JPS5621339A - Method and device for detecting wrong contact of ic chip - Google Patents

Method and device for detecting wrong contact of ic chip

Info

Publication number
JPS5621339A
JPS5621339A JP9757479A JP9757479A JPS5621339A JP S5621339 A JPS5621339 A JP S5621339A JP 9757479 A JP9757479 A JP 9757479A JP 9757479 A JP9757479 A JP 9757479A JP S5621339 A JPS5621339 A JP S5621339A
Authority
JP
Japan
Prior art keywords
pattern
wire
chip
diode
constant
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP9757479A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6339101B2 (enExample
Inventor
Masamitsu Saito
Kenji Fujino
Seiichiro Kobayashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Instruments Inc
Original Assignee
Seiko Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Instruments Inc filed Critical Seiko Instruments Inc
Priority to JP9757479A priority Critical patent/JPS5621339A/ja
Publication of JPS5621339A publication Critical patent/JPS5621339A/ja
Publication of JPS6339101B2 publication Critical patent/JPS6339101B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P74/00—Testing or measuring during manufacture or treatment of wafers, substrates or devices

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP9757479A 1979-07-31 1979-07-31 Method and device for detecting wrong contact of ic chip Granted JPS5621339A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9757479A JPS5621339A (en) 1979-07-31 1979-07-31 Method and device for detecting wrong contact of ic chip

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9757479A JPS5621339A (en) 1979-07-31 1979-07-31 Method and device for detecting wrong contact of ic chip

Publications (2)

Publication Number Publication Date
JPS5621339A true JPS5621339A (en) 1981-02-27
JPS6339101B2 JPS6339101B2 (enExample) 1988-08-03

Family

ID=14196002

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9757479A Granted JPS5621339A (en) 1979-07-31 1979-07-31 Method and device for detecting wrong contact of ic chip

Country Status (1)

Country Link
JP (1) JPS5621339A (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60230943A (ja) * 1984-04-27 1985-11-16 Mitsubishi Metal Corp アルミニウム箔の粉砕方法

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0367007U (enExample) * 1989-11-06 1991-06-28

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60230943A (ja) * 1984-04-27 1985-11-16 Mitsubishi Metal Corp アルミニウム箔の粉砕方法

Also Published As

Publication number Publication date
JPS6339101B2 (enExample) 1988-08-03

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