JPS5694597A - Memory data control system - Google Patents

Memory data control system

Info

Publication number
JPS5694597A
JPS5694597A JP17319079A JP17319079A JPS5694597A JP S5694597 A JPS5694597 A JP S5694597A JP 17319079 A JP17319079 A JP 17319079A JP 17319079 A JP17319079 A JP 17319079A JP S5694597 A JPS5694597 A JP S5694597A
Authority
JP
Japan
Prior art keywords
sec
ded
data
parity
output
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP17319079A
Other languages
Japanese (ja)
Inventor
Shuji Ito
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP17319079A priority Critical patent/JPS5694597A/en
Publication of JPS5694597A publication Critical patent/JPS5694597A/en
Pending legal-status Critical Current

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Landscapes

  • Detection And Correction Of Errors (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)

Abstract

PURPOSE: To enable to use the data corrected with SEC-DED system, if there is an error, by controlling the selective output means for the output of SEC-DED means and the data output according to the result of parity inspection.
CONSTITUTION: The data memory 3 storing the data including the parity bit. parity inspection circuit 9, and 1-bit error correction - 2-bit error detection (SEC- DED) means 1, are provided. Further, the output from the SEC-DED means 1 and the data read out from the data memory section 3 are delivered, and the selective output means selectively outputting either one of them, is provided, and this selective output means is controlled according to the result of inspection in the parity inspection circuit 9. For example, as the selective output means, a multiplexer 6 is used, and normally, check is made with the parity system, and if there is any error, the data corrected with the SEC-DED system can be output.
COPYRIGHT: (C)1981,JPO&Japio
JP17319079A 1979-12-28 1979-12-28 Memory data control system Pending JPS5694597A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17319079A JPS5694597A (en) 1979-12-28 1979-12-28 Memory data control system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17319079A JPS5694597A (en) 1979-12-28 1979-12-28 Memory data control system

Publications (1)

Publication Number Publication Date
JPS5694597A true JPS5694597A (en) 1981-07-31

Family

ID=15955755

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17319079A Pending JPS5694597A (en) 1979-12-28 1979-12-28 Memory data control system

Country Status (1)

Country Link
JP (1) JPS5694597A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6151253A (en) * 1984-08-20 1986-03-13 Nec Corp Memory error correctng circuit
JPS62125453A (en) * 1985-11-26 1987-06-06 Iwaki Denshi Kk Storage device
JPS63240658A (en) * 1987-03-27 1988-10-06 Nec Corp Memory device
JP2016187099A (en) * 2015-03-27 2016-10-27 ルネサスエレクトロニクス株式会社 Data processing circuit
US10859417B2 (en) 2016-03-11 2020-12-08 Hitachi Metals, Ltd. Thermal mass flow sensor, method for manufacturing the thermal mass flow sensor, and thermal mass flow meter using the thermal mass flow sensor

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6151253A (en) * 1984-08-20 1986-03-13 Nec Corp Memory error correctng circuit
JPS62125453A (en) * 1985-11-26 1987-06-06 Iwaki Denshi Kk Storage device
JPS63240658A (en) * 1987-03-27 1988-10-06 Nec Corp Memory device
JP2016187099A (en) * 2015-03-27 2016-10-27 ルネサスエレクトロニクス株式会社 Data processing circuit
US10340955B2 (en) 2015-03-27 2019-07-02 Renesas Electronics Corporation Data processing circuit
US10859417B2 (en) 2016-03-11 2020-12-08 Hitachi Metals, Ltd. Thermal mass flow sensor, method for manufacturing the thermal mass flow sensor, and thermal mass flow meter using the thermal mass flow sensor

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