JPS57141568A - Detecting method for deteriorated position of insulation of matrix circuit - Google Patents
Detecting method for deteriorated position of insulation of matrix circuitInfo
- Publication number
- JPS57141568A JPS57141568A JP56027411A JP2741181A JPS57141568A JP S57141568 A JPS57141568 A JP S57141568A JP 56027411 A JP56027411 A JP 56027411A JP 2741181 A JP2741181 A JP 2741181A JP S57141568 A JPS57141568 A JP S57141568A
- Authority
- JP
- Japan
- Prior art keywords
- insulation
- resistance value
- matrix circuit
- deteriorated
- resistance
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/52—Testing for short-circuits, leakage current or ground faults
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Locating Faults (AREA)
Abstract
PURPOSE:To detect a position of short circuited or of deteriorated insulation in a simple and quick way, by measuring the resistance value between Y lead wires which form a matrix circuit at the prescribed intervals and specifying the deteriorated position of insulation from the increment or decrement of the resistance value. CONSTITUTION:For instance, the resistance is measured between terminals II and III of adjacent Y units that form a matrix circuit. Then it is specified that the X lead wire has the deterioration of insulation at point S, etc. and that a short circuit is caused between terminals II and III if the resistance value between the terminalsIand II is lower than the prescribed level. Then a resistance measuring contact is made to touch the area between lead wires (y) of the terminalsIand II with every prescribed interval l to measure the resistance value. Thus intersection S1 is decided for the increment/decrement straight line of resistance value. In such way, position S of short circuit caused by the deterioration of insulation is detected in a simple and quick way.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56027411A JPS57141568A (en) | 1981-02-26 | 1981-02-26 | Detecting method for deteriorated position of insulation of matrix circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56027411A JPS57141568A (en) | 1981-02-26 | 1981-02-26 | Detecting method for deteriorated position of insulation of matrix circuit |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS57141568A true JPS57141568A (en) | 1982-09-01 |
Family
ID=12220336
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP56027411A Pending JPS57141568A (en) | 1981-02-26 | 1981-02-26 | Detecting method for deteriorated position of insulation of matrix circuit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57141568A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6475977A (en) * | 1987-09-18 | 1989-03-22 | Ngk Insulators Ltd | Faulty insulator detector |
-
1981
- 1981-02-26 JP JP56027411A patent/JPS57141568A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6475977A (en) * | 1987-09-18 | 1989-03-22 | Ngk Insulators Ltd | Faulty insulator detector |
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