JPS5714703A - Double stage interferometer - Google Patents

Double stage interferometer

Info

Publication number
JPS5714703A
JPS5714703A JP6839681A JP6839681A JPS5714703A JP S5714703 A JPS5714703 A JP S5714703A JP 6839681 A JP6839681 A JP 6839681A JP 6839681 A JP6839681 A JP 6839681A JP S5714703 A JPS5714703 A JP S5714703A
Authority
JP
Japan
Prior art keywords
double stage
stage interferometer
interferometer
double
stage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6839681A
Other languages
English (en)
Inventor
Betsuhishiyutain Kaaruhaintsu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jenoptik AG
Original Assignee
Carl Zeiss Jena GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Carl Zeiss Jena GmbH filed Critical Carl Zeiss Jena GmbH
Publication of JPS5714703A publication Critical patent/JPS5714703A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02049—Interferometers characterised by particular mechanical design details
    • G01B9/02051—Integrated design, e.g. on-chip or monolithic
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/45—Multiple detectors for detecting interferometer signals

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP6839681A 1980-06-30 1981-05-08 Double stage interferometer Pending JPS5714703A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DD80222233A DD158187A3 (de) 1980-06-30 1980-06-30 Zweistufeninterferometer

Publications (1)

Publication Number Publication Date
JPS5714703A true JPS5714703A (en) 1982-01-26

Family

ID=5525028

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6839681A Pending JPS5714703A (en) 1980-06-30 1981-05-08 Double stage interferometer

Country Status (6)

Country Link
JP (1) JPS5714703A (ja)
DD (1) DD158187A3 (ja)
DE (1) DE3112633A1 (ja)
FR (1) FR2485718A1 (ja)
GB (1) GB2079000B (ja)
SU (1) SU1168800A1 (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008251416A (ja) * 2007-03-30 2008-10-16 Saxa Inc 筺体の開閉検知構造

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DD209263A1 (de) * 1982-09-01 1984-04-25 Univ Ernst Moritz Arndt Interferometrische anordnung zur optoelektrischen distanzmessung
EP0611438B1 (en) * 1991-11-08 1996-07-03 British Technology Group Ltd Optical measuring instruments
FR2712691B1 (fr) * 1993-11-19 1995-12-22 Bernard Fondeur Dispositif de mesure par interférométrie laser.
DE19613303C3 (de) * 1996-04-03 2002-07-04 Zeiss Carl Jena Gmbh Verfahren und Einrichtung zur absoluten Distanzmessung

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DD111993A1 (ja) * 1974-05-13 1975-03-12

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008251416A (ja) * 2007-03-30 2008-10-16 Saxa Inc 筺体の開閉検知構造

Also Published As

Publication number Publication date
DE3112633A1 (de) 1982-04-15
FR2485718A1 (fr) 1981-12-31
SU1168800A1 (ru) 1985-07-23
GB2079000B (en) 1984-03-07
FR2485718B1 (ja) 1985-03-29
GB2079000A (en) 1982-01-13
DD158187A3 (de) 1983-01-05

Similar Documents

Publication Publication Date Title
US4529313B1 (en) Ring interferometer
ATA396180A (de) Vorrichtung zum aufbereiten von thermoplastischem kunststoffgut
GB2152207B (en) Optical interferometer
JPS56137996A (en) Note
AU551571B2 (en) Interferometer
CS210481A1 (en) Zarizeni k presazovani embrii hoveziho dobytka
CS876881A1 (en) Projekcni plocha k optickym ucelum
GB8323179D0 (en) Interferometer
JPS55152651A (en) Two stage masterrcylinder
JPS55115584A (en) Escalator
GB2078328B (en) Shims
JPS5714703A (en) Double stage interferometer
CS233181A1 (en) Pomocne zarizeni k upevneni zkusebnich forem
JPS5747697A (en) Note
JPS56136395A (en) Note
JPS572797A (en) Note
GB2076558B (en) Differential delay interferometers
GB8306570D0 (en) Interferometer
GB2087545B (en) Interferometer
JPS56101898A (en) Note
JPS56166098A (en) Note
YU13680A (en) Double mirror
JPS55115582A (en) Escalator
CS199481A1 (en) Zarizeni k mereni hloubky
CS232681A1 (en) Zarizeni k zhotovovani horizontalne rozdelenych bezramovych piskovych forem