JPS57101770A - Time-delayed measuring circuit - Google Patents

Time-delayed measuring circuit

Info

Publication number
JPS57101770A
JPS57101770A JP56154916A JP15491681A JPS57101770A JP S57101770 A JPS57101770 A JP S57101770A JP 56154916 A JP56154916 A JP 56154916A JP 15491681 A JP15491681 A JP 15491681A JP S57101770 A JPS57101770 A JP S57101770A
Authority
JP
Japan
Prior art keywords
time
measuring circuit
delayed
delayed measuring
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56154916A
Other languages
English (en)
Other versions
JPH0370791B2 (ja
Inventor
Harison Makureotsudo Maaku
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Publication of JPS57101770A publication Critical patent/JPS57101770A/ja
Publication of JPH0370791B2 publication Critical patent/JPH0370791B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3016—Delay or race condition test, e.g. race hazard test
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses
    • H03K3/027—Generators characterised by the type of circuit or by the means used for producing pulses by the use of logic circuits, with internal or external positive feedback
    • H03K3/03—Astable circuits
    • H03K3/0315—Ring oscillators
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S331/00—Oscillators
    • Y10S331/03—Logic gate active element oscillator

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
JP56154916A 1980-12-17 1981-10-01 Time-delayed measuring circuit Granted JPS57101770A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/217,373 US4392105A (en) 1980-12-17 1980-12-17 Test circuit for delay measurements on a LSI chip

Publications (2)

Publication Number Publication Date
JPS57101770A true JPS57101770A (en) 1982-06-24
JPH0370791B2 JPH0370791B2 (ja) 1991-11-08

Family

ID=22810800

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56154916A Granted JPS57101770A (en) 1980-12-17 1981-10-01 Time-delayed measuring circuit

Country Status (4)

Country Link
US (1) US4392105A (ja)
EP (1) EP0054111B1 (ja)
JP (1) JPS57101770A (ja)
DE (1) DE3169410D1 (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5917174A (ja) * 1982-07-06 1984-01-28 インタ−ナシヨナル　ビジネス　マシ−ンズ　コ−ポレ−シヨン 遅延時間測定装置

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4517532A (en) * 1983-07-01 1985-05-14 Motorola, Inc. Programmable ring oscillator
US4527126A (en) * 1983-08-26 1985-07-02 Micro Component Technology, Inc. AC parametric circuit having adjustable delay lock loop
US4660197A (en) * 1985-11-01 1987-04-21 Teradyne, Inc. Circuitry for synchronizing a multiple channel circuit tester
US4712061A (en) * 1986-02-24 1987-12-08 Gould Inc. Small propagation delay measurement for digital logic
US4980586A (en) * 1987-10-07 1990-12-25 Tektronix, Inc. Digital integrated circuit propagation delay regulator
US5013944A (en) * 1989-04-20 1991-05-07 International Business Machines Corporation Programmable delay line utilizing measured actual delays to provide a highly accurate delay
US4978927A (en) * 1989-11-08 1990-12-18 International Business Machines Corporation Programmable voltage controlled ring oscillator
US5068547A (en) * 1990-09-05 1991-11-26 Lsi Logic Corporation Process monitor circuit
US5291141A (en) * 1991-09-30 1994-03-01 Hughes Aircraft Company Method for continuously measuring delay margins in digital systems
DE4222130C2 (de) * 1992-07-06 1995-12-14 Heraeus Noblelight Gmbh Hochleistungsstrahler
JPH0643220A (ja) * 1992-07-23 1994-02-18 Hitachi Ltd 半導体集積回路装置
JP3455982B2 (ja) * 1993-01-14 2003-10-14 株式会社デンソー 偶数段リングオシレータ及びパルス位相差符号化回路
FR2737066B1 (fr) * 1995-07-20 1997-09-19 Matra Mhs Dispositif de conversion analogique-numerique
US5787092A (en) * 1997-05-27 1998-07-28 Hewlett-Packard Co. Test chip circuit for on-chip timing characterization
CA2308820A1 (en) * 2000-05-15 2001-11-15 The Governors Of The University Of Alberta Wireless radio frequency technique design and method for testing of integrated circuits and wafers
US6407607B1 (en) 2000-12-04 2002-06-18 Taiwan Semiconductor Manufacturing Company In and out of phase signal generating circuit
US7489204B2 (en) * 2005-06-30 2009-02-10 International Business Machines Corporation Method and structure for chip-level testing of wire delay independent of silicon delay
KR20070087846A (ko) * 2005-12-28 2007-08-29 동부일렉트로닉스 주식회사 연결배선의 지연시간 특성 분석용 테스트 패턴 및 테스트패턴을 이용한 지연시간 특성 분석방법

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4063080A (en) * 1976-06-30 1977-12-13 International Business Machines Corporation Method of propagation delay testing a level sensitive array logic system
SU725048A1 (ru) * 1978-04-04 1980-03-30 Предприятие П/Я В-8730 Устройство дл измерени динамических параметров микросхем

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5917174A (ja) * 1982-07-06 1984-01-28 インタ−ナシヨナル　ビジネス　マシ−ンズ　コ−ポレ−シヨン 遅延時間測定装置
JPH0322949B2 (ja) * 1982-07-06 1991-03-27 Intaanashonaru Bijinesu Mashiinzu Corp

Also Published As

Publication number Publication date
EP0054111A1 (en) 1982-06-23
EP0054111B1 (en) 1985-03-20
JPH0370791B2 (ja) 1991-11-08
DE3169410D1 (en) 1985-04-25
US4392105A (en) 1983-07-05

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