JPS57153287A - Measuring method for minute quantity of radiation - Google Patents

Measuring method for minute quantity of radiation

Info

Publication number
JPS57153287A
JPS57153287A JP3984081A JP3984081A JPS57153287A JP S57153287 A JPS57153287 A JP S57153287A JP 3984081 A JP3984081 A JP 3984081A JP 3984081 A JP3984081 A JP 3984081A JP S57153287 A JPS57153287 A JP S57153287A
Authority
JP
Japan
Prior art keywords
radiation
sample
dose
expression
measurement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3984081A
Other languages
Japanese (ja)
Inventor
Megumi Urata
Kunio Kamiya
Masaaki Fujii
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP3984081A priority Critical patent/JPS57153287A/en
Publication of JPS57153287A publication Critical patent/JPS57153287A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16Measuring radiation intensity

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Measurement Of Radiation (AREA)

Abstract

PURPOSE:To measure a minute quantity of radiation under a much fluctuating background with a high precision, by performing the measurement in two positions, where the relative distance between a sample and a detector is different, alternately many times in a short time. CONSTITUTION:A sample 2 is put in a shelter 4 and is set on a sample moving device 8. The measurement for the radiation from the sample is perfomred in two positions, a measure sample position A and a measure sample position B alternately many times for every prescribed time DELTAt. Measured values of the dose of radiation for relative distance L and M (L<M) are obtained as shown in expression (1). In expression (l), (n) is the number of times of measurement. A ratio 1:alpha of the dose of radiation for relative distances L and M which is obtained preliminarily by using a standard radiation source of a large dose of radiation is used to obtain a dose of radiation for the relative distance L as shown in figure (2). In expression (2), K is count efficiency.
JP3984081A 1981-03-18 1981-03-18 Measuring method for minute quantity of radiation Pending JPS57153287A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3984081A JPS57153287A (en) 1981-03-18 1981-03-18 Measuring method for minute quantity of radiation

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3984081A JPS57153287A (en) 1981-03-18 1981-03-18 Measuring method for minute quantity of radiation

Publications (1)

Publication Number Publication Date
JPS57153287A true JPS57153287A (en) 1982-09-21

Family

ID=12564153

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3984081A Pending JPS57153287A (en) 1981-03-18 1981-03-18 Measuring method for minute quantity of radiation

Country Status (1)

Country Link
JP (1) JPS57153287A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62282287A (en) * 1986-05-30 1987-12-08 Shimizu Constr Co Ltd Method and apparatus for measuring radioactivity level under high background
JP2006153551A (en) * 2004-11-26 2006-06-15 Fuji Electric Systems Co Ltd Monitor for product carrying-out
JP2008298574A (en) * 2007-05-31 2008-12-11 Nihon Medi Physics Co Ltd Radiation shield apparatus

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62282287A (en) * 1986-05-30 1987-12-08 Shimizu Constr Co Ltd Method and apparatus for measuring radioactivity level under high background
JP2006153551A (en) * 2004-11-26 2006-06-15 Fuji Electric Systems Co Ltd Monitor for product carrying-out
JP4513529B2 (en) * 2004-11-26 2010-07-28 富士電機システムズ株式会社 Article removal monitor
JP2008298574A (en) * 2007-05-31 2008-12-11 Nihon Medi Physics Co Ltd Radiation shield apparatus

Similar Documents

Publication Publication Date Title
JPS5255578A (en) Analyzing apparatus
JPS51114985A (en) Mothod to analyse urine, etc.
JPS55119021A (en) Method of counting number of times of measurement in measuring instrument
JPS57153287A (en) Measuring method for minute quantity of radiation
JPS5687849A (en) Foreknowing method for remaining life by x-rays
JPS522452A (en) Method and apparatus for measuring plate thickness
JPS5267686A (en) Device for measuring spacial distribution of neutrons
JPS54935A (en) Pattern detector
JPS57204420A (en) Counting scale
JPS5672309A (en) Measuring method of three-dimension measuring device and reference point block for its measurement
JPS5658636A (en) Measuring method for diameter of particle
JPS5358286A (en) Measuring method of grinding characteristics
JPS539566A (en) Shape measurement method of electron beams
JPS52153763A (en) Outside diameter size detector
JPS53128238A (en) Velocity test system
JPS533262A (en) Radiation thickness meter
JPS542180A (en) Measuring apparatus of low concentration gas radiactivity
JPS533884A (en) Stress measuring apparatus x-ray
JPS53109691A (en) Flow cell type analysis method and apparatus liquid for specimen
JPS5328380A (en) Function inspecting method of semiconductor elements
JPS5266455A (en) Radiation thickness gauge
JPS5284762A (en) Detector for measuring transmission characteristics of optical fiber
JPS51146293A (en) Automatic oil component concentration meter
JPS5255582A (en) Detector for concentration radiation
JPS53115494A (en) Fuel particle distribution measurement of nuclear fuel compact