JPS57163805A - Method and device for inspecting thickness of tablet - Google Patents

Method and device for inspecting thickness of tablet

Info

Publication number
JPS57163805A
JPS57163805A JP56048478A JP4847881A JPS57163805A JP S57163805 A JPS57163805 A JP S57163805A JP 56048478 A JP56048478 A JP 56048478A JP 4847881 A JP4847881 A JP 4847881A JP S57163805 A JPS57163805 A JP S57163805A
Authority
JP
Japan
Prior art keywords
circuit
terminal
signal
tablet
delay
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56048478A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6246803B2 (enrdf_load_stackoverflow
Inventor
Masahiro Kishi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fuji Electric Co Ltd
Original Assignee
Fuji Electric Co Ltd
Fuji Electric Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Electric Co Ltd, Fuji Electric Manufacturing Co Ltd filed Critical Fuji Electric Co Ltd
Priority to JP56048478A priority Critical patent/JPS57163805A/ja
Publication of JPS57163805A publication Critical patent/JPS57163805A/ja
Publication of JPS6246803B2 publication Critical patent/JPS6246803B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V20/00—Scenes; Scene-specific elements
    • G06V20/60—Type of objects
    • G06V20/66—Trinkets, e.g. shirt buttons or jewellery items

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Multimedia (AREA)
  • Theoretical Computer Science (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP56048478A 1981-04-02 1981-04-02 Method and device for inspecting thickness of tablet Granted JPS57163805A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56048478A JPS57163805A (en) 1981-04-02 1981-04-02 Method and device for inspecting thickness of tablet

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56048478A JPS57163805A (en) 1981-04-02 1981-04-02 Method and device for inspecting thickness of tablet

Publications (2)

Publication Number Publication Date
JPS57163805A true JPS57163805A (en) 1982-10-08
JPS6246803B2 JPS6246803B2 (enrdf_load_stackoverflow) 1987-10-05

Family

ID=12804486

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56048478A Granted JPS57163805A (en) 1981-04-02 1981-04-02 Method and device for inspecting thickness of tablet

Country Status (1)

Country Link
JP (1) JPS57163805A (enrdf_load_stackoverflow)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60114748A (ja) * 1983-11-26 1985-06-21 Takeda Chem Ind Ltd 固形製剤の表面異物のカメラ検査方法およびその装置
JPS62107293A (ja) * 1985-11-01 1987-05-18 Hitachi Ltd 圧縮機の旋回失速防止装置
JPH06288932A (ja) * 1993-04-01 1994-10-18 Kanebo Ltd 検査装置の検知回路

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4990163A (enrdf_load_stackoverflow) * 1972-12-27 1974-08-28
JPS5392160A (en) * 1977-01-25 1978-08-12 Omron Tateisi Electronics Co Method of inspecting article

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4990163A (enrdf_load_stackoverflow) * 1972-12-27 1974-08-28
JPS5392160A (en) * 1977-01-25 1978-08-12 Omron Tateisi Electronics Co Method of inspecting article

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60114748A (ja) * 1983-11-26 1985-06-21 Takeda Chem Ind Ltd 固形製剤の表面異物のカメラ検査方法およびその装置
JPS62107293A (ja) * 1985-11-01 1987-05-18 Hitachi Ltd 圧縮機の旋回失速防止装置
JPH06288932A (ja) * 1993-04-01 1994-10-18 Kanebo Ltd 検査装置の検知回路

Also Published As

Publication number Publication date
JPS6246803B2 (enrdf_load_stackoverflow) 1987-10-05

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