JPS57108657A - Method and apparatus for detecting defect on metal surface - Google Patents

Method and apparatus for detecting defect on metal surface

Info

Publication number
JPS57108657A
JPS57108657A JP55183808A JP18380880A JPS57108657A JP S57108657 A JPS57108657 A JP S57108657A JP 55183808 A JP55183808 A JP 55183808A JP 18380880 A JP18380880 A JP 18380880A JP S57108657 A JPS57108657 A JP S57108657A
Authority
JP
Japan
Prior art keywords
probe
defect
amount
metal surface
voltage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP55183808A
Other languages
Japanese (ja)
Inventor
Manabu Yamatoki
Katsumi Tanaka
Kazuhide Yoshiura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tosoh Corp
Original Assignee
Toyo Soda Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toyo Soda Manufacturing Co Ltd filed Critical Toyo Soda Manufacturing Co Ltd
Priority to JP55183808A priority Critical patent/JPS57108657A/en
Publication of JPS57108657A publication Critical patent/JPS57108657A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9046—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents by analysing electrical signals

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)

Abstract

PURPOSE:To make it possible to perform display from fine defects to major defects in a short time by converting the variation in inductance in a coil in which eddy current is generated by the relative distance to the surface of the metal to be checked into a voltage, and coverting the amount of movement and the amount of angular movement of a probe into voltages. CONSTITUTION:By using the eddy current generated in the defect detecting eddy current generating coil 1, the variation in the inductance of the coil 1 due to the variation in the relative distance between the probe 2 and the defective part in the metal surface 3 to be checked is captured by an oscillator 4. The output voltage of the oscillator 4 is read by an indicator 5 and the defect in the metal surface 3 is probed. The amount of the movement of the probe 2 is detected by a detector 7 and converted into the DC voltage by a transducer 8. The the DC output voltages from the oscillator 4 and the transducer 8 are supplied to an X- X recorder 9 and the amount of the defect in the metal surface 3 and the distance to the defective part are recorded. Meanwhile, the angular movement from a fixed point from the probe 2 is detected 10 and converted into the DC voltage 11. Each DC output is supplied to a CRT12. A three-dimentional figure is displayed afte the operational processing and the quantity and quality of the defect are detected.
JP55183808A 1980-12-26 1980-12-26 Method and apparatus for detecting defect on metal surface Pending JPS57108657A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55183808A JPS57108657A (en) 1980-12-26 1980-12-26 Method and apparatus for detecting defect on metal surface

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55183808A JPS57108657A (en) 1980-12-26 1980-12-26 Method and apparatus for detecting defect on metal surface

Publications (1)

Publication Number Publication Date
JPS57108657A true JPS57108657A (en) 1982-07-06

Family

ID=16142237

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55183808A Pending JPS57108657A (en) 1980-12-26 1980-12-26 Method and apparatus for detecting defect on metal surface

Country Status (1)

Country Link
JP (1) JPS57108657A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
RU2477467C2 (en) * 2007-05-30 2013-03-10 Снекма Determining reference marks of points of interest in area of surface of component and use to optimise trajectory and inclination angle of eddy current probes

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
RU2477467C2 (en) * 2007-05-30 2013-03-10 Снекма Determining reference marks of points of interest in area of surface of component and use to optimise trajectory and inclination angle of eddy current probes

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