JPS5649143U - - Google Patents
Info
- Publication number
- JPS5649143U JPS5649143U JP13174379U JP13174379U JPS5649143U JP S5649143 U JPS5649143 U JP S5649143U JP 13174379 U JP13174379 U JP 13174379U JP 13174379 U JP13174379 U JP 13174379U JP S5649143 U JPS5649143 U JP S5649143U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13174379U JPS5649143U (ja) | 1979-09-21 | 1979-09-21 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13174379U JPS5649143U (ja) | 1979-09-21 | 1979-09-21 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5649143U true JPS5649143U (ja) | 1981-05-01 |
Family
ID=29363393
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP13174379U Pending JPS5649143U (ja) | 1979-09-21 | 1979-09-21 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5649143U (ja) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0567655A (ja) * | 1991-09-05 | 1993-03-19 | Mitsubishi Denki Eng Kk | 半導体素子用特性検査装置 |
| JP2013053898A (ja) * | 2011-09-02 | 2013-03-21 | Mitsubishi Electric Corp | 半導体試験治具及びその製造方法 |
| JP2015094693A (ja) * | 2013-11-13 | 2015-05-18 | 三菱電機株式会社 | 半導体試験治具、測定装置、試験方法 |
| JP2016004015A (ja) * | 2014-06-19 | 2016-01-12 | 富士電機株式会社 | 半導体試験装置 |
| JP2016095272A (ja) * | 2014-11-17 | 2016-05-26 | 三菱電機株式会社 | 半導体評価装置、半導体評価方法および試験治具 |
-
1979
- 1979-09-21 JP JP13174379U patent/JPS5649143U/ja active Pending
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0567655A (ja) * | 1991-09-05 | 1993-03-19 | Mitsubishi Denki Eng Kk | 半導体素子用特性検査装置 |
| JP2013053898A (ja) * | 2011-09-02 | 2013-03-21 | Mitsubishi Electric Corp | 半導体試験治具及びその製造方法 |
| JP2015094693A (ja) * | 2013-11-13 | 2015-05-18 | 三菱電機株式会社 | 半導体試験治具、測定装置、試験方法 |
| JP2016004015A (ja) * | 2014-06-19 | 2016-01-12 | 富士電機株式会社 | 半導体試験装置 |
| JP2016095272A (ja) * | 2014-11-17 | 2016-05-26 | 三菱電機株式会社 | 半導体評価装置、半導体評価方法および試験治具 |