JPS57135329A - Polarization analyzing device - Google Patents

Polarization analyzing device

Info

Publication number
JPS57135329A
JPS57135329A JP2017781A JP2017781A JPS57135329A JP S57135329 A JPS57135329 A JP S57135329A JP 2017781 A JP2017781 A JP 2017781A JP 2017781 A JP2017781 A JP 2017781A JP S57135329 A JPS57135329 A JP S57135329A
Authority
JP
Japan
Prior art keywords
polarizer
sample
luminous flux
scattered light
reflected
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2017781A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0216458B2 (enrdf_load_stackoverflow
Inventor
Masaki Yamamoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Priority to JP2017781A priority Critical patent/JPS57135329A/ja
Publication of JPS57135329A publication Critical patent/JPS57135329A/ja
Publication of JPH0216458B2 publication Critical patent/JPH0216458B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties
    • G01N21/211—Ellipsometry

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP2017781A 1981-02-16 1981-02-16 Polarization analyzing device Granted JPS57135329A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2017781A JPS57135329A (en) 1981-02-16 1981-02-16 Polarization analyzing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2017781A JPS57135329A (en) 1981-02-16 1981-02-16 Polarization analyzing device

Publications (2)

Publication Number Publication Date
JPS57135329A true JPS57135329A (en) 1982-08-20
JPH0216458B2 JPH0216458B2 (enrdf_load_stackoverflow) 1990-04-17

Family

ID=12019890

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2017781A Granted JPS57135329A (en) 1981-02-16 1981-02-16 Polarization analyzing device

Country Status (1)

Country Link
JP (1) JPS57135329A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59107271A (ja) * 1982-12-10 1984-06-21 Mitsubishi Electric Corp 光フアイバ応用センサ

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5036257A (enrdf_load_stackoverflow) * 1973-05-25 1975-04-05
JPS51111372A (en) * 1975-03-26 1976-10-01 Masaki Yamamoto Analyser of polarized light
JPS5265489A (en) * 1975-11-26 1977-05-30 Sony Corp Double refraction meter

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5036257A (enrdf_load_stackoverflow) * 1973-05-25 1975-04-05
JPS51111372A (en) * 1975-03-26 1976-10-01 Masaki Yamamoto Analyser of polarized light
JPS5265489A (en) * 1975-11-26 1977-05-30 Sony Corp Double refraction meter

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59107271A (ja) * 1982-12-10 1984-06-21 Mitsubishi Electric Corp 光フアイバ応用センサ

Also Published As

Publication number Publication date
JPH0216458B2 (enrdf_load_stackoverflow) 1990-04-17

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