JPS57190276A - Circuit testing system - Google Patents
Circuit testing systemInfo
- Publication number
- JPS57190276A JPS57190276A JP56074964A JP7496481A JPS57190276A JP S57190276 A JPS57190276 A JP S57190276A JP 56074964 A JP56074964 A JP 56074964A JP 7496481 A JP7496481 A JP 7496481A JP S57190276 A JPS57190276 A JP S57190276A
- Authority
- JP
- Japan
- Prior art keywords
- power source
- voltage
- source line
- malfunctioning
- controlling
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/40—Testing power supplies
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
PURPOSE:To enable quantitative detection of malfunctioning due to changes in the voltage of power source line by controlling input signals at a fixed time relationship corresponding to the control of the power source line. CONSTITUTION:Input signal 31 are generated in a phase relationship of t1 with respect to power source signal 23. Values t1 and DELTAt are subdivided to operate memory circuits 1 requentially thereby enabling accurate capture of a malfunctioning area T from the time at which the voltage of a power source line 141 starts to change. In addition, the signals are provided with a function of controlling the amplitude range of the power source voltage. This permits quantitative capture of a malfunctioning area T varying following the amplitude of noise voltage.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56074964A JPS57190276A (en) | 1981-05-20 | 1981-05-20 | Circuit testing system |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56074964A JPS57190276A (en) | 1981-05-20 | 1981-05-20 | Circuit testing system |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS57190276A true JPS57190276A (en) | 1982-11-22 |
JPH0210390B2 JPH0210390B2 (en) | 1990-03-07 |
Family
ID=13562490
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP56074964A Granted JPS57190276A (en) | 1981-05-20 | 1981-05-20 | Circuit testing system |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57190276A (en) |
-
1981
- 1981-05-20 JP JP56074964A patent/JPS57190276A/en active Granted
Also Published As
Publication number | Publication date |
---|---|
JPH0210390B2 (en) | 1990-03-07 |
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