JPS5645229B2 - - Google Patents
Info
- Publication number
- JPS5645229B2 JPS5645229B2 JP3895178A JP3895178A JPS5645229B2 JP S5645229 B2 JPS5645229 B2 JP S5645229B2 JP 3895178 A JP3895178 A JP 3895178A JP 3895178 A JP3895178 A JP 3895178A JP S5645229 B2 JPS5645229 B2 JP S5645229B2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31919—Storing and outputting test patterns
- G01R31/31921—Storing and outputting test patterns using compression techniques, e.g. patterns sequencer
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/31813—Test pattern generators
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3895178A JPS54130842A (en) | 1978-04-03 | 1978-04-03 | Method address generator |
| US06/026,246 US4293950A (en) | 1978-04-03 | 1979-04-02 | Test pattern generating apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3895178A JPS54130842A (en) | 1978-04-03 | 1978-04-03 | Method address generator |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS54130842A JPS54130842A (en) | 1979-10-11 |
| JPS5645229B2 true JPS5645229B2 (en) | 1981-10-24 |
Family
ID=12539498
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP3895178A Granted JPS54130842A (en) | 1978-04-03 | 1978-04-03 | Method address generator |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS54130842A (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5819955A (en) * | 1981-07-29 | 1983-02-05 | Toshiba Corp | Picture memory device |
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1978
- 1978-04-03 JP JP3895178A patent/JPS54130842A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS54130842A (en) | 1979-10-11 |