JPS57132063A - Method for automatic chemical analysis - Google Patents

Method for automatic chemical analysis

Info

Publication number
JPS57132063A
JPS57132063A JP1739281A JP1739281A JPS57132063A JP S57132063 A JPS57132063 A JP S57132063A JP 1739281 A JP1739281 A JP 1739281A JP 1739281 A JP1739281 A JP 1739281A JP S57132063 A JPS57132063 A JP S57132063A
Authority
JP
Japan
Prior art keywords
solution
dispensing
temperature
nozzle
dispensor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1739281A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0243146B2 (enrdf_load_stackoverflow
Inventor
Masaharu Kame
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Olympus Corp
Original Assignee
Olympus Corp
Olympus Optical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Olympus Corp, Olympus Optical Co Ltd filed Critical Olympus Corp
Priority to JP1739281A priority Critical patent/JPS57132063A/ja
Publication of JPS57132063A publication Critical patent/JPS57132063A/ja
Publication of JPH0243146B2 publication Critical patent/JPH0243146B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/10—Devices for transferring samples or any liquids to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N2035/00346—Heating or cooling arrangements
    • G01N2035/00425—Heating or cooling means associated with pipettes or the like, e.g. for supplying sample/reagent at given temperature

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Biological Materials (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
JP1739281A 1981-02-10 1981-02-10 Method for automatic chemical analysis Granted JPS57132063A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1739281A JPS57132063A (en) 1981-02-10 1981-02-10 Method for automatic chemical analysis

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1739281A JPS57132063A (en) 1981-02-10 1981-02-10 Method for automatic chemical analysis

Publications (2)

Publication Number Publication Date
JPS57132063A true JPS57132063A (en) 1982-08-16
JPH0243146B2 JPH0243146B2 (enrdf_load_stackoverflow) 1990-09-27

Family

ID=11942723

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1739281A Granted JPS57132063A (en) 1981-02-10 1981-02-10 Method for automatic chemical analysis

Country Status (1)

Country Link
JP (1) JPS57132063A (enrdf_load_stackoverflow)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012167986A (ja) * 2011-02-14 2012-09-06 Jeol Ltd 分析方法及び分析装置
JPWO2014103744A1 (ja) * 2012-12-26 2017-01-12 株式会社日立ハイテクノロジーズ 自動分析装置
JP2019148572A (ja) * 2018-02-28 2019-09-05 キヤノンメディカルシステムズ株式会社 自動分析装置、及び分注方法
WO2023127878A1 (ja) * 2021-12-28 2023-07-06 積水メディカル株式会社 自動分析装置及び自動分析装置の試薬分注方法
EP4502612A4 (en) * 2022-03-31 2025-07-30 Fujifilm Corp INSPECTION DEVICE

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51108885A (ja) * 1975-03-20 1976-09-27 Nippon Electron Optics Lab Kagakubunsekisochi
JPS5231795A (en) * 1975-06-11 1977-03-10 Secr Social Service Brit Apparatus for sample inspection

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51108885A (ja) * 1975-03-20 1976-09-27 Nippon Electron Optics Lab Kagakubunsekisochi
JPS5231795A (en) * 1975-06-11 1977-03-10 Secr Social Service Brit Apparatus for sample inspection

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012167986A (ja) * 2011-02-14 2012-09-06 Jeol Ltd 分析方法及び分析装置
JPWO2014103744A1 (ja) * 2012-12-26 2017-01-12 株式会社日立ハイテクノロジーズ 自動分析装置
JP2019148572A (ja) * 2018-02-28 2019-09-05 キヤノンメディカルシステムズ株式会社 自動分析装置、及び分注方法
WO2023127878A1 (ja) * 2021-12-28 2023-07-06 積水メディカル株式会社 自動分析装置及び自動分析装置の試薬分注方法
EP4502612A4 (en) * 2022-03-31 2025-07-30 Fujifilm Corp INSPECTION DEVICE

Also Published As

Publication number Publication date
JPH0243146B2 (enrdf_load_stackoverflow) 1990-09-27

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