JPS57157145A - X-ray analyzer - Google Patents

X-ray analyzer

Info

Publication number
JPS57157145A
JPS57157145A JP56043738A JP4373881A JPS57157145A JP S57157145 A JPS57157145 A JP S57157145A JP 56043738 A JP56043738 A JP 56043738A JP 4373881 A JP4373881 A JP 4373881A JP S57157145 A JPS57157145 A JP S57157145A
Authority
JP
Japan
Prior art keywords
ray
detector
diffraction
generator
alpha1
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP56043738A
Other languages
Japanese (ja)
Inventor
Yoshiro Matsumoto
Masakatsu Fujino
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Sumitomo Metal Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Metal Industries Ltd filed Critical Sumitomo Metal Industries Ltd
Priority to JP56043738A priority Critical patent/JPS57157145A/en
Publication of JPS57157145A publication Critical patent/JPS57157145A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials

Abstract

PURPOSE:To enable to perform a selective fluorescent X-ray analysis and X-ray diffraction by an on-line, by a method wherein a device is constituted such that an X-ray irradiating direction of an X-ray generator and an X-ray detecting direction of an X-ray detector can be easily changed. CONSTITUTION:After an X-ray generator 1 and an X-ray detector 2 are placed on base seats 11 and 21 so that the X-ray irradiating direction and X-ray detecting direction, respectively, point a measuring point S, a position is set so that an X-ray incident angle alpha2 and an X-ray radiating angle beta2 are set to 60-90 deg. through operation of handles 19 and 29, and a detector 2 detects a fluorescent X-ray strength generated from a film layer PM. In case an alloy at the film layer PM is identified, the position of the X-ray generator 1 is set so that the X-ray incident angle alpha1 is brought into 8-20 deg., and a position of an X-ray detector 2 is set so that an X-ray diffraction angle beta1 becomes equal to alpha1 to detect a diffraction X-ray by means of the detector 2. This permits to perform a flourescnet X-ray analysis and an X-ray diffraction against an object to be measured in a short period of time.
JP56043738A 1981-03-24 1981-03-24 X-ray analyzer Pending JPS57157145A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56043738A JPS57157145A (en) 1981-03-24 1981-03-24 X-ray analyzer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56043738A JPS57157145A (en) 1981-03-24 1981-03-24 X-ray analyzer

Publications (1)

Publication Number Publication Date
JPS57157145A true JPS57157145A (en) 1982-09-28

Family

ID=12672114

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56043738A Pending JPS57157145A (en) 1981-03-24 1981-03-24 X-ray analyzer

Country Status (1)

Country Link
JP (1) JPS57157145A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0108447A2 (en) * 1982-11-04 1984-05-16 North American Philips Corporation Simultaneous collection of diffraction and spectrographic data
WO1986002164A1 (en) * 1984-10-05 1986-04-10 Kawasaki Steel Corporation Method of determining thickness and composition of alloy film

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0108447A2 (en) * 1982-11-04 1984-05-16 North American Philips Corporation Simultaneous collection of diffraction and spectrographic data
WO1986002164A1 (en) * 1984-10-05 1986-04-10 Kawasaki Steel Corporation Method of determining thickness and composition of alloy film
US4764945A (en) * 1984-10-05 1988-08-16 Kawasaki Steel Corp. Method of measuring layer thickness and composition of alloy plating

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