JPS57141568A - Detecting method for deteriorated position of insulation of matrix circuit - Google Patents

Detecting method for deteriorated position of insulation of matrix circuit

Info

Publication number
JPS57141568A
JPS57141568A JP56027411A JP2741181A JPS57141568A JP S57141568 A JPS57141568 A JP S57141568A JP 56027411 A JP56027411 A JP 56027411A JP 2741181 A JP2741181 A JP 2741181A JP S57141568 A JPS57141568 A JP S57141568A
Authority
JP
Japan
Prior art keywords
insulation
resistance value
matrix circuit
deteriorated
resistance
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP56027411A
Other languages
Japanese (ja)
Inventor
Hiroo Ishihara
Kazufumi Kojima
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP56027411A priority Critical patent/JPS57141568A/en
Publication of JPS57141568A publication Critical patent/JPS57141568A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/52—Testing for short-circuits, leakage current or ground faults

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Locating Faults (AREA)

Abstract

PURPOSE:To detect a position of short circuited or of deteriorated insulation in a simple and quick way, by measuring the resistance value between Y lead wires which form a matrix circuit at the prescribed intervals and specifying the deteriorated position of insulation from the increment or decrement of the resistance value. CONSTITUTION:For instance, the resistance is measured between terminals II and III of adjacent Y units that form a matrix circuit. Then it is specified that the X lead wire has the deterioration of insulation at point S, etc. and that a short circuit is caused between terminals II and III if the resistance value between the terminalsIand II is lower than the prescribed level. Then a resistance measuring contact is made to touch the area between lead wires (y) of the terminalsIand II with every prescribed interval l to measure the resistance value. Thus intersection S1 is decided for the increment/decrement straight line of resistance value. In such way, position S of short circuit caused by the deterioration of insulation is detected in a simple and quick way.
JP56027411A 1981-02-26 1981-02-26 Detecting method for deteriorated position of insulation of matrix circuit Pending JPS57141568A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56027411A JPS57141568A (en) 1981-02-26 1981-02-26 Detecting method for deteriorated position of insulation of matrix circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56027411A JPS57141568A (en) 1981-02-26 1981-02-26 Detecting method for deteriorated position of insulation of matrix circuit

Publications (1)

Publication Number Publication Date
JPS57141568A true JPS57141568A (en) 1982-09-01

Family

ID=12220336

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56027411A Pending JPS57141568A (en) 1981-02-26 1981-02-26 Detecting method for deteriorated position of insulation of matrix circuit

Country Status (1)

Country Link
JP (1) JPS57141568A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6475977A (en) * 1987-09-18 1989-03-22 Ngk Insulators Ltd Faulty insulator detector

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6475977A (en) * 1987-09-18 1989-03-22 Ngk Insulators Ltd Faulty insulator detector

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