JPS57131016A - Testing method for precision of recorder - Google Patents

Testing method for precision of recorder

Info

Publication number
JPS57131016A
JPS57131016A JP1647881A JP1647881A JPS57131016A JP S57131016 A JPS57131016 A JP S57131016A JP 1647881 A JP1647881 A JP 1647881A JP 1647881 A JP1647881 A JP 1647881A JP S57131016 A JPS57131016 A JP S57131016A
Authority
JP
Japan
Prior art keywords
span
basic block
inbound
hysteresis
linearity
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1647881A
Other languages
Japanese (ja)
Other versions
JPS6316695B2 (en
Inventor
Mamoru Yamaguchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yokogawa Electric Corp
Original Assignee
Yokogawa Electric Corp
Yokogawa Hokushin Electric Corp
Yokogawa Electric Works Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokogawa Electric Corp, Yokogawa Hokushin Electric Corp, Yokogawa Electric Works Ltd filed Critical Yokogawa Electric Corp
Priority to JP1647881A priority Critical patent/JPS57131016A/en
Publication of JPS57131016A publication Critical patent/JPS57131016A/en
Publication of JPS6316695B2 publication Critical patent/JPS6316695B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D18/00—Testing or calibrating apparatus or arrangements provided for in groups G01D1/00 - G01D15/00

Abstract

PURPOSE:To decide linearity, span, and hysteresis by means of a single test pattern, by a method wherein axis scale marks on a L-shaped basic block are recorded in a reverse direction to each other in an inbound and an outbound path. CONSTITUTION:An axis pattern generator repeatedly generates in order signals corresponding to 3-unit segments 21, 22, and 23 which are formed into L-shape. If a recording head of a plotter reaches a full span, a basic block signal, which is formed in a shape to turn the L-shaped basic block by 180 deg., is repeatedly generated in a manner described above and in the order of the segments 21, 22, and 23. A linearity can be decided by a distance between scale marks on a recording wave form, the full length by a span, and additionally, hysteresis can be read by means of a displacement d in the scale mark on an inbound and outbound path.
JP1647881A 1981-02-06 1981-02-06 Testing method for precision of recorder Granted JPS57131016A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1647881A JPS57131016A (en) 1981-02-06 1981-02-06 Testing method for precision of recorder

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1647881A JPS57131016A (en) 1981-02-06 1981-02-06 Testing method for precision of recorder

Publications (2)

Publication Number Publication Date
JPS57131016A true JPS57131016A (en) 1982-08-13
JPS6316695B2 JPS6316695B2 (en) 1988-04-11

Family

ID=11917383

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1647881A Granted JPS57131016A (en) 1981-02-06 1981-02-06 Testing method for precision of recorder

Country Status (1)

Country Link
JP (1) JPS57131016A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7228110B2 (en) 2002-10-04 2007-06-05 Matsushita Electric Industrial Co., Ltd. Low cost high frequency device having compact mounting area, high frequency amplification method, wireless communication device and mobile telephone including low cost and high frequency circuit having compact mounting area
US8305143B2 (en) 2009-03-27 2012-11-06 Fujitsu Limited Amplifier circuit and transceiver

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7228110B2 (en) 2002-10-04 2007-06-05 Matsushita Electric Industrial Co., Ltd. Low cost high frequency device having compact mounting area, high frequency amplification method, wireless communication device and mobile telephone including low cost and high frequency circuit having compact mounting area
US8305143B2 (en) 2009-03-27 2012-11-06 Fujitsu Limited Amplifier circuit and transceiver

Also Published As

Publication number Publication date
JPS6316695B2 (en) 1988-04-11

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