JPS6011492Y2 - Automatic magnetic flaw detection equipment inspection equipment - Google Patents

Automatic magnetic flaw detection equipment inspection equipment

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Publication number
JPS6011492Y2
JPS6011492Y2 JP6463379U JP6463379U JPS6011492Y2 JP S6011492 Y2 JPS6011492 Y2 JP S6011492Y2 JP 6463379 U JP6463379 U JP 6463379U JP 6463379 U JP6463379 U JP 6463379U JP S6011492 Y2 JPS6011492 Y2 JP S6011492Y2
Authority
JP
Japan
Prior art keywords
magnetic
flaw detection
magnetic head
inspected
inspection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP6463379U
Other languages
Japanese (ja)
Other versions
JPS55165265U (en
Inventor
正之 今井
Original Assignee
株式会社島津製作所
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 株式会社島津製作所 filed Critical 株式会社島津製作所
Priority to JP6463379U priority Critical patent/JPS6011492Y2/en
Publication of JPS55165265U publication Critical patent/JPS55165265U/ja
Application granted granted Critical
Publication of JPS6011492Y2 publication Critical patent/JPS6011492Y2/en
Expired legal-status Critical Current

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  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)

Description

【考案の詳細な説明】 本考案は自動磁気探傷装置の調整、保守、点検等のため
の模擬欠陥信号発生装置に関する。
[Detailed Description of the Invention] The present invention relates to a simulated defect signal generation device for adjustment, maintenance, inspection, etc. of automatic magnetic flaw detection equipment.

自動磁気探傷装置は被検査材を磁化させ、被検査材の欠
陥部から出て来る漏洩磁束を磁気センサにより検出測定
して欠陥の大きさ深さ等の定量的判定或はこの判定結果
を製造設備番とフィードバックして製品の品質の向上及
び安定を計るものである。
Automatic magnetic flaw detection equipment magnetizes the material to be inspected, uses a magnetic sensor to detect and measure the leakage magnetic flux coming out of the defective part of the material to be inspected, and quantitatively determines the size and depth of the defect, etc., or manufactures this determination result. This is used to improve and stabilize product quality by providing feedback with the equipment number.

このような自動磁気探傷装置における基本的動作である
欠陥の定量的判定の信頼性を維持するためには随時点検
、保守、調整が必要である。
In order to maintain the reliability of quantitative determination of defects, which is the basic operation of such automatic magnetic flaw detection equipment, inspection, maintenance, and adjustment are required from time to time.

従来自動磁気探傷装置の上述した点検調整は次のよiに
行われていた。
Conventionally, the above-mentioned inspection and adjustment of automatic magnetic flaw detection equipment has been carried out as follows.

即ち磁気センサの出力端に発振器を接続し、磁気センサ
からの欠陥信号の代りに発振器の出力信号を磁気センサ
以後の増幅器等の信号処理回路に印加し、発振器の出力
を欠陥の出力信号になぞらえて断続させ弁別回路、表示
回路等の調整を行っていた。
That is, an oscillator is connected to the output terminal of the magnetic sensor, and the output signal of the oscillator is applied to a signal processing circuit such as an amplifier after the magnetic sensor in place of the defect signal from the magnetic sensor, and the output of the oscillator is compared to the output signal of the defect. Adjustments were made to the discrimination circuit, display circuit, etc.

この場合磁気センサ部は点検、調整の操作からは省かれ
ており、磁気センサ部自体の保守点検、調整には標準試
料を用い探傷動作を行わせて感度設定を行っていた。
In this case, the magnetic sensor section is omitted from the inspection and adjustment operations, and the sensitivity is set by performing flaw detection using a standard sample for maintenance, inspection, and adjustment of the magnetic sensor section itself.

