JPS57103524A - Test device of input/output controlling circuit - Google Patents

Test device of input/output controlling circuit

Info

Publication number
JPS57103524A
JPS57103524A JP55179365A JP17936580A JPS57103524A JP S57103524 A JPS57103524 A JP S57103524A JP 55179365 A JP55179365 A JP 55179365A JP 17936580 A JP17936580 A JP 17936580A JP S57103524 A JPS57103524 A JP S57103524A
Authority
JP
Japan
Prior art keywords
counter
input
output
pulse
output device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP55179365A
Other languages
English (en)
Inventor
Hatsuo Murata
Kenji Meguro
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP55179365A priority Critical patent/JPS57103524A/ja
Publication of JPS57103524A publication Critical patent/JPS57103524A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2221—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test input/output devices or peripheral units

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
JP55179365A 1980-12-18 1980-12-18 Test device of input/output controlling circuit Pending JPS57103524A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55179365A JPS57103524A (en) 1980-12-18 1980-12-18 Test device of input/output controlling circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55179365A JPS57103524A (en) 1980-12-18 1980-12-18 Test device of input/output controlling circuit

Publications (1)

Publication Number Publication Date
JPS57103524A true JPS57103524A (en) 1982-06-28

Family

ID=16064571

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55179365A Pending JPS57103524A (en) 1980-12-18 1980-12-18 Test device of input/output controlling circuit

Country Status (1)

Country Link
JP (1) JPS57103524A (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015104266A (ja) * 2013-11-26 2015-06-04 株式会社ノーリツ 発電システム

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015104266A (ja) * 2013-11-26 2015-06-04 株式会社ノーリツ 発電システム

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