JPS5652345B2 - - Google Patents

Info

Publication number
JPS5652345B2
JPS5652345B2 JP10688575A JP10688575A JPS5652345B2 JP S5652345 B2 JPS5652345 B2 JP S5652345B2 JP 10688575 A JP10688575 A JP 10688575A JP 10688575 A JP10688575 A JP 10688575A JP S5652345 B2 JPS5652345 B2 JP S5652345B2
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP10688575A
Other versions
JPS5176040A (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS5176040A publication Critical patent/JPS5176040A/ja
Publication of JPS5652345B2 publication Critical patent/JPS5652345B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/273—Tester hardware, i.e. output processing circuits
    • G06F11/277—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault-free response
JP50106885A 1974-09-03 1975-09-03 Dejitarukairono shikensochi Granted JPS5176040A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/502,326 US3976864A (en) 1974-09-03 1974-09-03 Apparatus and method for testing digital circuits

Publications (2)

Publication Number Publication Date
JPS5176040A JPS5176040A (en) 1976-07-01
JPS5652345B2 true JPS5652345B2 (ja) 1981-12-11

Family

ID=23997313

Family Applications (1)

Application Number Title Priority Date Filing Date
JP50106885A Granted JPS5176040A (en) 1974-09-03 1975-09-03 Dejitarukairono shikensochi

Country Status (5)

Country Link
US (1) US3976864A (ja)
JP (1) JPS5176040A (ja)
CA (1) CA1037609A (ja)
DE (1) DE2538651C2 (ja)
GB (1) GB1464515A (ja)

Families Citing this family (63)

