JPS57175965A - Test signal generating circuit - Google Patents

Test signal generating circuit

Info

Publication number
JPS57175965A
JPS57175965A JP6179481A JP6179481A JPS57175965A JP S57175965 A JPS57175965 A JP S57175965A JP 6179481 A JP6179481 A JP 6179481A JP 6179481 A JP6179481 A JP 6179481A JP S57175965 A JPS57175965 A JP S57175965A
Authority
JP
Japan
Prior art keywords
memory
thinning
frequency
latch circuit
points
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP6179481A
Other languages
English (en)
Other versions
JPH0416751B2 (ja
Inventor
Hisayoshi Ishimatsu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP6179481A priority Critical patent/JPS57175965A/ja
Publication of JPS57175965A publication Critical patent/JPS57175965A/ja
Publication of JPH0416751B2 publication Critical patent/JPH0416751B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Electrophonic Musical Instruments (AREA)
JP6179481A 1981-04-23 1981-04-23 Test signal generating circuit Granted JPS57175965A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6179481A JPS57175965A (en) 1981-04-23 1981-04-23 Test signal generating circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6179481A JPS57175965A (en) 1981-04-23 1981-04-23 Test signal generating circuit

Publications (2)

Publication Number Publication Date
JPS57175965A true JPS57175965A (en) 1982-10-29
JPH0416751B2 JPH0416751B2 (ja) 1992-03-25

Family

ID=13181354

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6179481A Granted JPS57175965A (en) 1981-04-23 1981-04-23 Test signal generating circuit

Country Status (1)

Country Link
JP (1) JPS57175965A (ja)

Also Published As

Publication number Publication date
JPH0416751B2 (ja) 1992-03-25

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