標準試料は正常の被検査材に一定の人工傷を設けたもの
で実際の材料検査のときと同様に探傷装置に適用して磁
気センサ部の感度調節等を行うので磁気センサ部の点検
は簡単に随時実行することが困難であり、標準試料は通
常の材料検査のときの被検査材と同様に扱われるので、
繰返し使用していると人工傷の摩耗変形が起って長期間
標準傷の状態を維持することができない。
The standard sample is a normal material to be inspected with a certain amount of artificial flaws, and it is applied to the flaw detection equipment to adjust the sensitivity of the magnetic sensor section in the same way as when inspecting actual materials, so inspection of the magnetic sensor section is easy. It is difficult to perform this at any time, and the standard sample is treated in the same way as the material to be inspected during normal material inspection.
Repeated use causes wear and deformation of the artificial scratches, making it impossible to maintain the standard scratch state for a long period of time.

換言すれば磁気センサ部の感度設定が点検を繰返す間に
徐々にずれて来る可能性がある。
In other words, the sensitivity setting of the magnetic sensor section may gradually shift during repeated inspections.

従って本考案は標準試料を用いないことによって磁気セ
ンサと以後の信号処理回路とを分けることなく、これら
が結合された探傷動作時そのま)の状態において探傷装
置の総合的な点検がきわめて簡単に行えるようにしよう
とするものである。
Therefore, by not using a standard sample, the present invention does not separate the magnetic sensor and subsequent signal processing circuit, making it extremely easy to comprehensively inspect the flaw detection equipment in the state in which they are connected (during flaw detection operation). I am trying to make it possible.

本考案は被検査材の傷に擬した磁気ヘッドを用意し、こ
の磁気ヘッドを磁気探傷装置の磁気センサ部に対向させ
ることによって磁気探傷装置の点検を行うようにした装
置を提供するものである。
The present invention provides a device that inspects a magnetic flaw detection device by preparing a magnetic head that simulates flaws on a material to be inspected and by placing this magnetic head in opposition to the magnetic sensor section of the magnetic flaw detection device. .

まず本考案の対象となっている磁気探傷装置について概
略説明をする。
First, a general explanation will be given of the magnetic flaw detection device that is the subject of this invention.

第1図に磁気探傷装置の要部を示す。Figure 1 shows the main parts of the magnetic flaw detection device.

1は磁気センサで例えばホール素子とかマグネットダイ
オード等であり、ホルダ2内に組込まれている。
Reference numeral 1 denotes a magnetic sensor, such as a Hall element or a magnet diode, which is incorporated into the holder 2 .

3は磁気センサ1に後続する信号処理装置である。3 is a signal processing device following the magnetic sensor 1.

4は被検査材であって丸棒が示されている。4 is a material to be inspected, and a round bar is shown.

被検査材4は矢印方向に回転せしめられながら図の紙面
に直角の方向に移送され、このようにして磁気センサ1
は被検査材4の表面を螺旋状に走査する。
The material to be inspected 4 is rotated in the direction of the arrow and transferred in a direction perpendicular to the plane of the drawing, and in this way the magnetic sensor 1
scans the surface of the material 4 to be inspected in a spiral manner.

5は磁化装置の鉄心でその磁極間を被検査材が通過する
ようになっており、この鉄心には励磁コイル6が巻装さ
れ、励磁コイル6は励磁電源7に接続されている。
Reference numeral 5 denotes an iron core of a magnetization device through which a material to be inspected passes between its magnetic poles.An excitation coil 6 is wound around this iron core, and the excitation coil 6 is connected to an excitation power source 7.

鉄心5と被検査材4とからなる磁気回路を図示矢印φの
ように磁束が流れているとき被検査材4に8で示すよう
に傷があるとすると漏洩磁束が図のように磁気センサ1
を通る。
When magnetic flux is flowing through the magnetic circuit consisting of the iron core 5 and the material to be inspected 4 as shown by the arrow φ, if there is a flaw in the material to be inspected 4 as shown by 8, the leakage magnetic flux will flow through the magnetic sensor 1 as shown in the figure.
pass through.