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JPS5335446A (en) * 1976-09-13 1978-04-01 Tektronix Inc Logical analyzer
US4059749A (en) * 1976-11-09 1977-11-22 Westinghouse Electric Corporation Digital monitor
IT1065766B (it) * 1976-12-31 1985-03-04 Honeywell Inf Systems Dispositivo compressore di sintomi per la diagnostica di reti logiche integrate,microprocessori e simili
MX4130E (es) * 1977-05-20 1982-01-04 Amdahl Corp Mejoras en sistema de procesamiento de datos y escrutinio de informacion utilizando sumas de comprobacion
US4224534A (en) * 1977-08-17 1980-09-23 Hewlett-Packard Company Tri-state signal conditioning method and circuit
US4266294A (en) * 1977-08-30 1981-05-05 Xerox Corporation Copy reproduction machine with controller self check system
US4183460A (en) * 1977-12-23 1980-01-15 Burroughs Corporation In-situ test and diagnostic circuitry and method for CML chips
US4161276A (en) * 1978-03-01 1979-07-17 Ncr Corporation Complex logical fault detection apparatus and method
US4194113A (en) * 1978-04-13 1980-03-18 Ncr Corporation Method and apparatus for isolating faults in a logic circuit
US4168796A (en) * 1978-04-13 1979-09-25 Ncr Corporation Tester with driver/sensor circuit having programmable termination devices
US4174805A (en) * 1978-04-13 1979-11-20 Ncr Corporation Method and apparatus for transmitting data to a predefined destination bus
USRE31828E (en) * 1978-05-05 1985-02-05 Zehntel, Inc. In-circuit digital tester
US4184630A (en) * 1978-06-19 1980-01-22 International Business Machines Corporation Verifying circuit operation
US4409649A (en) * 1978-07-28 1983-10-11 Amf Incorporated Sequence controller with microprocessor
US4216374A (en) * 1978-08-11 1980-08-05 John Fluke Mfg. Co., Inc. Hybrid signature test method and apparatus
US4222514A (en) * 1978-11-30 1980-09-16 Sperry Corporation Digital tester
US4320509A (en) * 1979-10-19 1982-03-16 Bell Telephone Laboratories, Incorporated LSI Circuit logic structure including data compression circuitry
JPS56107570U (ja) * 1980-01-22 1981-08-21
GB2070779B (en) * 1980-02-28 1984-02-15 Solartron Electronic Group Apparatus for testing digital electronic circuits
JPS56145370A (en) * 1980-03-25 1981-11-12 Chiyou Lsi Gijutsu Kenkyu Kumiai Logic circuit
US4348760A (en) * 1980-09-25 1982-09-07 Lockheed Corporation Digital-fault loop probe and system
US4381563A (en) * 1980-12-18 1983-04-26 International Business Machines Corporation Apparatus and method for visually presenting analytical representations of digital signals
JPS5818264U (ja) * 1981-07-29 1983-02-04 株式会社リコー 加熱定着ロ−ラ
US4510572A (en) * 1981-12-28 1985-04-09 Data I/O Corporation Signature analysis system for testing digital circuits
US4441183A (en) * 1982-03-22 1984-04-03 Western Electric Company, Inc. Apparatus for testing digital and analog circuits
US4483002A (en) * 1982-04-19 1984-11-13 International Business Machines Corporation Digital device testing apparatus and method
US4527272A (en) * 1982-12-06 1985-07-02 Tektronix, Inc. Signature analysis using random probing and signature memory
US4534030A (en) * 1982-12-20 1985-08-06 International Business Machines Corporation Self-clocked signature analyzer
DE3310985A1 (de) * 1983-03-25 1984-09-27 Siemens AG, 1000 Berlin und 8000 München Verfahren und vorrichtung zur funktionspruefung von schaltungen mit mikroprozessoren oder mikrocomputern
DE3475106D1 (en) * 1983-04-15 1988-12-15 Hitachi Ltd Method and apparatus for detecting defects of printed circuit patterns
DE3325247A1 (de) * 1983-07-13 1985-01-24 ANT Nachrichtentechnik GmbH, 7150 Backnang Schaltungsanordnung zum testen einer digitalen schaltung
GB8413933D0 (en) * 1984-05-31 1984-07-04 Columbia Automation Ltd Emulating timing characteristics of microprocessor
DE3502735C2 (de) * 1984-02-11 1993-10-28 Ant Nachrichtentech Schaltungsanordnung für den dynamischen Echtzeittest einer synchronen Digitalschaltung
JPS60233734A (ja) * 1984-05-07 1985-11-20 Japanese National Railways<Jnr> 同期式多重系計算機の不一致検出方法
US4713605A (en) * 1984-05-17 1987-12-15 Advanced Micro Devices, Inc. Linear feedback shift register for circuit design technology validation
US4580274A (en) * 1984-10-02 1986-04-01 The United States Of America As Represented By The Secretary Of The Air Force Transceiver test device
EP0186724B1 (de) * 1985-01-04 1990-12-12 Ibm Deutschland Gmbh Prüf- und Diagnoseeinrichtung für Digitalrechner
GB8511188D0 (en) * 1985-05-02 1985-06-12 Int Computers Ltd Testing digital integrated circuits
US4752928A (en) * 1985-05-06 1988-06-21 Tektronix, Inc. Transaction analyzer
US4687988A (en) * 1985-06-24 1987-08-18 International Business Machines Corporation Weighted random pattern testing apparatus and method
CN86101621A (zh) * 1985-08-01 1987-01-28 约翰弗兰克制造公司 改进的电子电路标记图形分析仪
JPH0724013B2 (ja) * 1986-09-10 1995-03-15 株式会社日立製作所 ベクトルプロセツサ
US4916641A (en) * 1987-01-16 1990-04-10 Acl Technologies, Inc. Servovalve analyzer system
US5235525A (en) * 1987-01-16 1993-08-10 Acl Technologies, Inc. Servovalve analyzer system
US4897842A (en) * 1987-11-05 1990-01-30 Ampex Corporation Integrated circuit signature analyzer for testing digital circuitry
DD275546A1 (de) * 1988-09-16 1990-01-24 Adw Ddr Kybernetik Inf Verfahren und anordnung zum testen von mikrorechnergesteuerten baugruppen und geraeten
US5351247A (en) * 1988-12-30 1994-09-27 Digital Equipment Corporation Adaptive fault identification system
US5095483A (en) * 1989-04-28 1992-03-10 International Business Machines Corporation Signature analysis in physical modeling
US5081626A (en) * 1989-12-08 1992-01-14 Hughes Aircraft Company System for detection and location of events
US5321701A (en) * 1990-12-06 1994-06-14 Teradyne, Inc. Method and apparatus for a minimal memory in-circuit digital tester
US5412665A (en) * 1992-01-10 1995-05-02 International Business Machines Corporation Parallel operation linear feedback shift register
US5333112A (en) * 1993-03-25 1994-07-26 Aai/Acl Technologies, Inc. Automatic flow grind system and method
FR2729482A1 (fr) * 1995-01-17 1996-07-19 Alsthom Cge Alcatel Methode pour securiser l'affichage, sur un ecran, de synoptiques refletant l'etat d'un systeme
US5668481A (en) * 1995-02-23 1997-09-16 National Science Council Multiple pattern sequence generation based on inverting non-linear autonomous machine
US6251595B1 (en) * 1998-06-18 2001-06-26 Agilent Technologies, Inc. Methods and devices for carrying out chemical reactions
WO2000072296A1 (en) 1999-05-21 2000-11-30 Koninklijke Philips Electronics N.V. Power management in a monitor
US6708328B1 (en) * 1999-12-17 2004-03-16 Lucent Technologies Inc. Employment of value of unknown in portion of partial state space for analysis of part of system
GB2366439A (en) 2000-09-05 2002-03-06 Sharp Kk Driving arrangements for active matrix LCDs
CA2348799A1 (fr) * 2001-05-22 2002-11-22 Marcel Blais Appareil d'essai de composants electroniques
JP2008118297A (ja) * 2006-11-01 2008-05-22 Matsushita Electric Ind Co Ltd デジタルビデオデータ検査システム及び半導体装置
CN102375099A (zh) * 2010-08-16 2012-03-14 深圳富泰宏精密工业有限公司 便携式电子装置测试系统
FI126901B (en) 2014-09-12 2017-07-31 Enics Ag Procedure and system for testing an electronic device
US9685979B2 (en) * 2015-05-22 2017-06-20 Texas Instruments Incorporated Circuitry and method for generating cyclic redundancy check signatures

