JPS57165771A - Determination of probe sequence for logic analyzer - Google Patents

Determination of probe sequence for logic analyzer

Info

Publication number
JPS57165771A
JPS57165771A JP56048314A JP4831481A JPS57165771A JP S57165771 A JPS57165771 A JP S57165771A JP 56048314 A JP56048314 A JP 56048314A JP 4831481 A JP4831481 A JP 4831481A JP S57165771 A JPS57165771 A JP S57165771A
Authority
JP
Japan
Prior art keywords
determination
probe sequence
logic analyzer
analyzer
logic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56048314A
Other languages
English (en)
Japanese (ja)
Other versions
JPH045947B2 (enrdf_load_stackoverflow
Inventor
Hansu Hooren Gaado
Robaato Baamukisuto Suteiibun
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tektronix Inc
Original Assignee
Tektronix Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tektronix Inc filed Critical Tektronix Inc
Priority to JP56048314A priority Critical patent/JPS57165771A/ja
Priority to DE19823212048 priority patent/DE3212048A1/de
Publication of JPS57165771A publication Critical patent/JPS57165771A/ja
Publication of JPH045947B2 publication Critical patent/JPH045947B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3177—Testing of logic operation, e.g. by logic analysers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/58—Testing of lines, cables or conductors
    • G01R31/60—Identification of wires in a multicore cable
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/25—Testing of logic operation, e.g. by logic analysers
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/30—Monitoring
    • G06F11/32—Monitoring with visual or acoustical indication of the functioning of the machine
    • G06F11/321—Display for diagnostics, e.g. diagnostic result display, self-test user interface
    • G06F11/322—Display of waveforms, e.g. of logic analysers

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Human Computer Interaction (AREA)
  • Computer Hardware Design (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Tests Of Electronic Circuits (AREA)
JP56048314A 1981-03-31 1981-03-31 Determination of probe sequence for logic analyzer Granted JPS57165771A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP56048314A JPS57165771A (en) 1981-03-31 1981-03-31 Determination of probe sequence for logic analyzer
DE19823212048 DE3212048A1 (de) 1981-03-31 1982-03-31 Verfahren zum erstellen einer korrekten ordnung in der anzeige der abtastkanaele eines logik-analysators und vorrichtung zur durchfuehrung des verfahrens

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56048314A JPS57165771A (en) 1981-03-31 1981-03-31 Determination of probe sequence for logic analyzer

Publications (2)

Publication Number Publication Date
JPS57165771A true JPS57165771A (en) 1982-10-12
JPH045947B2 JPH045947B2 (enrdf_load_stackoverflow) 1992-02-04

Family

ID=12799945

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56048314A Granted JPS57165771A (en) 1981-03-31 1981-03-31 Determination of probe sequence for logic analyzer

Country Status (2)

Country Link
JP (1) JPS57165771A (enrdf_load_stackoverflow)
DE (1) DE3212048A1 (enrdf_load_stackoverflow)

Also Published As

Publication number Publication date
DE3212048C2 (enrdf_load_stackoverflow) 1988-03-03
DE3212048A1 (de) 1982-12-16
JPH045947B2 (enrdf_load_stackoverflow) 1992-02-04

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