0210390B2 publication Critical patent/JPH0210390B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/40—Testing power supplies

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

PURPOSE:To enable quantitative detection of malfunctioning due to changes in the voltage of power source line by controlling input signals at a fixed time relationship corresponding to the control of the power source line. CONSTITUTION:Input signal 31 are generated in a phase relationship of t1 with respect to power source signal 23. Values t1 and DELTAt are subdivided to operate memory circuits 1 requentially thereby enabling accurate capture of a malfunctioning area T from the time at which the voltage of a power source line 141 starts to change. In addition, the signals are provided with a function of controlling the amplitude range of the power source voltage. This permits quantitative capture of a malfunctioning area T varying following the amplitude of noise voltage.
JP56074964A 1981-05-20 1981-05-20 Circuit testing system Granted JPS57190276A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56074964A JPS57190276A (en) 1981-05-20 1981-05-20 Circuit testing system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56074964A JPS57190276A (en) 1981-05-20 1981-05-20 Circuit testing system

Publications (2)

Publication Number Publication Date
JPS57190276A true JPS57190276A (en) 1982-11-22
JPH0210390B2 JPH0210390B2 (en) 1990-03-07

Family

ID=13562490

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56074964A Granted JPS57190276A (en) 1981-05-20 1981-05-20 Circuit testing system

Country Status (1)

Country Link
JP (1) JPS57190276A (en)

Also Published As

Publication number Publication date
JPH0210390B2 (en) 1990-03-07

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