JPS571149B2 - - Google Patents
Info
- Publication number
- JPS571149B2 JPS571149B2 JP9855374A JP9855374A JPS571149B2 JP S571149 B2 JPS571149 B2 JP S571149B2 JP 9855374 A JP9855374 A JP 9855374A JP 9855374 A JP9855374 A JP 9855374A JP S571149 B2 JPS571149 B2 JP S571149B2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
- G11C16/0466—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells with charge storage in an insulating layer, e.g. metal-nitride-oxide-silicon [MNOS], silicon-oxide-nitride-oxide-silicon [SONOS]
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B41/00—Electrically erasable-and-programmable ROM [EEPROM] devices comprising floating gates
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/601—Insulated-gate field-effect transistors [IGFET] having lightly-doped drain or source extensions, e.g. LDD IGFETs or DDD IGFETs
- H10D30/605—Insulated-gate field-effect transistors [IGFET] having lightly-doped drain or source extensions, e.g. LDD IGFETs or DDD IGFETs having significant overlap between the lightly-doped extensions and the gate electrode
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/69—IGFETs having charge trapping gate insulators, e.g. MNOS transistors
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Non-Volatile Memory (AREA)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9855374A JPS571149B2 (en, 2012) | 1974-08-28 | 1974-08-28 | |
US05/607,711 US4011576A (en) | 1974-08-28 | 1975-08-25 | Nonvolatile semiconductor memory devices |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9855374A JPS571149B2 (en, 2012) | 1974-08-28 | 1974-08-28 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5125985A JPS5125985A (en, 2012) | 1976-03-03 |
JPS571149B2 true JPS571149B2 (en, 2012) | 1982-01-09 |
Family
ID=14222866
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP9855374A Expired JPS571149B2 (en, 2012) | 1974-08-28 | 1974-08-28 |
Country Status (2)
Country | Link |
---|---|
US (1) | US4011576A (en, 2012) |
JP (1) | JPS571149B2 (en, 2012) |
Families Citing this family (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4193080A (en) * | 1975-02-20 | 1980-03-11 | Matsushita Electronics Corporation | Non-volatile memory device |
JPS52105784A (en) * | 1976-03-01 | 1977-09-05 | Sony Corp | Mios type memory unit |
US4350991A (en) * | 1978-01-06 | 1982-09-21 | International Business Machines Corp. | Narrow channel length MOS field effect transistor with field protection region for reduced source-to-substrate capacitance |
US4151538A (en) * | 1978-01-30 | 1979-04-24 | Rca Corp. | Nonvolatile semiconductive memory device and method of its manufacture |
US4307411A (en) * | 1978-01-30 | 1981-12-22 | Rca Corporation | Nonvolatile semiconductor memory device and method of its manufacture |
US4198252A (en) * | 1978-04-06 | 1980-04-15 | Rca Corporation | MNOS memory device |
DE2842589A1 (de) * | 1978-09-29 | 1980-05-08 | Siemens Ag | Feldeffekttransistor mit verringerter substratsteuerung der kanalbreite |
US4330930A (en) * | 1980-02-12 | 1982-05-25 | General Instrument Corp. | Electrically alterable read only memory semiconductor device made by low pressure chemical vapor deposition process |
US4456978A (en) * | 1980-02-12 | 1984-06-26 | General Instrument Corp. | Electrically alterable read only memory semiconductor device made by low pressure chemical vapor deposition process |
US4395725A (en) * | 1980-10-14 | 1983-07-26 | Parekh Rajesh H | Segmented channel field effect transistors |
DE3273867D1 (en) * | 1981-07-27 | 1986-11-20 | Xerox Corp | Field effect transistor |
US4558344A (en) * | 1982-01-29 | 1985-12-10 | Seeq Technology, Inc. | Electrically-programmable and electrically-erasable MOS memory device |
US4490900A (en) * | 1982-01-29 | 1985-01-01 | Seeq Technology, Inc. | Method of fabricating an MOS memory array having electrically-programmable and electrically-erasable storage devices incorporated therein |
EP0110320B1 (en) * | 1982-11-27 | 1987-03-11 | Nissan Motor Co., Ltd. | A mos transistor |
JPS5998557A (ja) * | 1982-11-27 | 1984-06-06 | Nissan Motor Co Ltd | Mosトランジスタ |
EP0113540A3 (en) * | 1982-12-10 | 1985-06-05 | Western Electric Company, Incorporated | Improvements in or relating to semiconductor devices, and methods of making same |
JPS6453464A (en) * | 1988-07-22 | 1989-03-01 | Seiko Epson Corp | Nonvolatile memory |
FR2648622B1 (fr) * | 1989-06-14 | 1991-08-30 | Commissariat Energie Atomique | Procede de fabrication d'un circuit integre comportant un transistor a effet de champ a double implantation |
US5215934A (en) * | 1989-12-21 | 1993-06-01 | Tzeng Jyh Cherng J | Process for reducing program disturbance in eeprom arrays |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
BE759057A (en, 2012) * | 1969-11-19 | 1971-05-17 | Philips Nv | |
JPS5139834B2 (en, 2012) * | 1971-11-09 | 1976-10-29 | ||
US3845327A (en) * | 1972-08-16 | 1974-10-29 | Westinghouse Electric Corp | Counter with memory utilizing mnos memory elements |
JPS4960896A (en, 2012) * | 1972-09-20 | 1974-06-13 | ||
JPS4960876A (en, 2012) * | 1972-10-16 | 1974-06-13 |
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1974
- 1974-08-28 JP JP9855374A patent/JPS571149B2/ja not_active Expired
-
1975
- 1975-08-25 US US05/607,711 patent/US4011576A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
US4011576A (en) | 1977-03-08 |
JPS5125985A (en, 2012) | 1976-03-03 |