JPS57143800A - Storage device - Google Patents

Storage device

Info

Publication number
JPS57143800A
JPS57143800A JP56026817A JP2681781A JPS57143800A JP S57143800 A JPS57143800 A JP S57143800A JP 56026817 A JP56026817 A JP 56026817A JP 2681781 A JP2681781 A JP 2681781A JP S57143800 A JPS57143800 A JP S57143800A
Authority
JP
Japan
Prior art keywords
array
partial write
high speed
write
cycle time
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56026817A
Other languages
Japanese (ja)
Other versions
JPS6235146B2 (en
Inventor
Hidetsune Kurokawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP56026817A priority Critical patent/JPS57143800A/en
Publication of JPS57143800A publication Critical patent/JPS57143800A/en
Publication of JPS6235146B2 publication Critical patent/JPS6235146B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1076—Parity data used in redundant arrays of independent storages, e.g. in RAID systems
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Memory System (AREA)
  • Memory System Of A Hierarchy Structure (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)

Abstract

PURPOSE:To shorter the partial write-in cycle time with a simple constitution, by forming a check bit storage array with a high speed element and completing the operation of array within a delay time of the next operation start at partial write-in. CONSTITUTION:A storage array 101 consists of the 1st storage array 201 for data bit formed with low and high speed elements and the 2nd storage array 301 for check bit, and the operation of the array 301 is started than the array 201 via a control circuit 22. At partial write-in, the operation of the array 301 making error correction via an error detecting circuit 51 and an error correcting circuit 61 is finished within a delay time of start of the next operation of array 301 for the check bit write-in corresponding to the partial write-in bit with a humming generating circuit 41. Thus, the partial write-in cycle time is definitely determined based on the speed of the array 201, and with a simple constitution that the array 301 only is formed with th high speed elements, the partial write- in cycle time can be reduced.
JP56026817A 1981-02-27 1981-02-27 Storage device Granted JPS57143800A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56026817A JPS57143800A (en) 1981-02-27 1981-02-27 Storage device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56026817A JPS57143800A (en) 1981-02-27 1981-02-27 Storage device

Publications (2)

Publication Number Publication Date
JPS57143800A true JPS57143800A (en) 1982-09-06
JPS6235146B2 JPS6235146B2 (en) 1987-07-30

Family

ID=12203825

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56026817A Granted JPS57143800A (en) 1981-02-27 1981-02-27 Storage device

Country Status (1)

Country Link
JP (1) JPS57143800A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5638385A (en) * 1990-04-16 1997-06-10 International Business Machines Corporation Fast check bit write for a semiconductor memory

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EA202192939A1 (en) 2019-04-26 2022-02-15 Дзе Вотер Инк. DETECTION/CHECKING SYSTEM FOR GROUND WATER VEIN AND GROUND WATER IN GROUND WATER VEIN

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5638385A (en) * 1990-04-16 1997-06-10 International Business Machines Corporation Fast check bit write for a semiconductor memory

Also Published As

Publication number Publication date
JPS6235146B2 (en) 1987-07-30

Similar Documents

Publication Publication Date Title
JPS57143800A (en) Storage device
JPS52131082A (en) Sequence controller
JPS5358736A (en) Input/output control system for mos dynamic random access memory
JPS5338373A (en) Ic for watch
JPS5384654A (en) Error correction circuit having test function
JPS52125242A (en) Multiple control memory unit
JPS5286746A (en) Pulse count readout control circuit
JPS56137580A (en) Semiconductor storage device
JPS5293361A (en) Automatic tester
JPS5380279A (en) Time memory circuit of electronic watch
JPS5379329A (en) Test method of memory circuit
JPS5367324A (en) Magnetic bubble cassette memory
JPS56127248A (en) Operation controller
JPS53120346A (en) Correction circuit for double error
JPS5342716A (en) Disk controller
JPS5325321A (en) Reading controller for memory unit
JPS53947A (en) 1 bit error correction circuit by hamming code
JPS52127574A (en) Sequence controller with counter function
JPS5384437A (en) Control system for test pattern generation
JPS56112149A (en) Condensing method for transmission circuit trace information
JPS533134A (en) Timing generation method for memory
JPS52107494A (en) Failed fuel detecting method
JPS5323552A (en) Pulse row detection circuit
JPS5515526A (en) Microprogram control circuit
JPS5352320A (en) Output control circuit