直流励磁が行われているとして被検査材4が回転すると
差動的に接続された2つの磁気センサ1からは第1図に
Sで示したような波形の傷検出信号が得られる。
When the inspected material 4 rotates under the assumption that DC excitation is being performed, a flaw detection signal having a waveform as shown by S in FIG. 1 is obtained from the two differentially connected magnetic sensors 1.

励磁が交流励磁のときの傷検出信号は第1図S′のよう
な波形となる。
When the excitation is AC excitation, the flaw detection signal has a waveform as shown in FIG. 1 S'.

以上で磁気探傷装置の説明を終り、以下実施例によって
本考案を説明する。
This concludes the explanation of the magnetic flaw detection device, and the present invention will be explained below with reference to Examples.

第2図は本考案において用いられる点検用磁気ヘッドの
一実施例を示す。
FIG. 2 shows an embodiment of the inspection magnetic head used in the present invention.

磁気ヘッドの主要部は磁気ギャップ9を有する磁心10
でコイル11が巻装してあり、コイル11は模擬欠点検
号発正器12に接続されている。
The main part of the magnetic head is a magnetic core 10 having a magnetic gap 9.
A coil 11 is wound around the coil 11, and the coil 11 is connected to a simulated defect detection generator 12.

磁気ギャップ9の幅Wは被検査材において存在し得る傷
の幅に準じて定められている。
The width W of the magnetic gap 9 is determined according to the width of flaws that may exist in the material to be inspected.

磁心10を通る磁束はギャップ9において固点線のよう
に外方に漏れ出る。
The magnetic flux passing through the magnetic core 10 leaks outward at the gap 9 like a fixed line.

そこでこのギャップ9を磁気探傷装置の2個の磁気セン
サ1の中間位置に対向させ、°磁気探傷装置の鉄心5が
直流励磁なら第3図Bに示すような波形の電流をコイル
11に流し、鉄心5が交流励磁なら第3図Aのような波
形で振幅変調した交流電流をコイル11に流すと磁気セ
ンサ1からは第1図S又はS′と同じ波形の出力信号が
出て信号処理装置3に印加される。
Therefore, this gap 9 is placed opposite to the intermediate position between the two magnetic sensors 1 of the magnetic flaw detection device, and if the iron core 5 of the magnetic flaw detection device is DC-excited, a current having a waveform as shown in FIG. 3B is passed through the coil 11. If the iron core 5 is AC-excited, when an AC current amplitude-modulated with a waveform as shown in FIG. 3A is passed through the coil 11, an output signal with the same waveform as S or S' in FIG. 1 is output from the magnetic sensor 1, and the signal processing device 3 is applied.

コイル11の励磁電流の大きさは模擬欠点信号発生器1
2の出力電流の振幅を調整することによって大小任意に
変えることができ、これによって模擬欠陥の深さを種々
に設定することができ、信号の長さlを変えることによ
り模擬欠点の幅を変えることができる。
The magnitude of the excitation current of the coil 11 is determined by the simulated defect signal generator 1.
By adjusting the amplitude of the output current in step 2, the amplitude can be arbitrarily changed, and thereby the depth of the simulated defect can be set variously, and by changing the signal length l, the width of the simulated defect can be changed. be able to.

第4図は第2図に示した磁気ヘッドをホルダ13に収納
した状態を示す。
FIG. 4 shows the magnetic head shown in FIG. 2 housed in the holder 13. As shown in FIG.

磁気ホルダ13は上面に凹所14があって、磁気探傷装
置の磁気センサホルダ2が挿入嵌合せしめられるように
なっている。
The magnetic holder 13 has a recess 14 on its upper surface, into which the magnetic sensor holder 2 of the magnetic flaw detector is inserted and fitted.

磁気探傷装置の点検は第1図で被検査材を除き、ホルダ
2に点検用磁気ヘッドのホルダ13を被嵌せしめてコイ
ル11に第3図A又はBの波形の電流を流せばよい。
To inspect the magnetic flaw detection apparatus, remove the material to be inspected as shown in FIG. 1, fit the holder 13 of the inspection magnetic head into the holder 2, and apply a current having the waveform shown in FIG. 3A or B to the coil 11.

