JPS57153464A - Injection type semiconductor integrated logic circuit - Google Patents

Injection type semiconductor integrated logic circuit

Info

Publication number
JPS57153464A
JPS57153464A JP56039236A JP3923681A JPS57153464A JP S57153464 A JPS57153464 A JP S57153464A JP 56039236 A JP56039236 A JP 56039236A JP 3923681 A JP3923681 A JP 3923681A JP S57153464 A JPS57153464 A JP S57153464A
Authority
JP
Japan
Prior art keywords
pad
injection type
current
taken out
high accuracy
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56039236A
Other languages
English (en)
Japanese (ja)
Other versions
JPS626345B2 (enExample
Inventor
Tadashi Ikeda
Seiya Tokumaru
Masanori Nakai
Masaki Ota
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP56039236A priority Critical patent/JPS57153464A/ja
Priority to US06/349,207 priority patent/US4489247A/en
Publication of JPS57153464A publication Critical patent/JPS57153464A/ja
Publication of JPS626345B2 publication Critical patent/JPS626345B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31712—Input or output aspects
    • G01R31/31715—Testing of input or output circuits; test of circuitry between the I/C pins and the functional core, e.g. testing of input or output driver, receiver, buffer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31712—Input or output aspects
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/60—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D10/00 or H10D18/00, e.g. integration of BJTs
    • H10D84/65—Integrated injection logic

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Logic Circuits (AREA)
  • Bipolar Integrated Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
JP56039236A 1981-03-18 1981-03-18 Injection type semiconductor integrated logic circuit Granted JPS57153464A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP56039236A JPS57153464A (en) 1981-03-18 1981-03-18 Injection type semiconductor integrated logic circuit
US06/349,207 US4489247A (en) 1981-03-18 1982-02-17 Integrated injection logic circuit with test pads on injector common line

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56039236A JPS57153464A (en) 1981-03-18 1981-03-18 Injection type semiconductor integrated logic circuit

Publications (2)

Publication Number Publication Date
JPS57153464A true JPS57153464A (en) 1982-09-22
JPS626345B2 JPS626345B2 (enExample) 1987-02-10

Family

ID=12547488

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56039236A Granted JPS57153464A (en) 1981-03-18 1981-03-18 Injection type semiconductor integrated logic circuit

Country Status (2)

Country Link
US (1) US4489247A (enExample)
JP (1) JPS57153464A (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59145565A (ja) * 1983-02-09 1984-08-21 Matsushita Electronics Corp 半導体装置

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4549101A (en) * 1983-12-01 1985-10-22 Motorola, Inc. Circuit for generating test equalization pulse
US5049767A (en) * 1989-05-01 1991-09-17 Honeywell Inc. Shared inverter outputs delay system
IT1285299B1 (it) * 1996-03-06 1998-06-03 Cselt Centro Studi Lab Telecom Sonda per dispositivi attuatori di guasto

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3781683A (en) * 1971-03-30 1973-12-25 Ibm Test circuit configuration for integrated semiconductor circuits and a test system containing said configuration
US3746973A (en) * 1972-05-05 1973-07-17 Ibm Testing of metallization networks on insulative substrates supporting semiconductor chips
US3808475A (en) * 1972-07-10 1974-04-30 Amdahl Corp Lsi chip construction and method
US4178584A (en) * 1978-01-23 1979-12-11 Motorola, Inc. Integrated injection logic digital-to-analog converter employing feedback regulation and method
US4348600A (en) * 1978-02-14 1982-09-07 Motorola, Inc. Controlled current source for I2 L to analog interfaces
US4413271A (en) * 1981-03-30 1983-11-01 Sprague Electric Company Integrated circuit including test portion and method for making

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59145565A (ja) * 1983-02-09 1984-08-21 Matsushita Electronics Corp 半導体装置

Also Published As

Publication number Publication date
JPS626345B2 (enExample) 1987-02-10
US4489247A (en) 1984-12-18

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