JPS57164494A - Semiconductor device - Google Patents

Semiconductor device

Info

Publication number
JPS57164494A
JPS57164494A JP4975581A JP4975581A JPS57164494A JP S57164494 A JPS57164494 A JP S57164494A JP 4975581 A JP4975581 A JP 4975581A JP 4975581 A JP4975581 A JP 4975581A JP S57164494 A JPS57164494 A JP S57164494A
Authority
JP
Japan
Prior art keywords
terminal
resistance
diode
digit
line
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP4975581A
Other languages
Japanese (ja)
Other versions
JPS6238800B2 (en
Inventor
Kazuyoshi Tsuyama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP4975581A priority Critical patent/JPS57164494A/en
Publication of JPS57164494A publication Critical patent/JPS57164494A/en
Publication of JPS6238800B2 publication Critical patent/JPS6238800B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C17/00Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards
    • G11C17/06Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards using diode elements

Abstract

PURPOSE:To easily detect defects in pressure resistance of partial cells on a array, by connecting one end of each diode to digit lines, respectively, and by connecting in common the other end of each diode to the outside through a series body consisting of a Zener diode and a resistance. CONSTITUTION:A circuit block A in which each of collectors of diodes 42-45 and 46-49 betwen base and collector 42-45 and 46-49 having a common base is connected to each digit line through a resistance 40 and a Zener diode 41, is installed to a row line selecting input 25. Through this block A, a potential difference VS based on an impedance of a circuit to a row line which is selected at a low level by cells at intersecting points of row lines and digit lines on the first eight-digit line looking from a input terminal 25 and a driving circit 17, is found. At the actual detecting time, voltage drops are monitored at the open side of a precision resistance element RS, by connecting the element RS to the outside of the terminal 25, by impressing a constant voltage which is lower than VS upon the open terminal of the element RS, and by making binary inputs on input terminals 23 and 24. That is to say, when an abnormalty in pressure resistance occurs in a cell connected to a selected row line, an electric current is detected at the terminal 25.
JP4975581A 1981-04-02 1981-04-02 Semiconductor device Granted JPS57164494A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4975581A JPS57164494A (en) 1981-04-02 1981-04-02 Semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4975581A JPS57164494A (en) 1981-04-02 1981-04-02 Semiconductor device

Publications (2)

Publication Number Publication Date
JPS57164494A true JPS57164494A (en) 1982-10-09
JPS6238800B2 JPS6238800B2 (en) 1987-08-19

Family

ID=12839995

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4975581A Granted JPS57164494A (en) 1981-04-02 1981-04-02 Semiconductor device

Country Status (1)

Country Link
JP (1) JPS57164494A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4730273A (en) * 1986-04-03 1988-03-08 Motorola, Inc. On-chip programmability verification circuit for programmable read only memory having lateral fuses
US5412614A (en) * 1991-08-16 1995-05-02 U.S. Philips Corporation Electronic matrix array devices and systems incorporating such devices

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4730273A (en) * 1986-04-03 1988-03-08 Motorola, Inc. On-chip programmability verification circuit for programmable read only memory having lateral fuses
US5412614A (en) * 1991-08-16 1995-05-02 U.S. Philips Corporation Electronic matrix array devices and systems incorporating such devices

Also Published As

Publication number Publication date
JPS6238800B2 (en) 1987-08-19

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