Family Cites Families (11)

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Publication number Priority date Publication date Assignee Title
US3582633A (en) * 1968-02-20 1971-06-01 Lockheed Aircraft Corp Method and apparatus for fault detection in a logic circuit
US3651315A (en) * 1970-05-14 1972-03-21 Collins Radio Co Digital products inspection system
DE2213368A1 (de) * 1971-04-21 1972-11-02 Honeywell Ltd., Brentford, Middlesex (Großbritannien) Prüfgerät für digitale elektrische Schaltungen
DE2121330C3 (de) * 1971-04-30 1974-10-17 Ludwig 6369 Dortelweil Illian Verfahren und Schaltungsanordnung zum Prüfen digital arbeitender elektronischer Geräte und ihrer Bauteile
BE790243A (fr) * 1971-11-08 1973-02-15 Burroughs Corp Procede et appareil de verification de sous-systemes de circuits binaires
IT1003048B (it) * 1972-03-17 1976-06-10 Honeywell Inf Systems Dispositivo per verificare il cor retto comportamento di unita circui tali integrate sequenziali
US3777129A (en) * 1972-05-22 1973-12-04 Gte Automatic Electric Lab Inc Fault detection and localization in digital systems
US3780277A (en) * 1972-07-13 1973-12-18 Bell Telephone Labor Inc Apparatus for propagating internal logic gate faults in a digital logic simulator
US3832535A (en) * 1972-10-25 1974-08-27 Instrumentation Engineering Digital word generating and receiving apparatus
US3813647A (en) * 1973-02-28 1974-05-28 Northrop Corp Apparatus and method for performing on line-monitoring and fault-isolation
US3826909A (en) * 1973-03-29 1974-07-30 Ncr Dynamic comparison tester for go-no-go testing of digital circuit packages in normal environment

Also Published As

Publication number Publication date
CA1037609A (en) 1978-08-29
US3976864A (en) 1976-08-24
JPS5176040A (en) 1976-07-01
DE2538651A1 (de) 1976-03-11
DE2538651C2 (de) 1986-05-22
GB1464515A (en) 1977-02-16

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