JPS5626817B2 - - Google Patents
Info
- Publication number
- JPS5626817B2 JPS5626817B2 JP10088476A JP10088476A JPS5626817B2 JP S5626817 B2 JPS5626817 B2 JP S5626817B2 JP 10088476 A JP10088476 A JP 10088476A JP 10088476 A JP10088476 A JP 10088476A JP S5626817 B2 JPS5626817 B2 JP S5626817B2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
Landscapes
- Engineering & Computer Science (AREA)
- Textile Engineering (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10088476A JPS5326185A (en) | 1976-08-23 | 1976-08-23 | Defect inspecting apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10088476A JPS5326185A (en) | 1976-08-23 | 1976-08-23 | Defect inspecting apparatus |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5326185A JPS5326185A (en) | 1978-03-10 |
| JPS5626817B2 true JPS5626817B2 (de) | 1981-06-20 |
Family
ID=14285742
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP10088476A Granted JPS5326185A (en) | 1976-08-23 | 1976-08-23 | Defect inspecting apparatus |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5326185A (de) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6140346Y2 (de) * | 1983-10-19 | 1986-11-18 |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59187746U (ja) * | 1983-05-31 | 1984-12-13 | 東英電子工業株式会社 | ピンホ−ル検出機構 |
| JPS6036299U (ja) * | 1983-08-18 | 1985-03-13 | 株式会社 パックサプライセンタ− | 飾樽用芯樽 |
| JP2597370B2 (ja) * | 1987-10-14 | 1997-04-02 | 株式会社ヒューテック | シート状被検材の有意差検出方法 |
-
1976
- 1976-08-23 JP JP10088476A patent/JPS5326185A/ja active Granted
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6140346Y2 (de) * | 1983-10-19 | 1986-11-18 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5326185A (en) | 1978-03-10 |