第5図は点検用磁気ヘッドの他の実施例で半円周状の永
久磁石ml、m2を隙間Wを設けて対向させたものを矢
印のように回転し得るよう回転装置の出力軸に取付けた
もので、磁気ヘッドであると共に模擬欠点信号発生器を
も兼ねたものである。
Figure 5 shows another embodiment of the magnetic head for inspection, in which semicircular permanent magnets ml and m2 are placed facing each other with a gap W, and are attached to the output shaft of a rotating device so that they can rotate as shown by the arrow. It serves as both a magnetic head and a simulated defect signal generator.

磁極間隙間Wにおいて磁束が外方(内方にも漏れている
が模擬欠点検出信号を出力させるのは外方)へ漏れて、
これが被検査材の傷から漏洩する磁束に対応する。
The magnetic flux leaks to the outside in the gap W between the magnetic poles (it also leaks inward, but the simulated defect detection signal is output to the outside),
This corresponds to the magnetic flux leaking from scratches on the inspected material.

この物を第1図の被検査材の位置に置き被検査材と同じ
速さで回転させることによって磁気センサ1に模擬欠点
検出信号を出力させることができる。
By placing this object at the position of the inspected material in FIG. 1 and rotating it at the same speed as the inspected material, the magnetic sensor 1 can output a simulated defect detection signal.

この場合は直流励磁の場合に相当し、この磁気ヘッドを
用いるときは交流励磁の場合に対応させることはできな
い。
This case corresponds to the case of DC excitation, and cannot be applied to the case of AC excitation when using this magnetic head.

本考案は上述したような構成で、被検査材に比しきわめ
て小さな磁気ヘッドを用いるだけであるから被検査材と
同程度の大きさの標準試料を用いるのに比し点検操作が
大へん簡単にでき、磁気探傷装置の磁気センサから見る
ときは磁気ヘッドは被検査材の傷が在るのと全く同等で
あるから磁気探傷装置全体として総合的な点検が一度に
でき、かつ標準試料のように摩耗変形の可能性がないか
ら調整が次第にずれてくると云うおそれがなく、また対
象とする被検査材の寸法とか鋼種が変更されても支障が
ない。
The present invention has the above-mentioned configuration, and since it only uses a magnetic head that is extremely small compared to the material to be inspected, the inspection operation is much simpler than using a standard sample of the same size as the material to be inspected. When viewed from the magnetic sensor of the magnetic flaw detection device, the magnetic head is exactly the same as a flaw in the material being inspected, so comprehensive inspection of the entire magnetic flaw detection device can be done at once, and it can be inspected just like a standard sample. Since there is no possibility of deformation due to wear, there is no fear that the adjustment will gradually deviate, and there is no problem even if the dimensions or steel type of the material to be inspected are changed.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は磁気探傷装置の原理図、第2図は本考案の一実
施例装置の磁気ヘッドの正面図、第3図は上記磁気ヘッ
ドのコイルに流す励磁電流の波形を示す図、第4図は上
記磁気−・ラドを組込んだホルダの縦断正面図、第5図
は本考案の他の一実施例装置の正面図である。 1・・・・・・磁気センサ、3・・・・・・信号処理装
置、4・・・・・・被検査材、5・・・・・・被検支材
励磁鉄心、10・・・・・・磁気ヘッド磁心、 11・・・・・・コイル、 12・・・・・・模擬 信号発生用信号発生器。
Fig. 1 is a principle diagram of a magnetic flaw detection device, Fig. 2 is a front view of a magnetic head of an embodiment of the device of the present invention, Fig. 3 is a diagram showing the waveform of the excitation current flowing through the coil of the magnetic head, and Fig. 4 The figure is a longitudinal sectional front view of a holder incorporating the magnetic rad, and FIG. 5 is a front view of another embodiment of the device of the present invention. DESCRIPTION OF SYMBOLS 1... Magnetic sensor, 3... Signal processing device, 4... Material to be inspected, 5...... Strut excitation core to be inspected, 10... ... Magnetic head magnetic core, 11 ... Coil, 12 ... Signal generator for generating simulated signals.

