JPS57113243A - Stationary probe board - Google Patents

Stationary probe board

Info

Publication number
JPS57113243A
JPS57113243A JP18922080A JP18922080A JPS57113243A JP S57113243 A JPS57113243 A JP S57113243A JP 18922080 A JP18922080 A JP 18922080A JP 18922080 A JP18922080 A JP 18922080A JP S57113243 A JPS57113243 A JP S57113243A
Authority
JP
Japan
Prior art keywords
mounting piece
substrate
printed board
needle
mounting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP18922080A
Other languages
Japanese (ja)
Other versions
JPS5832782B2 (en
Inventor
Yoshie Hasegawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Priority to JP55189220A priority Critical patent/JPS5832782B2/en
Publication of JPS57113243A publication Critical patent/JPS57113243A/en
Publication of JPS5832782B2 publication Critical patent/JPS5832782B2/en
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

PURPOSE:To improve the reliability of test result by securing a stationary end to a mounting piece with conductivity, extending approximately axially of the mounting piece the end, and bending to face with the measuring electrode, thereby preventing the piezo effect. CONSTITUTION:Many probe needles 2' are radially arranged at the ends to be positioned at the electrodes of semiconductor chips to be measured at the position of a rectangular hole 9 formed at the center of a printed board 1. The other end of the mounting piece 10 of the needle is electrically connected via solder to the connecting end of the wiring pattern 6 of the substrate 1. The printed board 1 and the probe needle are integrally secured by the ring-shaped stationary unit 11 formed of insulating securing material so that the surface of the mounting piece becomes vertical to the mounting surface of the substrate 1.
JP55189220A 1980-12-29 1980-12-29 Fixed probe board Expired JPS5832782B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55189220A JPS5832782B2 (en) 1980-12-29 1980-12-29 Fixed probe board

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55189220A JPS5832782B2 (en) 1980-12-29 1980-12-29 Fixed probe board

Publications (2)

Publication Number Publication Date
JPS57113243A true JPS57113243A (en) 1982-07-14
JPS5832782B2 JPS5832782B2 (en) 1983-07-15

Family

ID=16237569

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55189220A Expired JPS5832782B2 (en) 1980-12-29 1980-12-29 Fixed probe board

Country Status (1)

Country Link
JP (1) JPS5832782B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01288772A (en) * 1988-05-17 1989-11-21 Tokyo Electron Ltd Probe card

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5093572A (en) * 1973-12-19 1975-07-25
JPS51104756U (en) * 1975-02-20 1976-08-21

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5093572A (en) * 1973-12-19 1975-07-25
JPS51104756U (en) * 1975-02-20 1976-08-21

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01288772A (en) * 1988-05-17 1989-11-21 Tokyo Electron Ltd Probe card

Also Published As

Publication number Publication date
JPS5832782B2 (en) 1983-07-15

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