JPS57179656A - Eddy current test method - Google Patents
Eddy current test methodInfo
- Publication number
- JPS57179656A JPS57179656A JP6472881A JP6472881A JPS57179656A JP S57179656 A JPS57179656 A JP S57179656A JP 6472881 A JP6472881 A JP 6472881A JP 6472881 A JP6472881 A JP 6472881A JP S57179656 A JPS57179656 A JP S57179656A
- Authority
- JP
- Japan
- Prior art keywords
- patterns
- flaws
- frequency
- absence
- flaw
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
- G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
- G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
- G01N27/9046—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents by analysing electrical signals
Abstract
PURPOSE:To decide the presence or absence of a flaw easily and correctly by a method wherein patterns of amplitude and phase based on the change in impedance being caused when a part having no flaw is detected are compared with patterns obtained from a part having flaws. CONSTITUTION:A detecting pickup 7 is set beforehand near a no-flaw part in a prescribed sample, and a frequency determined by a frequency scanner 2 is scanned automatically to drive an eddy current test equipment 5. The pickup 7 detects impedance made with the sample for each frequency, the change in impedance thus obtained is analyzed by a frequency analyzer 3, and patterns of amplitude and phase informations are stored in a recognition unit 1. These patterns are compared with patterns obtained when a member to be inspected is detected for its flaws, the presence or absence of flaws is determined through the comparison, and thus the presence or absence of flaws can be determined easily and correctly without scanning the detecting pickup.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6472881A JPS57179656A (en) | 1981-04-28 | 1981-04-28 | Eddy current test method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6472881A JPS57179656A (en) | 1981-04-28 | 1981-04-28 | Eddy current test method |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS57179656A true JPS57179656A (en) | 1982-11-05 |
Family
ID=13266496
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP6472881A Pending JPS57179656A (en) | 1981-04-28 | 1981-04-28 | Eddy current test method |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57179656A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63199061U (en) * | 1987-06-12 | 1988-12-21 | ||
EP0296417A2 (en) * | 1987-06-23 | 1988-12-28 | Institut Dr. Friedrich Förster Prüfgerätebau GmbH & Co. KG | Method for testing an object |
GB2361065A (en) * | 2000-04-05 | 2001-10-10 | Andrew Michael Pratt | Flaw detecting probe and method |
-
1981
- 1981-04-28 JP JP6472881A patent/JPS57179656A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63199061U (en) * | 1987-06-12 | 1988-12-21 | ||
EP0296417A2 (en) * | 1987-06-23 | 1988-12-28 | Institut Dr. Friedrich Förster Prüfgerätebau GmbH & Co. KG | Method for testing an object |
GB2361065A (en) * | 2000-04-05 | 2001-10-10 | Andrew Michael Pratt | Flaw detecting probe and method |
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