Claims (3)

【実用新案登録請求の範囲】[Scope of utility model registration request] (1)磁束が漏洩する隙間を有する磁気ヘッドとこの磁
気ヘッドを介して磁気探傷装置の磁気センサに被検査材
の欠陥を検出した場合と同じ効果を生ぜしめる模擬欠陥
信号発生手段とよりなり、上記磁気ヘッドを上記磁気セ
ンサに対向せしめるようにした自動磁気探傷装置点検装
置。
(1) It consists of a magnetic head having a gap through which magnetic flux leaks, and a simulated defect signal generating means that produces the same effect as when a defect in the inspected material is detected by a magnetic sensor of a magnetic flaw detection device via this magnetic head, An automatic magnetic flaw detector inspection device, wherein the magnetic head is opposed to the magnetic sensor.
(2)模擬欠陥信号を発生する手段が磁気ヘッドを構成
する磁心に巻装したコイルに欠点検出信号と同じ波形の
電流を流す装置である実用新案登録請求の範囲第1項記
載の自動磁気探傷装置点検装置。
(2) Automatic magnetic flaw detection according to claim 1, wherein the means for generating the simulated defect signal is a device that causes a current having the same waveform as the defect detection signal to flow through a coil wound around a magnetic core constituting a magnetic head. Equipment inspection equipment.
(3)磁気ヘッドが分割円周状の複数の永久磁石を隙間
を設けて円周に配列した構造で、模擬欠陥信号を発生さ
せる手段が上記磁気ヘッドを回転させる手段である実用
新案登録請求の範囲第1項記載の自動磁気探傷装置点検
装置。
(3) A utility model registration request in which the magnetic head has a structure in which a plurality of permanent magnets in the shape of a divided circumference are arranged circumferentially with gaps, and the means for generating the simulated defect signal is means for rotating the magnetic head. Automatic magnetic flaw detection device inspection device according to scope 1.
JP6463379U 1979-05-14 1979-05-14 Automatic magnetic flaw detection equipment inspection equipment Expired JPS6011492Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6463379U JPS6011492Y2 (en) 1979-05-14 1979-05-14 Automatic magnetic flaw detection equipment inspection equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6463379U JPS6011492Y2 (en) 1979-05-14 1979-05-14 Automatic magnetic flaw detection equipment inspection equipment

Publications (2)

Publication Number Publication Date
JPS55165265U JPS55165265U (en) 1980-11-27
JPS6011492Y2 true JPS6011492Y2 (en) 1985-04-16

Family

ID=29298661

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6463379U Expired JPS6011492Y2 (en) 1979-05-14 1979-05-14 Automatic magnetic flaw detection equipment inspection equipment

Country Status (1)

Country Link
JP (1) JPS6011492Y2 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2006046578A1 (en) * 2004-10-28 2006-05-04 Toyo Kohan Co., Ltd. Device and method for inspecting scratch on cell external case
JP2006153856A (en) * 2004-10-28 2006-06-15 Toyo Kohan Co Ltd Device and method for inspecting scratch on external case for cell
US7293943B1 (en) 2006-02-02 2007-11-13 Daido Metal Company Ltd. Tool holder

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2006046578A1 (en) * 2004-10-28 2006-05-04 Toyo Kohan Co., Ltd. Device and method for inspecting scratch on cell external case
JP2006153856A (en) * 2004-10-28 2006-06-15 Toyo Kohan Co Ltd Device and method for inspecting scratch on external case for cell
US7293943B1 (en) 2006-02-02 2007-11-13 Daido Metal Company Ltd. Tool holder

Also Published As

Publication number Publication date
JPS55165265U (en) 1980-11-27

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